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1. 发明申请

US20140253163A1 INSPECTION PROBE AND AN IC SOCKET WITH THE SAME 有权
标题翻译：检查探头和IC插座
公开(公告)号：US20140253163A1
公开(公告)日：2014-09-11
申请号：US14188272
申请日：2014-02-24
申请人： YAMAICHI ELECTRONICS CO., LTD.
发明人： Katsumi SUZUKI , Yuji NAKAMURA , Takeyuki SUZUKI , Yukio OTA
IPC分类号： G01R1/073 , G01R1/067
CPC分类号： G01R1/06722 , G01R1/06733
摘要： An inspection probe 16Ai is formed by subjecting a thin sheet material made of a copper alloy to press working. The inspection probe 16Ai includes: a device side plunger 16A having a contact point which selectively comes into contact with an electrode portion DVb of a semiconductor device DV; a board side plunger 16B having a contact point which selectively comes into contact with a contact pad of a printed wiring board 18; a spring portion 16D which biases the device side plunger 16A and the board side plunger 16B in a direction away from each other; and a cylindrical support stem 16C being disposed inside the spring portion 16D, making the spring portion 16D slidable thereon, and being configured to retain straight advancing property of the spring portion 16D.
摘要翻译：通过对由铜合金制成的薄片材进行冲压加工来形成检查探针16Ai。检查探针16Ai包括：具有选择性地与半导体装置DV的电极部分DVb接触的接触点的装置侧柱塞16A; 具有选择性地与印刷线路板18的接触焊盘接触的接触点的板侧柱塞16B; 一个弹簧部分16D，该弹簧部分16D使装置侧柱塞16A和板侧柱塞16B偏离彼此; 并且在弹簧部分16D的内部设有圆柱形支撑杆16C，使得弹簧部分16D能够在其上滑动，并被构造成保持弹簧部分16D的直线行进性能。

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