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    • 5. 发明申请
    • DISPLAY APPARATUS AND INSPECTION METHOD
    • 显示装置和检查方法
    • US20060226866A1
    • 2006-10-12
    • US11425449
    • 2006-06-21
    • Naoki Ando
    • Naoki Ando
    • G01R31/00
    • G09G3/006G09G3/3666Y10S345/904
    • The test circuit of a display apparatus according to the invention detect short-circuiting in each of the data lines Dn by inputting the electric potential Vd of the data line Dn connected to the corresponding one of high resistance first short-circuiting detecting resistors Tr1n connecting a predetermined electric potential and the data line Dn to the corresponding one of first detector logic circuits and binarizing and outputting the input electric potential Vd of the data line Dn by referring to a predetermined threshold value and also detect short-circuiting in each of the gate lines Gm by inputting the electric potential of the gate line Gm connected to the corresponding one of high resistance second short-circuiting detecting resistors connecting a predetermined electric potential and the gate line Gm to the corresponding one of second detector logic circuits and binarizing and outputting the input electric potential of the gate line by referring to a predetermined threshold value. The defects (short-circuits) produced in the process of manufacturing the display apparatus can be inspected by a simple technique.
    • 根据本发明的显示装置的测试电路通过输入连接到连接到第一短路检测电阻器的高电阻第一短路检测电阻器Tr1n中的相应一个的数据线Dn的电位Vd来检测每条数据线Dn中的短路 预定电位和数据线Dn耦合到第一检测器逻辑电路中的相应一个,并参考预定阈值二值化并输出数据线Dn的输入电位Vd,并且还检测每条栅极线中的短路 通过将连接到连接预定电位的高电阻第二短路检测电阻器和栅极线Gm的相应一个的栅极线Gm的电位输入到第二检测器逻辑电路中的相应一个,并将二进制输出 通过参照预定的阈值进行栅极线的电位 e。 可以通过简单的技术检查制造显示装置的过程中产生的缺陷(短路)。
    • 10. 发明授权
    • Display apparatus and inspection method
    • 显示装置和检查方法
    • US07358757B2
    • 2008-04-15
    • US11425449
    • 2006-06-21
    • Naoki Ando
    • Naoki Ando
    • G01R31/00
    • G09G3/006G09G3/3666Y10S345/904
    • The test circuit of a display apparatus according to the invention detect short-circuiting in each of the data lines Dn by inputting the electric potential Vd of the data line Dn connected to the corresponding one of high resistance first short-circuiting detecting resistors Tr1n connecting a predetermined electric potential and the data line Dn to the corresponding one of first detector logic circuits and binarizing and outputting the input electric potential Vd of the data line Dn by referring to a predetermined threshold value and also detect short-circuiting in each of the gate lines Gm by inputting the electric potential of the gate line Gm connected to the corresponding one of high resistance second short-circuiting detecting resistors connecting a predetermined electric potential and the gate line Gm to the corresponding one of second detector logic circuits and binarizing and outputting the input electric potential of the gate line by referring to a predetermined threshold value. The defects (short-circuits) produced in the process of manufacturing the display apparatus can be inspected by a simple technique.
    • 根据本发明的显示装置的测试电路通过输入连接到连接到第一短路检测电阻器的高电阻第一短路检测电阻器Tr1n中的相应一个的数据线Dn的电位Vd来检测每条数据线Dn中的短路 预定电位和数据线Dn耦合到第一检测器逻辑电路中的相应一个,并参考预定阈值二值化并输出数据线Dn的输入电位Vd,并且还检测每条栅极线中的短路 通过将连接到连接预定电位的高电阻第二短路检测电阻器和栅极线Gm的相应一个的栅极线Gm的电位输入到第二检测器逻辑电路中的相应一个,并将二进制输出 通过参照预定的阈值进行栅极线的电位 e。 可以通过简单的技术检查制造显示装置的过程中产生的缺陷(短路)。