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1. 发明申请

US20220065697A1 SPECTROSCOPIC ANALYSIS DEVICE, OPTICAL SYSTEM, AND METHOD 有权
公开(公告)号：US20220065697A1
公开(公告)日：2022-03-03
申请号：US17406653
申请日：2021-08-19
申请人： YOKOGAWA ELECTRIC CORPORATION
发明人： Kodai Murayama , Toshiyuki Saruya , Fumie Watanabe , Risa Hara
IPC分类号： G01J3/42 , G01J3/02 , G01N21/359
摘要： A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.

2. 发明授权

US11181469B2 Spectroscopic analysis device 有权
公开(公告)号：US11181469B2
公开(公告)日：2021-11-23
申请号：US16770219
申请日：2018-11-29
申请人： Yokogawa Electric Corporation
发明人： Kodai Murayama , Atsushi Ito , Fumie Watanabe
IPC分类号： G01N21/19 , G01J3/28 , G01J3/447
摘要： A spectroscopic analysis device includes a light source configured to emit light including a plurality of wavelength components, a polarizer configured to convert the light emitted from the light source to a light of linearly polarized light to be radiated to a sample, a polarizing diffraction element configured to diffract and spectrally disperse a first polarization component included in the light having passed through the sample in a first direction, the polarizing diffraction element being configured to diffract and spectrally disperse a second polarization component included in the light in a second direction different from the first direction, a prism which is disposed on an exit side of the polarizing diffraction element and which has a first exit surface crossing the first direction and a second exit surface crossing the second direction, and in which angles of the first exit surface and the second exit surface with respect to a reference plane including the first direction and the second direction are different, an imaging element configured to capture an image of the first polarization component emitted from the first exit surface of the prism and an image of the second polarization component emitted from the second exit surface, and a processor configured to analyze the sample based on an imaging result of the imaging element.

3. 发明授权

US09970860B2 Polarization inspection device 有权
公开(公告)号：US09970860B2
公开(公告)日：2018-05-15
申请号：US15381167
申请日：2016-12-16
申请人： YOKOGAWA ELECTRIC CORPORATION
发明人： Kodai Murayama , Tomohito Nohno , Toyoaki Hamaguchi , Soukichi Funazaki
IPC分类号： G01J4/00 , G01N21/21 , G01N21/88 , G01N33/00 , G02B5/04 , G01N21/47
CPC分类号： G01N21/21 , G01N21/211 , G01N21/8806 , G01N33/00 , G01N2021/4792 , G01N2021/8848 , G01N2033/0096 , G02B5/04
摘要： A polarization inspector for inspecting an inspection target, the polarization inspector having a polarization divider for spatially dividing at least a reflected beam of light from the inspection target by irradiating an illumination beam into divided beams of lights mutually different in polarization direction; one or more optical receivers for receiving the divided beams of lights and generating an image signal based on the divided beams of lights; and a processor for calculating at least one of an elliptical azimuth angle, a polarization degree and a polarization component intensity from the image signal.

4. 发明申请

US20210302306A1 SPECTROSCOPIC ANALYSIS DEVICE AND OPERATION METHOD AND NON-TRANSITORY COMPUTER-READABLE MEDIUM (CRM) STORING PROGRAM FOR SPECTROSCOPIC ANALYSIS 有权
公开(公告)号：US20210302306A1
公开(公告)日：2021-09-30
申请号：US17218961
申请日：2021-03-31
申请人： YOKOGAWA ELECTRIC CORPORATION
发明人： Risa Hara , Toshiyuki Saruya , Kodai Murayama , Fumie Watanabe
IPC分类号： G01N21/31
摘要： A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.

5. 发明授权

US11105737B2 Spectroscopic analysis device 有权
公开(公告)号：US11105737B2
公开(公告)日：2021-08-31
申请号：US16762772
申请日：2018-10-24
申请人： YOKOGAWA ELECTRIC CORPORATION
发明人： Kodai Murayama , Hiroyuki Sugino , Fumie Watanabe , Atsushi Ito
IPC分类号： G01N21/35 , G02B5/04
摘要： A spectroscopic analysis device includes: a light source configured to emit light for irradiating a specimen; a prism stuck to the specimen and configured to totally reflect the light emitted from the light source; a polarizing separation element configured to separate the light totally reflected by the prism into a first and second polarized light components that are orthogonal to each other; a wavelength dispersing element configured to disperse respective wavelength components of the first and second polarized light components that are separated by the polarizing separation element; an image capturing element configured to capture respective images of the first and second polarized light components that are dispersed by the wavelength dispersing element; and a processing unit configured to perform component analysis on the specimen by obtaining an absorbency at each wavelength by using an imaging signal output from the image capturing element.

6. 发明申请

US20210247302A1 OPTICAL ANALYSIS SYSTEM AND OPTICAL ANALYSIS METHOD 有权
公开(公告)号：US20210247302A1
公开(公告)日：2021-08-12
申请号：US16972790
申请日：2019-06-05
申请人： YOKOGAWA ELECTRIC CORPORATION
发明人： Kodai Murayama , Atsushi Ito , Junichi Ogawa , Shunichi Miyazaki
IPC分类号： G01N21/3577 , G01N21/359
摘要： An optical analysis system 1 according to the present disclosure includes: an irradiator 11 that, in a chemical reaction system 30 for obtaining a product AB by synthesizing a first raw material A and a second raw material B, irradiates each of the first raw material A and the second raw material B prior to initiation of synthesis with irradiation light L1 and irradiates a mixture C after initiation of the synthesis with irradiation light L1; a detector 12 that detects measuring light L2 including information regarding an optical spectrum of each of the first raw material A, the second raw material B, and the mixture C; and an arithmetic unit 22 that calculates the optical spectrum of each of the first raw material A, the second raw material B, and the mixture C and calculates an optical spectrum of the product AB.

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