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    • 2. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08237282B2
    • 2012-08-07
    • US13030861
    • 2011-02-18
    • Takashi OkudaYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • Takashi OkudaYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • H01L23/522
    • H01L23/5223H01L23/5225H01L2924/0002H01L2924/3011H01L2924/00
    • A semiconductor device includes a semiconductor substrate including a main surface; a plurality of first interconnections formed in a capacitance forming region defined on the main surface and extending in a predetermined direction; a plurality of second interconnections each adjacent to the first interconnection located at an edge of the capacitance forming region, extending in the predetermined direction, and having a fixed potential; and an insulating layer formed on the main surface and filling in between each of the first interconnections and between the first interconnection and the second interconnection adjacent to each other. The first interconnections and the second interconnections are located at substantially equal intervals in a plane parallel to the main surface, and located to align in a direction substantially perpendicular to the predetermined direction.
    • 半导体器件包括:包括主表面的半导体衬底; 多个第一互连形成在形成在主表面上并沿预定方向延伸的电容形成区域中; 多个第二互连,每个相邻于位于电容形成区域的边缘处的第一互连,沿预定方向延伸并具有固定电位; 以及绝缘层,形成在主表面上,并且填充在每个第一互连之间以及第一互连和第二互连之间相邻。 第一互连和第二互连在平行于主表面的平面中以基本相等的间隔定位,并且被定位成在基本上垂直于预定方向的方向上对齐。
    • 3. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20090250788A1
    • 2009-10-08
    • US12485528
    • 2009-06-16
    • Takashi OKUDAYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • Takashi OKUDAYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • H01L29/00
    • H01L23/5223H01L23/5225H01L2924/0002H01L2924/3011H01L2924/00
    • A semiconductor device includes a semiconductor substrate including a main surface; a plurality of first interconnections formed in a capacitance forming region defined on the main surface and extending in a predetermined direction, a plurality of second interconnections each adjacent to the first interconnection located at an edge of the capacitance forming region, extending in the predetermined direction, and having a fixed potential; and an insulating layer formed on the main surface and filling in between each of the first interconnections and between the first interconnection and the second interconnection adjacent to each other. The first interconnections and the second interconnections are located at substantially equal intervals in a plane parallel to the main surface, and located to align in a direction substantially perpendicular to the predetermined direction.
    • 半导体器件包括:包括主表面的半导体衬底; 形成在主表面上并沿预定方向延伸的电容形成区域中的多个第一互连,多个第二互连,每个第二互连相邻于位于电容形成区域边缘的第一互连件,沿预定方向延伸; 并具有固定的潜力; 以及绝缘层,形成在主表面上,并且填充在每个第一互连之间以及第一互连和第二互连之间相邻。 第一互连和第二互连在平行于主表面的平面中以基本相等的间隔定位,并且被定位成在基本上垂直于预定方向的方向上对齐。
    • 4. 发明授权
    • Semiconductor device
    • 半导体器件
    • US07446390B2
    • 2008-11-04
    • US11845348
    • 2007-08-27
    • Takashi OkudaYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • Takashi OkudaYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • H01L29/00
    • H01L23/5223H01L23/5225H01L2924/0002H01L2924/3011H01L2924/00
    • A semiconductor device includes a semiconductor substrate including a main surface; a plurality of first interconnections formed in a capacitance forming region defined on the main surface and extending in a predetermined direction; a plurality of second interconnections each adjacent to the first interconnection located at an edge of the capacitance forming region, extending in the predetermined direction, and having a fixed potential; and an insulating layer formed on the main surface and filling in between each of the first interconnections and between the first interconnection and the second interconnection adjacent to each other. The first interconnections and the second interconnections are located at substantially equal intervals in a plane parallel to the main surface, and located to align in a direction substantially perpendicular to the predetermined direction.
