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1. 发明申请

US20140300958A1 ARRANGEMENT FOR USE IN THE ILLUMINATION OF A SPECIMEN IN SPIM MICROSCOPY 有权
标题翻译：用于荧光显微镜样品照射的布置
公开(公告)号：US20140300958A1
公开(公告)日：2014-10-09
申请号：US14354601
申请日：2012-10-22
申请人： Werner Knebel , Frank Sieckmann , Bernd Widzgowski , Wernher Fouquet
发明人： Werner Knebel , Frank Sieckmann , Bernd Widzgowski , Wernher Fouquet
IPC分类号： G02B21/00
CPC分类号： G02B21/0032 , G02B21/0036 , G02B21/0076 , G02B21/084 , G02B21/10 , G02B21/16 , G02B21/367
摘要： An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another.
摘要翻译：用于在SPIM显微镜中照射样品的布置包括被配置为接收和聚焦光条或准光条的照明物镜。准光条由在光带平面中连续移动的光束组成。偏转装置被配置为在光条或准光带已经穿过照明物镜之后使光条或准光条偏转，使得光条或准光条在相对于照明物镜的光轴不同于零度的角度。照明物镜和偏转装置相对于彼此可移动地布置。

2. 发明授权

US07492511B2 Scanning microscope 有权
标题翻译：扫描显微镜
公开(公告)号：US07492511B2
公开(公告)日：2009-02-17
申请号：US11572514
申请日：2005-07-20
申请人： Werner Knebel , Bernd Widzgowski
发明人： Werner Knebel , Bernd Widzgowski
IPC分类号： G02B21/00 , G02B27/40
CPC分类号： G02B21/0064 , G02B21/0032
摘要： The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.
摘要翻译：本发明涉及一种扫描显微镜，其包括光束偏转装置（11），其将照明光束（5）引导到或穿过样本（21），并且包括检测器（33），用于接收离开所述检测器样品。扫描显微镜包括提取端口（67）或另一个检测器（37），并且包括与光束偏转装置同步的重定向装置（27），并且根据光束偏转装置的偏转位置引导检测光到检测器或提取端口或另一检测器。

3. 发明申请

US20070223076A1 Scanning Microscope 有权
标题翻译：扫描显微镜
公开(公告)号：US20070223076A1
公开(公告)日：2007-09-27
申请号：US11572514
申请日：2005-07-20
申请人： Werner Knebel , Bernd Widzgowski
发明人： Werner Knebel , Bernd Widzgowski
IPC分类号： G02B26/10
CPC分类号： G02B21/0064 , G02B21/0032
摘要： The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.
摘要翻译：本发明涉及一种扫描显微镜，其包括光束偏转装置（11），其将照明光束（5）引导到或穿过样本（21），并且包括检测器（33），用于接收离开所述检测器样品。扫描显微镜包括提取端口（67）或另一个检测器（37），并且包括与光束偏转装置同步的重定向装置（27），并且根据光束偏转装置的偏转位置引导检测光到检测器或提取端口或另一检测器。

4. 发明授权

US09772481B2 Arrangement for use in the illumination of a specimen in SPIM microscopy 有权
公开(公告)号：US09772481B2
公开(公告)日：2017-09-26
申请号：US14354601
申请日：2012-10-22
申请人： Werner Knebel , Frank Sieckmann , Bernd Widzgowski , Wernher Fouquet
发明人： Werner Knebel , Frank Sieckmann , Bernd Widzgowski , Wernher Fouquet
IPC分类号： G02B21/06 , G02B21/00 , G02B21/08 , G02B21/10 , G02B21/16 , G02B21/36
CPC分类号： G02B21/0032 , G02B21/0036 , G02B21/0076 , G02B21/084 , G02B21/10 , G02B21/16 , G02B21/367
摘要： An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another.

5. 发明申请

US20130335818A1 Scanning Microscope, and Method for Light Microscopy Imaging of a Specimen 有权
标题翻译：扫描显微镜和样品的光显微镜成像方法
公开(公告)号：US20130335818A1
公开(公告)日：2013-12-19
申请号：US13978165
申请日：2012-02-20
申请人： Werner Knebel , Arnold Giske
发明人： Werner Knebel , Arnold Giske
IPC分类号： G02B21/06
CPC分类号： G02B21/06 , G01N21/6458 , G02B21/0032 , G02B21/006 , G02B21/0076
摘要： A scanning microscope is described, having an illumination unit for emitting an illumination light beam, an objective for generating an elongated illumination focus in a specimen to be imaged, and a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective. The scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated.
摘要翻译：描述了一种扫描显微镜，其具有用于发射照明光束的照明单元，用于在要成像的样本中产生细长照明聚焦的物镜，以及用于将照射焦点移动到被检体的目标区域上的扫描装置，通过改变照明光束入射到物镜的入射光瞳的入射方向来照亮。扫描装置将照明光束引导到入射光瞳的从瞳孔中心偏移的子区域，以便相对于物镜的光轴倾斜照明聚焦，并且将照明光束的入射方向修改为该子区域用于将照明焦点移动到待照亮的目标区域上。

