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1. 发明授权

US06740868B1 Scanning microscope and a method of scanning a specimen 有权
标题翻译：扫描显微镜和扫描样品的方法
公开(公告)号：US06740868B1
公开(公告)日：2004-05-25
申请号：US09681019
申请日：2000-11-28
申请人： Werner Knebel , Joachim Bradl
发明人： Werner Knebel , Joachim Bradl
IPC分类号： H01J314
CPC分类号： G02B21/0076
摘要： A method and a scanning microscope for application of the method for optical-light scanning of a specimen; preferably in scanning microscopy, in particular in confocal laser scanning microscopy, the intensity of the light being regulated, is characterized, in order to optimize signal yield already during the actual data recording or measurement, in that regulation is accomplished as a function of the current focus position in the specimen region of the scanned, focused light beam.
摘要翻译：一种用于样本光学扫描方法的方法和扫描显微镜; 优选在扫描显微术中，特别是在共聚焦激光扫描显微术中，被调节的光的强度被表征，以便在实际的数据记录或测量期间优化信号的产量，该调节作为电流的函数来完成在被扫描的聚焦光束的样本区域中的对焦位置。

2. 发明申请

US20130335818A1 Scanning Microscope, and Method for Light Microscopy Imaging of a Specimen 有权
标题翻译：扫描显微镜和样品的光显微镜成像方法
公开(公告)号：US20130335818A1
公开(公告)日：2013-12-19
申请号：US13978165
申请日：2012-02-20
申请人： Werner Knebel , Arnold Giske
发明人： Werner Knebel , Arnold Giske
IPC分类号： G02B21/06
CPC分类号： G02B21/06 , G01N21/6458 , G02B21/0032 , G02B21/006 , G02B21/0076
摘要： A scanning microscope is described, having an illumination unit for emitting an illumination light beam, an objective for generating an elongated illumination focus in a specimen to be imaged, and a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective. The scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated.
摘要翻译：描述了一种扫描显微镜，其具有用于发射照明光束的照明单元，用于在要成像的样本中产生细长照明聚焦的物镜，以及用于将照射焦点移动到被检体的目标区域上的扫描装置，通过改变照明光束入射到物镜的入射光瞳的入射方向来照亮。扫描装置将照明光束引导到入射光瞳的从瞳孔中心偏移的子区域，以便相对于物镜的光轴倾斜照明聚焦，并且将照明光束的入射方向修改为该子区域用于将照明焦点移动到待照亮的目标区域上。

3. 发明授权

US07633622B2 Method for analyzing a sample and microscope for evanescently illuminating the sample 有权
标题翻译：用于分析样品和显微镜以消除样品的方法
公开(公告)号：US07633622B2
公开(公告)日：2009-12-15
申请号：US11414905
申请日：2006-05-01
申请人： Andreas Hecker , Heinrich Ulrich , Werner Knebel , Kyra Moellmann
发明人： Andreas Hecker , Heinrich Ulrich , Werner Knebel , Kyra Moellmann
IPC分类号： G01N21/55
CPC分类号： G02B21/082 , G02B21/0032 , G02B21/008 , G02B21/02 , G02B21/06 , G02B21/08 , G02B21/16 , G02B21/32
摘要： A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
摘要翻译：公开了具有ev逝样品照明的显微镜和用于测试样品的方法。产生在样品中呈现第一穿透深度的第一渐逝场和在样品中显示大于第一穿透深度的第二穿透深度的第二渐逝场。提供一种检测器，其检测第一检测光，该第一检测光从第一消逝场照射的样品的一部分离开，并从其产生第一检测光数据，并且第二检测光从样品的一部分离开具有第二消逝场，并且从其产生第二检测光数据。此外，提供处理模块来处理第一和第二检测光数据。