    • 半导体器件包括:包括主表面的半导体衬底; 多个第一互连形成在形成在主表面上并沿预定方向延伸的电容形成区域中; 多个第二互连,每个相邻于位于电容形成区域的边缘处的第一互连,沿预定方向延伸并具有固定电位; 以及绝缘层,形成在主表面上,并且填充在每个第一互连之间以及第一互连和第二互连之间相邻。 第一互连和第二互连在平行于主表面的平面中以基本相等的间隔定位,并且被定位成在基本上垂直于预定方向的方向上对齐。
    • 5. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20080001255A1
    • 2008-01-03
    • US11845348
    • 2007-08-27
    • Takashi OKUDAYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • Takashi OKUDAYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • H01L29/00
    • H01L23/5223H01L23/5225H01L2924/0002H01L2924/3011H01L2924/00
    • A semiconductor device includes a semiconductor substrate including a main surface; a plurality of first interconnections formed in a capacitance forming region defined on the main surface and extending in a predetermined direction; a plurality of second interconnections each adjacent to the first interconnection located at an edge of the capacitance forming region, extending in the predetermined direction, and having a fixed potential; and an insulating layer formed on the main surface and filling in between each of the first interconnections and between the first interconnection and the second interconnection adjacent to each other. The first interconnections and the second interconnections are located at substantially equal intervals in a plane parallel to the main surface, and located to align in a direction substantially perpendicular to the predetermined direction.
    • 半导体器件包括:包括主表面的半导体衬底; 多个第一互连形成在形成在主表面上并沿预定方向延伸的电容形成区域中; 多个第二互连,每个相邻于位于电容形成区域的边缘处的第一互连,沿预定方向延伸并具有固定电位; 以及绝缘层,形成在主表面上,并且填充在每个第一互连之间以及第一互连和第二互连之间相邻。 第一互连和第二互连在平行于主表面的平面中以基本相等的间隔定位,并且被定位成在基本上垂直于预定方向的方向上对齐。
    • 7. 发明授权
    • Semiconductor device
    • 半导体器件
    • US07276776B2
    • 2007-10-02
    • US11013514
    • 2004-12-17
    • Takashi OkudaYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • Takashi OkudaYasuo MorimotoYuko MaruyamaToshio Kumamoto
    • H01L29/00
    • H01L23/5223H01L23/5225H01L2924/0002H01L2924/3011H01L2924/00
    • A semiconductor device includes a semiconductor substrate including a main surface; a plurality of first interconnections formed in a capacitance forming region defined on the main surface and extending in a predetermined direction; a plurality of second interconnections each adjacent to the first interconnection located at an edge of the capacitance forming region, extending in the predetermined direction, and having a fixed potential; and an insulating layer formed on the main surface and filling in between each of the first interconnections and between the first interconnection and the second interconnection adjacent to each other. The first interconnections and the second interconnections are located at substantially equal intervals in a plane parallel to the main surface, and located to align in a direction substantially perpendicular to the predetermined direction.
    • 半导体器件包括:包括主表面的半导体衬底; 多个第一互连形成在形成在主表面上并沿预定方向延伸的电容形成区域中; 多个第二互连,每个相邻于位于电容形成区域的边缘处的第一互连,沿预定方向延伸并具有固定电位; 以及绝缘层,形成在主表面上,并且填充在每个第一互连之间以及第一互连和第二互连之间相邻。 第一互连和第二互连在平行于主表面的平面中以基本相等的间隔定位,并且被定位成在基本上垂直于预定方向的方向上对准。
    • 10. 发明授权
    • &Dgr;&Sgr; modulator, DA converter and AD converter
    • DELTASIGMA调制器,DA转换器和AD转换器
    • US06323794B1
    • 2001-11-27
    • US09437405
    • 1999-11-10
    • Takashi OkudaToshio KumamotoYasuo Morimoto
    • Takashi OkudaToshio KumamotoYasuo Morimoto
    • H03M300
    • H03M7/3022H03M3/414H03M3/458H03M3/50
    • Modulators (M1 to Mk (k≧2)) are connected in a multi-stage such that each of quantization errors (e1, e2, . . . ) of the modulators (M1 to Mk−1) is fed to the input of the next stage modulator. Each output signal of the modulators (M2 to Mk) is fed back to the input of the immediately preceding modulator. The modulators (M1 to Mk) are all first-order modulators. Only the final stage modulator (Mk) has a multi-bit quantizer (6), and all the preceding modulators (M1 to Mk−1) have an 1-bit quantizer (3). Accordingly, a noise-shaping equal to that of a multi-bit higher-order modulator is realized on a small-scale circuit while retaining stability.
    • 调制器(M1至Mk(k> = 2))以多级连接,使得调制器(M1至Mk-1)的每个量化误差(e1,e2,...)被馈送到 下一级调制器。 调制器(M2至Mk)的每个输出信号被反馈到紧接在前的调制器的输入端。 调制器(M1至Mk)都是一阶调制器。 只有最后级调制器(Mk)具有多位量化器(6),并且所有先前的调制器(M1至Mk-1)都具有1位量化器(3)。 因此,在保持稳定性的同时,在小规模电路上实现等于多位高阶调制器的噪声整形。