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1. 发明授权

US08489381B1 Method and system for simulating test instruments and instrument functions 有权
标题翻译：用于模拟测试仪器和仪器功能的方法和系统
公开(公告)号：US08489381B1
公开(公告)日：2013-07-16
申请号：US13411697
申请日：2012-03-05
申请人： Robert Spinner , Eli Levi , William Harold Leippe , Emery Korpi , Michael Lai , James Kuveikis , Richard E. Chalmers , Richard Engel , Peter F. Britch , William Biagiotti , David Howell
发明人： Robert Spinner , Eli Levi , William Harold Leippe , Emery Korpi , Michael Lai , James Kuveikis , Richard E. Chalmers , Richard Engel , Peter F. Britch , William Biagiotti , David Howell
IPC分类号： G06F9/44 , G06F13/10 , G06F13/12
CPC分类号： G01R31/2848 , G06F17/5022 , G06F19/00 , G16H50/50
摘要： Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.
摘要翻译：用于使用软件来配置一组通用电子部件以便模拟不同的电子，机械和/或机电仪器或仪器功能的方法和系统。对于要模拟的每种仪器功能或传统操作模式，创建软件模型，当指向电子组件时，使电子组件以与实际的传统物理仪器响应以满足相同的方式响应输入测试要求输入软件模型优选地存储在模型库中，其可搜索以使得用户能够选择将被提供给电子组件的对应模型来模拟的仪器功能或传统操作模式。一旦模型，即每个合成元素的功能被下载，并且根据该模型配置的电子部件起作用，则可以开始组件或其他UUT的测试。

2. 发明授权

US08131529B2 Method and system for simulating test instruments and instrument functions 有权
标题翻译：用于模拟测试仪器和仪器功能的方法和系统
公开(公告)号：US08131529B2
公开(公告)日：2012-03-06
申请号：US11514717
申请日：2006-09-01
申请人： Robert Spinner , Eli Levi , William Harold Leippe , Emery Korpi , Michael Lai , James Kuveikis , Richard E. Chalmers , Richard Engel , Peter F. Britch , William Biagiotti , David Howell
发明人： Robert Spinner , Eli Levi , William Harold Leippe , Emery Korpi , Michael Lai , James Kuveikis , Richard E. Chalmers , Richard Engel , Peter F. Britch , William Biagiotti , David Howell
IPC分类号： G06F9/44 , G06F13/10 , G06F13/12
CPC分类号： G01R31/2848 , G06F17/5022 , G06F19/00 , G16H50/50
摘要： Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.
摘要翻译：用于使用软件来配置一组通用电子部件以便模拟不同的电子，机械和/或机电仪器或仪器功能的方法和系统。对于要模拟的每种仪器功能或传统操作模式，创建软件模型，当指向电子组件时，使电子组件以与实际的传统物理仪器响应以满足相同的方式响应输入测试要求输入软件模型优选地存储在模型库中，其可搜索以使得用户能够选择将被提供给电子组件的对应模型来模拟的仪器功能或传统操作模式。一旦模型，即每个合成元素的功能被下载，并且根据该模型配置的电子部件起作用，则可以开始组件或其他UUT的测试。

3. 发明授权

US08356282B1 Integrated development environment for the development of electronic signal testing strategies 有权
标题翻译：集成开发环境，用于开发电子信号测试策略
公开(公告)号：US08356282B1
公开(公告)日：2013-01-15
申请号：US13237304
申请日：2011-09-20
申请人： William Harold Leippe , William Biagiotti , Eli Levi , Robert Spinner
发明人： William Harold Leippe , William Biagiotti , Eli Levi , Robert Spinner
IPC分类号： G06F9/44
CPC分类号： G06F11/3664 , G06F8/34 , G06F11/3684
摘要： Integrated application of specific CASE tools that allow a user to accomplish instrument programming and control when generating, capturing and/or analyzing electronic signals, and in doing so automatically generate automation code to replicate a desired instrument setup, acquisition, analysis and sequence control. The CASE tools include, but are not limited to, GUI instrument programming tools, an electronic signal redisplay tool, a waveform analyzer tool, automated code generation tools, macro generation tools, macro and sequence playback tools, a test creation tool, a test sequencer tool, a decision engine that may be part of the test sequencer tool, and test result data logger. A method for analyzing electronic signals that enables multiple tests to be performed after a single signal acquisition, and enables results from the multiple tests to be analyzed is also disclosed.
摘要翻译：特定CASE工具的集成应用，允许用户在生成，捕获和/或分析电子信号时完成仪器编程和控制，并且自动生成自动化代码以复制所需的仪器设置，采集，分析和顺序控制。 CASE工具包括但不限于GUI仪器编程工具，电子信号重新显示工具，波形分析仪工具，自动化代码生成工具，宏生成工具，宏和序列播放工具，测试创建工具，测试序列器工具，可能是测试序列工具的一部分的决策引擎，以及测试结果数据记录器。还公开了一种用于分析在单个信号获取之后执行多个测试并且使得能够分析多个测试的结果的电子信号的方法。

