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    • 1. 发明授权
    • Semiconductor memory device and test method thereof
    • 半导体存储器件及其测试方法
    • US07859938B2
    • 2010-12-28
    • US12233278
    • 2008-09-18
    • Yasushi Matsubara
    • Yasushi Matsubara
    • G11C8/00
    • G11C29/02G11C29/006G11C29/021G11C29/028
    • When a predetermined code is set to a mode register, a switching signal generating circuit is activated, and a switching signal TCLKE becomes at a high level. When the switching signal TCLKE becomes at a high level, input data supplied from a data input and output terminal DQ is used as an internal clock ICLK. Accordingly, during a test in a wafer state, a clock signal can be received from the data input and output terminal DQ, even when a clock terminal, an address terminal, and a command terminal are connected in common to plural semiconductor memory devices. Therefore, a code for artificially performing a fine adjustment of a reference voltage can be individually supplied for each chip.
    • 当将预定代码设置为模式寄存器时,切换信号发生电路被激活,并且切换信号TCLKE变为高电平。 当切换信号TCLKE变为高电平时,从数据输入和输出端DQ提供的输入数据用作内部时钟ICLK。 因此,即使在将时钟端子,地址端子和指令端子共同连接到多个半导体存储器件时,在晶片状态的测试中也可以从数据输入和输出端子DQ接收时钟信号。 因此,可以对每个芯片分别提供用于人为地进行参考电压的微调的代码。
    • 3. 发明申请
    • SEMICONDUCTOR DEVICE, OUTPUT CIRCUIT AND METHOD FOR CONTROLLING INPUT/OUTPUT BUFFER CIRCUIT IN SEMICONDUCTOR DEVICE
    • 半导体器件,输出电路和用于控制半导体器件中的输入/输出缓冲器电路的方法
    • US20100156500A1
    • 2010-06-24
    • US12644956
    • 2009-12-22
    • Yasushi MatsubaraMinari Arai
    • Yasushi MatsubaraMinari Arai
    • H03L5/00
    • H03K19/018585G11C7/1051G11C7/1057H03K19/018507
    • Disclosed is a semiconductor device having an output circuit that may be used to advantage in case the semiconductor device may possibly be used under different power supply voltages. The semiconductor device includes a signal terminal having at least the function of an output terminal, a power supply terminal, and an output circuit having first and second output buffer circuits. The first and second output buffer circuits are supplied with a supply power voltage from the power supply terminal and receive an inner output signal to drive the signal terminal. The semiconductor device also includes a power supply voltage discrimination circuit that discriminates the potential level of the power supply voltage to control the operation of the output circuit based on the result of discrimination. A first output buffer circuit is activated and a second output buffer circuit is deactivated in case the power supply voltage discrimination circuit has decided that the power supply voltage is at a first potential. Both of the first and second output buffer circuits are activated in case the power supply voltage discrimination circuit has decided that the power supply voltage is at a second potential.
    • 公开了具有输出电路的半导体器件,其可以在半导体器件可能在不同的电源电压下使用的情况下被使用。 半导体器件包括至少具有输出端子,电源端子和具有第一和第二输出缓冲器电路的输出电路的功能的信号端子。 向第一和第二输出缓冲器电路提供来自电源端的电源电压,并接收内部输出信号以驱动信号端子。 半导体器件还包括电源电压鉴别电路,其基于鉴别结果来鉴别电源电压的电位电平以控制输出电路的操作。 在电源电压鉴别电路已经确定电源电压处于第一电位的情况下,第一输出缓冲电路被激活并且第二输出缓冲电路被去激活。 在电源电压鉴别电路已经确定电源电压处于第二电位的情况下,第一和第二输出缓冲电路都被激活。
    • 7. 发明授权
    • Synchronous semiconductor memory
    • 同步半导体存储器
    • US6144613A
    • 2000-11-07
    • US329716
    • 1999-06-10
    • Yasushi Matsubara
    • Yasushi Matsubara
    • G11C11/413G11C7/10G11C7/22G11C11/401G11C11/407G11C11/41G11C8/00
    • G11C7/1072G11C7/22
    • According to one embodiment (100), a synchronous semiconductor memory may include a first initial circuit (102), second initial circuit (104) and third initial circuit (106). The first initial circuit (102) can receive an external clock signal CLK and compare the external clock signal CLK to a reference voltage VREF. The comparison result can be amplified and output as a signal .phi.1. The second initial circuit (104) can receive a clock control signal CKE and compare the clock control signal CKE to a reference voltage VREF. The comparison result can be amplified and output as a signal .phi.2. The third initial circuit (106) can receive the external clock signal CLK, and is activated by a control signal .phi.7 that can correspond to the clock enable signal CKE. The third initial circuit (106) can compare the external clock signal CLK to a reference voltage VREF, and amplify and output the comparison result .phi.8. The embodiment (100) can further include a first control circuit (108) that can receive the .phi.1 signal and generate a period signal .phi.3 having a constant pulse width that varies in synchronism with the external clock signal CLK. In addition, the first control circuit (108) can receive the .phi.8 signal and generate an internal clock signal .phi.5.
    • 根据一个实施例(100),同步半导体存储器可以包括第一初始电路(102),第二初始电路(104)和第三初始电路(106)。 第一初始电路(102)可以接收外部时钟信号CLK并将外部时钟信号CLK与参考电压VREF进行比较。 比较结果可以被放大并作为信号phi1输出。第二初始电路(104)可以接收时钟控制信号CKE并将时钟控制信号CKE与参考电压VREF进行比较。 比较结果可以被放大并作为信号phi2输出。第三初始电路(106)可以接收外部时钟信号CLK,并由可对应于时钟使能信号CKE的控制信号phi7激活。 第三初始电路(106)可以将外部时钟信号CLK与参考电压VREF进行比较,并且放大并输出比较结果phi 8.实施例(100)还可以包括可以接收phi的第一控制电路(108) 1信号,并产生具有与外部时钟信号CLK同步变化的恒定脉冲宽度的周期信号phi 3。 此外,第一控制电路(108)可以接收phi 8信号并产生内部时钟信号phi 5。