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1. 发明授权

US5145756A Method for making a holographic mirror 失效
标题翻译：制造全息镜的方法
公开(公告)号：US5145756A
公开(公告)日：1992-09-08
申请号：US731351
申请日：1991-07-15
申请人： Wilbert Windeln , Manfred-Andreas Beeck , Norbert Bartonitscheck
发明人： Wilbert Windeln , Manfred-Andreas Beeck , Norbert Bartonitscheck
IPC分类号： G02B5/32 , G03F7/00 , G03F7/20 , G03H1/04
CPC分类号： G03F7/2053 , G03F7/001 , G02B5/32 , G03H2001/0439 , G03H2222/36
摘要： A holographic mirror is made by a process of continuous exposure. For this purpose, a photosensitive layer (10) is exposed strip by strip in a direction crosswise to that in which the layer is exposed by two interfering beams (6, 6'). Film (11) bearing photosensitive layer (10) is continuously moved in the longitudinal direction (F) at a speed that ensures sufficient exposure of the layer. The procedure makes it possible to produce holograms of any length in one direction.
摘要翻译：全息镜由连续曝光的过程制成。为此目的，感光层（10）沿着与通过两个干涉光束（6,6'）暴露该层的方向相交的方向通过带材暴露。承载感光层（10）的膜（11）以确保层的充分曝光的速度沿长度方向（F）连续移动。该过程使得可以在一个方向上产生任何长度的全息图。

2. 发明授权

US06744521B1 Method for determining the thickness of a multi-thin-layer structure 失效
标题翻译：确定多层结构厚度的方法
公开(公告)号：US06744521B1
公开(公告)日：2004-06-01
申请号：US09831842
申请日：2001-08-21
申请人： Rolf Hertling , Wolfgang Schaudig , Wilbert Windeln
发明人： Rolf Hertling , Wolfgang Schaudig , Wilbert Windeln
IPC分类号： G01B902
CPC分类号： G01B11/0625
摘要： According to the inventive method for determining the thickness of at least one layer provided on a substrate, the measurement can be constructed simply and reliably and a reliable measuring result can be obtained by measuring reflection—and/or transmission light intensity values of zero order in dependence on the wavelength and calculating said reflection—and/or transmission light intensity values using an iteration model which is dependent on the individual layer parameters. The layer parameters are altered in order to introduce a consistency between the measured values and the calculated values and the substrates have geometrical structures whose geometrical dimensions are used as further parameters of the iteration model. The inventive method also provides a means of determining the geometry of structures in the substrate, for example the depth, width and the repetition interval of grooves in a blank for geometrical storage media, such as CDs.
摘要翻译：根据用于确定设置在基板上的至少一层的厚度的本发明的方法，可以简单且可靠地构造测量，并且可以通过测量零级的反射和/或透射光强度值来获得可靠的测量结果依赖于波长并使用依赖于各个层参数的迭代模型来计算所述反射和/或透射光强度值。改变层参数以便在测量值和计算值之间引入一致性，并且衬底具有几何结构，其几何尺寸用作迭代模型的进一步参数。本发明的方法还提供了确定衬底中的结构的几何形状的方法，例如用于几何存储介质（例如CD）的坯料中的凹槽的深度，宽度和重复间隔。

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