4. 发明授权

US08788228B1 Method and system for validating video waveforms and other electrical signals 有权
公开(公告)号：US08788228B1
公开(公告)日：2014-07-22
申请号：US13238588
申请日：2011-09-21
申请人： William Biagiotti , Eli Levi , William Harold Leippe
发明人： William Biagiotti , Eli Levi , William Harold Leippe
IPC分类号： G01R13/00
CPC分类号： H04N17/004
摘要： Method for validating a single waveform or series of waveforms that are intended for evaluating signals within an automated testing environment. Test signal data is supplied by an external source. The method creates a golden template from a known, good instance of the waveform under test and algorithmically applies it to other waveforms under test to determine compliance. In the application to video waveforms, timing parameters, deflection parameters and image content parameters are simultaneously tested resulting in efficient concrete and tangible results. Instead of providing the known, good instance of the waveform under test to a processor that implements the method, descriptive parameters of the known, good instance of the waveform may be provided to the processor that calculates data points of the expected video waveforms and then determines rules for the waveform based on the calculated data points.

5. 发明申请

US20070050166A1 Method and system for simulating test instruments and instrument functions 有权
标题翻译：用于模拟测试仪器和仪器功能的方法和系统
公开(公告)号：US20070050166A1
公开(公告)日：2007-03-01
申请号：US11514717
申请日：2006-09-01
申请人： Robert Spinner , Eli Levi , William Leippe , Emery Korpi , Michael Lai , James Kuveikis , Richard Chalmers , Richard Engel , Peter Britch , William Biagiotti , David Howell
发明人： Robert Spinner , Eli Levi , William Leippe , Emery Korpi , Michael Lai , James Kuveikis , Richard Chalmers , Richard Engel , Peter Britch , William Biagiotti , David Howell
IPC分类号： G06F19/00 , G01D3/00 , G01M19/00 , G01P21/00 , G01R35/00
CPC分类号： G01R31/2848 , G06F17/5022 , G06F19/00 , G16H50/50
摘要： Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.
摘要翻译：用于使用软件来配置一组通用电子部件以便模拟不同的电子，机械和/或机电仪器或仪器功能的方法和系统。对于要模拟的每种仪器功能或传统操作模式，创建软件模型，当指向电子组件时，使电子组件以与实际的传统物理仪器响应以满足相同的方式响应输入测试要求输入软件模型优选地存储在模型库中，其可搜索以使得用户能够选择将被提供给电子组件的对应模型来模拟的仪器功能或传统操作模式。一旦模型，即每个合成元素的功能被下载，并且根据该模型配置的电子部件起作用，则可以开始组件或其他UUT的测试。

6. 发明授权

US08497908B1 Unified video test apparatus 有权
标题翻译：统一视频测试仪
公开(公告)号：US08497908B1
公开(公告)日：2013-07-30
申请号：US13324240
申请日：2011-12-13
申请人： William Biagiotti , Eli Levi
发明人： William Biagiotti , Eli Levi
IPC分类号： H04N17/00
CPC分类号： H04N17/004
摘要： Arrangement of circuit cards and enclosures in a unified video test apparatus wherein the circuit boards may be arranged within a single enclosure, having a size spanning two slots of an instrument chassis wherein each circuit board includes none, some or all of the functional modules of the video test apparatus. Alternatively, the circuit boards are arranged in different enclosures, with each circuit board including some of the functional modules of the video test apparatus, and the different enclosures may be arranged in a common instrument chassis or in different instrument chassis. A single or multiple software interfaces in a host computer can control the functional modules in the different enclosures in the same or different chassis to cause the arrangement to appear as a homogenous instrument regardless of location of the functional modules, and coordinates interaction between the functional modules.
摘要翻译：在统一的视频测试装置中布置电路卡和外壳，其中电路板可以布置在单个外壳内，具有跨越仪器底盘的两个槽的尺寸，其中每个电路板不包括一个或多个功能模块视频测试仪或者，电路板布置在不同的外壳中，每个电路板包括视频测试设备的一些功能模块，并且不同的外壳可以布置在公共仪器底盘或不同的仪器底盘中。主计算机中的单个或多个软件接口可以控制相同或不同机箱中的不同机箱中的功能模块，以使得安排作为同质仪器出现，而不管功能模块的位置如何，并协调功能模块之间的交互。