4. 发明授权

US07551351B2 Microscope with evanescent sample illumination 有权
标题翻译：显微镜具有渐逝样品照明
公开(公告)号：US07551351B2
公开(公告)日：2009-06-23
申请号：US11415413
申请日：2006-05-01
申请人： Heinrich Ulrich , Werner Knebel , Kyra Moellmann , Peter Euteneuer
发明人： Heinrich Ulrich , Werner Knebel , Kyra Moellmann , Peter Euteneuer
IPC分类号： G02B21/06 , G02B21/00
CPC分类号： G02B21/08 , G02B21/06 , G02B21/32
摘要： A microscope with evanescent sample illumination comprises a device for optically manipulating a sample.
摘要翻译：具有ev逝样品照明的显微镜包括用于光学操纵样品的装置。

5. 发明授权

US07508507B2 Device for selecting and detecting at least two spectral regions of a light beam 有权
标题翻译：用于选择和检测光束的至少两个光谱区域的装置
公开(公告)号：US07508507B2
公开(公告)日：2009-03-24
申请号：US11247750
申请日：2005-10-11
申请人： Werner Knebel , Gabriele Burger
发明人： Werner Knebel , Gabriele Burger
IPC分类号： G01J3/28
CPC分类号： G01J3/26 , G01J3/14 , G01J3/36 , G02B21/0064
摘要： An apparatus for selecting and detecting at least two spectral regions of a light beam includes a selection device, a detection device, and a light suppression device. The light suppression device suppresses reflected and/or scattered light of an illuminating light of a microscope. The light suppression device is located in an optical path between the selection device and the detection device, and includes a graded filter.
摘要翻译：用于选择和检测光束的至少两个光谱区域的装置包括选择装置，检测装置和光抑制装置。光抑制装置抑制显微镜的照明光的反射和/或散射光。光抑制装置位于选择装置和检测装置之间的光路中，并且包括渐变滤光器。

6. 发明申请

US20080151226A1 Method for analyzing a sample and microscope for evanescently illuminating the sample 有权
标题翻译：用于分析样品和显微镜以消除样品的方法
公开(公告)号：US20080151226A1
公开(公告)日：2008-06-26
申请号：US11414905
申请日：2006-05-01
申请人： Andreas Hecker , Heinrich Ulrich , Werner Knebel , Kyra Moellmann
发明人： Andreas Hecker , Heinrich Ulrich , Werner Knebel , Kyra Moellmann
IPC分类号： G01N21/00
CPC分类号： G02B21/082 , G02B21/0032 , G02B21/008 , G02B21/02 , G02B21/06 , G02B21/08 , G02B21/16 , G02B21/32
摘要： A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
摘要翻译：公开了具有ev逝样品照明的显微镜和用于测试样品的方法。产生在样品中呈现第一穿透深度的第一渐逝场和在样品中显示大于第一穿透深度的第二穿透深度的第二渐逝场。提供一种检测器，其检测第一检测光，该第一检测光从第一消逝场照射的样品的一部分离开，并从其产生第一检测光数据，并且第二检测光从样品的一部分离开具有第二消逝场，并且从其产生第二检测光数据。此外，提供处理模块来处理第一和第二检测光数据。

7. 发明申请

US20060245049A1 Scanning microscope 审中-公开
标题翻译：扫描显微镜
公开(公告)号：US20060245049A1
公开(公告)日：2006-11-02
申请号：US10565615
申请日：2004-07-26
申请人： Werner Knebel
发明人： Werner Knebel
IPC分类号： G02B21/06
CPC分类号： G02B21/0024 , G01J3/0205 , G02B21/18
摘要： The invention relates to a scanning microscope with a light source, defining an illumination light beam, and a spectral detector for detection of the detection light coming from the sample, which defines a detection beam and which contains a spectral splitter component. The scanning microscope is characterized in that the spectral splitting component separates the illumination and the detection beams.
摘要翻译：本发明涉及一种具有限定一个照明光束的光源的扫描显微镜和用于检测来自该样本的检测光的光谱检测器，该检测光限定一个检测光束并且包含一个光谱分离器部件。扫描显微镜的特征在于，光谱分离部件分离照明和检测光束。

