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1. 发明授权

US09087537B1 System for adjusting lapping of a transducer using a disk windage 有权
标题翻译：使用磁盘风挡调整传感器研磨的系统
公开(公告)号：US09087537B1
公开(公告)日：2015-07-21
申请号：US14275115
申请日：2014-05-12
申请人： Western Digital (Fremont), LLC
发明人： Steven C. Rudy , Changqing Shi , Yufeng Hu , Mark D. Moravec , Eric R. McKie , Nurul Amin
IPC分类号： G11B5/48 , G11B5/31 , G11B5/60 , G11B21/21
CPC分类号： G11B5/4866 , G11B5/314 , G11B5/3163 , G11B5/3166 , G11B5/3169 , G11B5/6005 , G11B21/21 , Y10T29/49021 , Y10T29/49037 , Y10T29/49046 , Y10T29/49048
摘要： A system for providing transducer(s) including a disk structure and having an air-bearing surface (ABS) are described. The disk structure resides a distance from the ABS and has a disk dimension substantially perpendicular to the ABS. Lapping control and disk windage ELGs are provided. The lapping control ELG has first and second edges first and second distances from the ABS. The disk windage ELG has edges different distances from the ABS. A difference between these edges corresponds to the disk dimension. A windage resistance of the disk windage ELG is measured and a disk windage determined. The disk windage corresponds to a difference between designed and actual disk dimensions perpendicular to the ABS. A lapping ELG target resistance is determined based on the disk windage. The transducer is lapped. Lapping is terminated based on a resistance of the lapping control ELG and the lapping ELG target resistance.
摘要翻译：描述了一种用于提供包括盘结构并具有空气轴承表面（ABS）的换能器的系统。盘结构离ABS有一段距离，并且具有基本上垂直于ABS的盘尺寸。提供研磨控制和磁盘风挡ELG。研磨控制ELG具有第一和第二边缘与ABS之间的第一和第二距离。磁盘风挡ELG与ABS的距离不同。这些边缘之间的差异对应于磁盘维度。测量磁盘风挡ELG的防风阻力并确定磁盘风速。磁盘风挡对应于垂直于ABS的设计和实际磁盘尺寸之间的差异。基于磁盘风向确定研磨ELG目标电阻。。基于研磨控制ELG的电阻和研磨ELG目标电阻来终止研磨。

2. 发明授权

US08717709B1 System for calibrating an electronic lapping guide for a beveled pole in a magnetic recording transducer 有权
标题翻译：用于校准磁记录传感器中斜面极的电子研磨导轨的系统
公开(公告)号：US08717709B1
公开(公告)日：2014-05-06
申请号：US13625270
申请日：2012-09-24
申请人： Western Digital (Fremont), LLC
发明人： Changqing Shi , Ming Jiang
IPC分类号： G11B5/127
CPC分类号： G11B5/3166 , G11B5/3169
摘要： A wafer comprises a transducer having an air-bearing surface (ABS) and including a magnetic structure characterized by a desired thickness, and having a bevel and a flare point a first distance from the ABS. The wafer further comprises a first electronic lapping guide (ELG), a second ELG, and a third ELG. The first ELG has a first edge a first distance from the ABS and a second edge a second distance from the ABS. The second ELG has a third edge a third distance from the ABS and a fourth edge the second distance from the ABS. The third ELG has a fifth edge a fourth distance from the ABS and a sixth edge the second distance from the ABS. At least one of the first distance and the second distance, at least one of the third distance and the second distance, and at least one of the fourth distance and the second distance correspond to an intersection between the bevel and the desired thickness.
摘要翻译：晶片包括具有空气轴承表面（ABS）并具有特征在于期望厚度的磁性结构的换能器，并且具有与ABS成第一距离的斜面和火炬点。晶片还包括第一电子研磨导向器（ELG），第二ELG和第三ELG。第一ELG具有与ABS的第一距离的第一边缘和距离ABS的第二距离的第二边缘。第二ELG具有距离ABS的第三距离的第三边缘和距离ABS的第二距离的第四边缘。第三ELG具有距离ABS的第四距离的第五边缘和距离ABS的第二距离的第六边缘。第一距离和第二距离中的至少一个，第三距离和第二距离中的至少一个以及第四距离和第二距离中的至少一个对应于斜面和期望厚度之间的交点。

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