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    • 4. 发明申请
    • Coder and a Method of Coding For Codes With a Parity-Complementary Word Assignment Having a Constraint of D1=,R=2
    • 编码器和编码代码的方法,其中具有约束D1 =,R = 2的奇偶互补字分配
    • US20090015446A1
    • 2009-01-15
    • US12097570
    • 2006-12-08
    • Willem Marie Julia Marcel CoeneAndries Pieter HekstraHiroyuki YamagishiMakoto Noda
    • Willem Marie Julia Marcel CoeneAndries Pieter HekstraHiroyuki YamagishiMakoto Noda
    • H03M7/00
    • G11B20/1426G11B20/10055G11B20/10296G11B2020/1453G11B2020/1457H03M5/145H03M7/40H03M13/29H03M13/31H03M13/3761H03M13/3972H03M13/41
    • Presently known d=1 codes have long trains consisting of consecutive 2T runs and an overall high frequency of occurrence of the shortest 2T runs that reduce the performance of the bit detector By using a code with an MTR constraint of 2 an improvement in the bit detection is achieved. A code constructed in a systematic way that provides an MTR constraint of 2 is presented. A variation of such a code is disclosed where one sub-code is used, where coding states are divided into coding classes and where code words are divided into code word types. Then, for a given sub-code, an code word of type t can be concatenated with an code word of the next sub-code if said subsequent code word of said next sub-code belongs to one of coding states of the coding class with index Tmax+1 t. In the code according to the invention the overall code has the property that the respective channel bit sequences that are encoded from the same message-bit sequence, starting from any possible state of the finite-state-machine, for each of the two values of a DC-control bit, that is part of a given user word have opposite parities for the sequences generated from the starting state up to the state where both encoder paths merge. For the case that the encoder paths do not merge, there is no such constraint. Finally, a new d=1, k=10 sliding-block decodable RLL code is disclosed with the following properties: (i) it has an r=2 constraint which is the lowest MTR value that is compatible with a rate R=⅔; (ii) it enables practical SISO-RLL decoding because of its compact 2-to-3 mapping; and (iii) the new code uses a parity-complementary word assignment4 (PCWA) for DC-control.
    • 目前已知的d = 1代码具有由连续的2T运行组成的长列,并且总体出现最短的2T运行的频率,从而降低位检测器的性能通过使用MTR约束为2的代码,改进了位检测 已完成。 提出了一种以系统方式构建的代码,其提供MTR约束为2的代码。 公开了这样的代码的变型,其中使用一个子代码,其中编码状态被分为编码类别以及代码字被分成代码字类型。 然后,对于给定子码,如果所述下一子码的所述后续码字属于编码类的编码状态之一,则可以将类型t的码字与下一子码的码字连接, 指数Tmax + 1t。 在根据本发明的代码中,总代码具有以下特性:从相同消息比特序列编码的各个信道比特序列,从有限状态机的任何可能状态开始,对于两个值的 作为给定用户字的一部分的DC控制位对于从起始状态直到两个编码器路径合并的状态产生的序列具有相反的奇偶校验。 对于编码器路径不合并的情况,没有这样的限制。 最后,公开了一种新的d = 1,k = 10滑块可解码的RLL码,具有以下特性:(i)它具有r = 2约束,其是与速率R = 2 / 3; (ii)由于其紧凑的2对3映射,它使实用的SISO-RLL解码成为可能; 和(iii)新的代码使用奇偶互补字分配4(PCWA)进行DC控制。
    • 5. 发明授权
    • Coder and a method of coding for codes having a Repeated Maximum Transition Run constraint of 2
    • 编码器和编码具有重复最大转换运行约束的代码的方法2
    • US07403138B2
    • 2008-07-22
    • US11575079
    • 2005-09-08
    • Willem Marie Julia Marcel Coene
    • Willem Marie Julia Marcel Coene
    • H03M5/00
    • G11B20/1426G11B2020/1453H03M5/145
    • Presently known codes have long trains consisting of 2T runs that reduce the performance of the bit detector. By using a code with an RMTR constraint of 2 an improvement in the bit detection is achieved. A code constructed is a systematic way that provides an RMTR constraint of 2 is presented. Several variations of such a code are disclosed where one or more sub-codes are used, where coding states are divided into coding classes and where code words are divided into code word types. Then, for a given sub-code, a code word type t can be concatenated with a code word of the next sub-code if the subsequent code word of the next sub-code belongs to one of coding states of the coding class with index Tmax+1−t.
    • 目前已知的代码具有由2T运行组成的长列车,降低了位检测器的性能。 通过使用RMTR约束为2的代码,实现了位检测的改进。 构建的代码是提供RMTR约束为2的系统方法。 公开了这样的代码的几个变型,其中使用一个或多个子代码,其中编码状态被分为编码类别以及代码字被划分为代码字类型。 然后,对于给定的子代码,如果下一子代码的后续代码字属于具有索引的编码类的编码状态之一,则代码字类型t可以与下一子代码的代码字连接 最大+ 1-t。
    • 10. 发明申请
    • Inspection Method and Apparatus, Lithographic Apparatus, Lithographic Processing Cell and Device Manufacturing Method
    • 检验方法和装置,平版印刷设备,平版印刷加工单元和器件制造方法
    • US20110001978A1
    • 2011-01-06
    • US12822422
    • 2010-06-24
    • Hendrik Jan Hidde SMILDEWillem Marie Julia Marcel Coene
    • Hendrik Jan Hidde SMILDEWillem Marie Julia Marcel Coene
    • G01N21/47
    • G03F7/70633G03F7/705G03F7/70516
    • A method of determining an overlay error between two successive layers produced by a lithographic process on a substrate, including using the lithographic process to form a calibration structure including a periodic structure of the same pitch on each of the layers, such that an overlaid pair of periodic structures is formed, the structures being parallel, but offset relative to each other by an overlay amount. A spectrum produced by directing a beam of radiation onto the calibration structure is measured and compared with one or more modeled spectra so as to determine values of the grating parameters for the calibration structure from the measured spectrum. The lithographic process is used to form further overlaid periodic structures on the same or one or more subsequent substrates, the determined grating parameter values for the calibration structure being used to determine overlay amounts for the further overlaid periodic structures.
    • 一种确定由光刻工艺在衬底上产生的两个连续层之间的重叠误差的方法,包括使用光刻工艺形成包括在每个层上的相同间距的周期性结构的校准结构,使得重叠的一对 形成周期性结构,结构是平行的,但是相对于彼此偏移了重叠量。 测量通过将辐射束引导到校准结构上产生的光谱,并将其与一个或多个建模光谱进行比较,以便根据测量的光谱确定校准结构的光栅参数的值。 光刻工艺用于在相同或一个或多个后续衬底上形成进一步覆盖的周期性结构,所确定的校准结构的光栅参数值用于确定进一步覆盖的周期性结构的重叠量。