8. 发明申请

US20060152787A1 Scanning microscope comprising a confocal slit scanner for reproducing an object 有权
标题翻译：扫描显微镜，包括用于再现物体的共聚焦狭缝扫描器
公开(公告)号：US20060152787A1
公开(公告)日：2006-07-13
申请号：US10537335
申请日：2003-09-23
申请人： Werner Knebel , Holger Birk , Rafael Storz
发明人： Werner Knebel , Holger Birk , Rafael Storz
IPC分类号： G02B26/08
CPC分类号： G02B21/0032 , G02B21/0076 , G02B21/0084
摘要： A scanning microscope for imaging an object includes a light source and a spectrally selective detection device. An illumination beam path extends from the light source to the object. A detection beam path extends from the object to the detection device. A spectrally selective element useable to select light from the light source is provided. The spectrally selective element is useable to mask out of the detection beam path the selected light from the light source reflected or scattered on the object. An illumination slit diaphragm is disposed in the illumination beam path and configured to generate a linear illumination pattern in a region of the object. A detection slit diaphragm is disposed in the detection beam path and configured to detect the light coming from the linear illumination region from a focal plane so as to provide a confocal slit scanner.
摘要翻译：用于对物体成像的扫描显微镜包括光源和光谱选择性检测装置。照明光束路径从光源延伸到物体。检测光束路径从物体延伸到检测装置。提供了可用于选择来自光源的光的光谱选择性元件。光谱选择元件可用于从反射或散射在物体上的光源的光源遮掩出检测光束路径。照明狭缝光阑设置在照明光束路径中并且被配置为在物体的区域中产生线性照明图案。检测狭缝光阑设置在检测光束路径中，并被配置为从焦平面检测来自线性照明区域的光，以提供共焦狭缝扫描器。

9. 发明授权

US06878948B2 Method and arrangement for locating specimen regions 有权
标题翻译：定位标本区域的方法和布置
公开(公告)号：US06878948B2
公开(公告)日：2005-04-12
申请号：US10026221
申请日：2001-12-19
申请人： Werner Knebel
发明人： Werner Knebel
IPC分类号： G01N21/64 , G01N33/00 , G01N21/76
CPC分类号： G01N21/6458 , G01N21/6428 , G02B21/0076
摘要： The invention discloses a method for locating specimen regions of interest in a stimulatable microscopic specimen (13) that comprises the steps of: introducing into a specimen (13) of at least two stimulation-specific stains, illuminating with at least one illuminating light beam (7), initiating a stimulation, detection (4) of the light (16) emerging from the stimulation-specific stains, and identifying (5) of the spatial position of the regions within the specimen (13) from which light of at least two different wavelengths that are emission wavelengths of the stimulation-specific stains is emerging.
摘要翻译：本发明公开了一种用于在可刺激的微观样本（13）中定位感兴趣的感兴趣区域的方法，包括以下步骤：将至少两个刺激特异性污渍的样品（13）引入至少一个照明光束从刺激特异性污渍引发刺激，检测（4）光（16），以及识别（5）所述样本（13）内的至少两个光的区域的空间位置作为刺激特异性污渍的发射波长的不同波长正在出现。

10. 发明申请

US20050017197A1 Scanning microscope and method for scanning microscopy 审中-公开
标题翻译：扫描显微镜和扫描显微镜的方法
公开(公告)号：US20050017197A1
公开(公告)日：2005-01-27
申请号：US10898770
申请日：2004-07-26
申请人： Heinrich Ulrich , Werner Knebel
发明人： Heinrich Ulrich , Werner Knebel
IPC分类号： G02B21/00 , G01N21/64
CPC分类号： G02B21/008 , G01N21/6458 , G01N2021/6471
摘要： A scanning microscope has a detector for detecting the detected light proceeding from a sample. A bandpass filter, containing a combination of a short-pass filter and at least one long-pass filter, is arranged in the light path of the detected light. The detector is a non-descan detector.
摘要翻译：扫描显微镜具有用于检测从样品进行的检测光的检测器。包含短路滤波器和至少一个长通滤波器的组合的带通滤波器被布置在检测光的光路中。检测器是一个非分辨率检测器。

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