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    • 1. 发明申请
    • PROTECTING DEVICE FOR PROCESSING TOOL OF MACHINE TOOL AND HONING MACHINE
    • 机械加工机械加工工具保护装置
    • US20100178848A1
    • 2010-07-15
    • US12601862
    • 2008-10-08
    • Yasuo TomitaTetsuo Iwai
    • Yasuo TomitaTetsuo Iwai
    • B24B49/16B24B33/06B24B41/04
    • B24B33/06B23Q5/58B23Q11/04B24B41/04B24B49/16
    • This is to present a protecting device for processing tool of machine tool used in a machine tool of a type of machining such as grinding and cutting a work by rotating a processing tool mounted on a rotary spindle, for protecting the processing tool by preventing from damage or breakage due to excessive torque load.In a honing machine, for example, a magnetic coupling device (25) for transmitting the rotating force of a servo motor (16) to a rotary spindle (2) by magnetic action is provided between the rotary spindle (2) on which a honing tool (1) as processing tool is mounted and the servo motor (16) of a spindle rotation driving part (3) for rotating the rotary spindle (2), and the magnetic transmission torque of the magnetic coupling device (25) for transmitting the rotating force is set smaller than a specified torque load applied to the honing tool (1) (for example, breakage torque of honing tool (1)). Accordingly, damage or breakage of the honing tool (1) by excessive torque load can be prevented effectively.
    • 本发明提供一种用于机床加工工具的保护装置,该加工工具用于通过旋转安装在旋转主轴上的加工工具来研磨和切割工件的加工类型,用于通过防止损坏来保护加工工具 或由于过大的扭矩负荷而破损。 例如,在珩磨机中,通过磁力作用将伺服马达(16)的旋转力传递到旋转主轴(2)的磁耦合装置(25)设置在旋转主轴(2) 安装作为加工工具的工具(1)和用于使旋转主轴(2)旋转的主轴旋转驱动部(3)的伺服电动机(16)以及用于传递旋转主轴(2)的磁耦合装置(25)的磁传递扭矩 旋转力被设定为小于施加到珩磨工具(1)的规定扭矩负荷(例如,珩磨工具(1)的断裂扭矩))。 因此,可以有效地防止珩磨工具(1)由于过大的扭矩负荷而损坏或破损。
    • 4. 发明授权
    • Apparatus for measuring pulse width using two-photon absorption medium
    • 使用双光子吸收介质测量脉冲宽度的装置
    • US5299170A
    • 1994-03-29
    • US894292
    • 1992-06-04
    • Masaaki ShibataYasuo Tomita
    • Masaaki ShibataYasuo Tomita
    • G01J11/00G02F1/35G01B9/02
    • G01J11/00G02F1/3526
    • A method of measuring the pulse width of a light pulse comprises the steps of causing a first light and a second light, which are both light pulse, to enter a medium having a two-photon absorption effect, detecting the first light of the first light and second light which have passed such medium, and measuring the pulse width of the first light or the second light on the basis of the result of the detection, and an apparatus for measuring the pulse width of a light pulse from a light source using this measuring method, whereby to obtain the self correlation function of light pulse of a light to be measured passing through the two-photon absorption medium for the provision of a highly precise measurement of light pulse width without any high precision phase adjustment of the light beam.
    • 测量光脉冲的脉冲宽度的方法包括以下步骤:使作为光脉冲的第一光和第二光进入具有双光子吸收效果的介质,检测第一光的第一光 和通过这种介质的第二光,并且基于检测结果测量第一光或第二光的脉冲宽度,以及使用该光源测量来自光源的光脉冲的脉冲宽度的装置 测量方法,从而获得通过双光子吸收介质的待测光的光脉冲的自相关函数,用于提供光脉冲宽度的高精度测量,而不进行光束的高精度相位调整。
    • 7. 发明授权
    • All-optical light modulating apparatus and all-optical process for
modulating light
    • 全光调制装置和全光调制光工艺
    • US5289489A
    • 1994-02-22
    • US837974
    • 1992-02-20
    • Johan BergquistYasuo Tomita
    • Johan BergquistYasuo Tomita
    • G02B6/12G02F1/015G02F1/017H01S5/00H01S3/10
    • B82Y20/00G02F1/01716
    • A light modulating apparatus includes a semiconductor device having a quantum well structure and a device for applying an electric field to the quantum well structure of the semiconductor device. Both of pump and probe light beams or a pump and probe light beam is input into the semiconductor device. The pump light beam or pump and probe light beam received by the semiconductor device causes a real charge excitation in the quantum well structure, and the real charge excitation screens the electric field applied to the quantum well structure. The polarization state of the probe light beam or pump and probe light beam emerging from the semiconductor device is changed by an electrooptical effect in the quantum well structure induced by the real charge excitation. A polarizer may be disposed for converting a change in polarization state of the light emerging from the semiconductor device into a change in intensity of the light.
    • 光调制装置包括具有量子阱结构的半导体器件和用于向半导体器件的量子阱结构施加电场的器件。 泵浦和探针光束或泵和探针光束都被输入到半导体器件中。 由半导体器件接收的泵浦光束或泵浦和探针光束在量子阱结构中引起实际电荷激发,并且实际电荷激励屏蔽施加到量子阱结构的电场。 从半导体器件出射的探针光束或泵浦和探测光束的偏振状态由实际电荷激发引起的量子阱结构中的电光效应改变。 可以设置偏振器,用于将从半导体器件出射的光的偏振状态的变化转换为光的强度变化。