7. 发明授权

US10097818B1 Video processor with digital video signal processing capabilities 有权
公开(公告)号：US10097818B1
公开(公告)日：2018-10-09
申请号：US15837742
申请日：2017-12-11
申请人： Advanced Testing Technologies, Inc. , Eli Levi
发明人： Robert Spinner , Eli Levi
IPC分类号： H04N17/02 , H04N5/46 , H04N9/64 , H04N17/00 , H04N21/2343
摘要： Method and modular system for generating, capturing and re-displaying SDI video signals. When generating a video signal, data blocks are arranged in a line parameter memory, each corresponding to a complete video line and containing pointers to specific entries for lines of the video signal in a primary image memory holding a main bit-mapped image, and a video line construct memory holding data enable and blanking patterns before being serialized into a output data stream. On the capture side, a de-serializer/equalizer accepts an input data stream extracts Y (luminance), CB (blue-difference chroma) and CR (red-difference chroma) data along with clock/sync information which can be used for re-display. Optional support of HDMI, DVI and analog formats, such as composite video, raster video and stroke video, allows a single instrument to generate, acquire and process virtually all known video interfaces, using standard or custom image/formats.

8. 发明授权

US09864003B1 Automated waveform analysis using a parallel automated development system 有权
公开(公告)号：US09864003B1
公开(公告)日：2018-01-09
申请号：US15619752
申请日：2017-06-12
申请人： Advanced Testing Technologies, Inc. , Eli Levi
发明人： Robert Spinner , Eli Levi , Jim McKenna , William Harold Leippe , William Biagiotti , Richard Engel
IPC分类号： G01R31/28 , G01R1/04 , G01R31/3183
CPC分类号： G01R31/2834 , G01R1/0416 , G01R31/2851 , G01R31/3167 , G01R31/318342 , G01R31/31835 , G01R31/318357 , G01R31/31908
摘要： A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.

9. 发明授权

US09739827B1 Automated waveform analysis using a parallel automated development system 有权
公开(公告)号：US09739827B1
公开(公告)日：2017-08-22
申请号：US15422610
申请日：2017-02-02
申请人： Advanced Testing Technologies,Inc. , Eli Levi
发明人： Robert Spinner , Eli Levi , Jim McKenna , William Harold Leippe , William Biagiotti , Richard Engel
IPC分类号： G01R31/28 , G01R1/04 , G01R31/3183
CPC分类号： G01R31/2834 , G01R1/0416 , G01R31/2851 , G01R31/3167 , G01R31/318342 , G01R31/31835 , G01R31/318357 , G01R31/31908
摘要： A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.

10. 发明授权

US08359504B1 Digital functional test system 有权
标题翻译：数字功能测试系统
公开(公告)号：US08359504B1
公开(公告)日：2013-01-22
申请号：US12781888
申请日：2010-05-18
申请人： Marc Pogosky , Richard Engel , Eli Levi
发明人： Marc Pogosky , Richard Engel , Eli Levi
IPC分类号： G01R31/28
CPC分类号： G01R31/31932
摘要： A digital functional test system incorporating both digital stimulus and digital response/compare capability for digital electronic circuitry. The system includes a chassis and a single width VME eXtensions for Instrumentation (VXI) module arranged in or on the chassis. The single width VXI module includes a timing sub-module that generates a stimulus clock signal and a response clock signal, eight pattern sub-modules, and a master oscillator sub-module that provides a clock signal. Each pattern sub-module receives the stimulus and response clock signals, and the clock signal from the master oscillator sub-module, and includes a pattern generating module, a stimulus memory component that stores stimulus data outgoing from the pattern generating module, a response memory component that records response data incoming to the pattern generating module, and a compare reference memory component that provides a reference for a compare function of the recorded response data in the response memory component.
摘要翻译：数字功能测试系统，包含数字电子电路的数字激励和数字响应/比较功能。该系统包括机箱和布置在机箱中或机架上的单宽度VME扩展仪表（VXI）模块。单宽VXI模块包括产生刺激时钟信号和响应时钟信号的定时子模块，八个模式子模块以及提供时钟信号的主振荡器子模块。每个模式子模块接收激励和响应时钟信号以及来自主振荡器子模块的时钟信号，并且包括模式产生模块，存储从模式产生模块输出的激励数据的激励存储器组件，响应存储器记录输入到模式生成模块的响应数据的组件，以及提供用于响应存储器组件中记录的响应数据的比较功能的参考的比较参考存储器组件。

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