6. 发明授权

US07633622B2 Method for analyzing a sample and microscope for evanescently illuminating the sample 有权
标题翻译：用于分析样品和显微镜以消除样品的方法
公开(公告)号：US07633622B2
公开(公告)日：2009-12-15
申请号：US11414905
申请日：2006-05-01
申请人： Andreas Hecker , Heinrich Ulrich , Werner Knebel , Kyra Moellmann
发明人： Andreas Hecker , Heinrich Ulrich , Werner Knebel , Kyra Moellmann
IPC分类号： G01N21/55
CPC分类号： G02B21/082 , G02B21/0032 , G02B21/008 , G02B21/02 , G02B21/06 , G02B21/08 , G02B21/16 , G02B21/32
摘要： A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
摘要翻译：公开了具有ev逝样品照明的显微镜和用于测试样品的方法。产生在样品中呈现第一穿透深度的第一渐逝场和在样品中显示大于第一穿透深度的第二穿透深度的第二渐逝场。提供一种检测器，其检测第一检测光，该第一检测光从第一消逝场照射的样品的一部分离开，并从其产生第一检测光数据，并且第二检测光从样品的一部分离开具有第二消逝场，并且从其产生第二检测光数据。此外，提供处理模块来处理第一和第二检测光数据。

7. 发明授权

US07551351B2 Microscope with evanescent sample illumination 有权
标题翻译：显微镜具有渐逝样品照明
公开(公告)号：US07551351B2
公开(公告)日：2009-06-23
申请号：US11415413
申请日：2006-05-01
申请人： Heinrich Ulrich , Werner Knebel , Kyra Moellmann , Peter Euteneuer
发明人： Heinrich Ulrich , Werner Knebel , Kyra Moellmann , Peter Euteneuer
IPC分类号： G02B21/06 , G02B21/00
CPC分类号： G02B21/08 , G02B21/06 , G02B21/32
摘要： A microscope with evanescent sample illumination comprises a device for optically manipulating a sample.
摘要翻译：具有ev逝样品照明的显微镜包括用于光学操纵样品的装置。

8. 发明授权

US07508507B2 Device for selecting and detecting at least two spectral regions of a light beam 有权
标题翻译：用于选择和检测光束的至少两个光谱区域的装置
公开(公告)号：US07508507B2
公开(公告)日：2009-03-24
申请号：US11247750
申请日：2005-10-11
申请人： Werner Knebel , Gabriele Burger
发明人： Werner Knebel , Gabriele Burger
IPC分类号： G01J3/28
CPC分类号： G01J3/26 , G01J3/14 , G01J3/36 , G02B21/0064
摘要： An apparatus for selecting and detecting at least two spectral regions of a light beam includes a selection device, a detection device, and a light suppression device. The light suppression device suppresses reflected and/or scattered light of an illuminating light of a microscope. The light suppression device is located in an optical path between the selection device and the detection device, and includes a graded filter.
摘要翻译：用于选择和检测光束的至少两个光谱区域的装置包括选择装置，检测装置和光抑制装置。光抑制装置抑制显微镜的照明光的反射和/或散射光。光抑制装置位于选择装置和检测装置之间的光路中，并且包括渐变滤光器。

9. 发明申请

US20080151226A1 Method for analyzing a sample and microscope for evanescently illuminating the sample 有权
标题翻译：用于分析样品和显微镜以消除样品的方法
公开(公告)号：US20080151226A1
公开(公告)日：2008-06-26
申请号：US11414905
申请日：2006-05-01
申请人： Andreas Hecker , Heinrich Ulrich , Werner Knebel , Kyra Moellmann
发明人： Andreas Hecker , Heinrich Ulrich , Werner Knebel , Kyra Moellmann
IPC分类号： G01N21/00
CPC分类号： G02B21/082 , G02B21/0032 , G02B21/008 , G02B21/02 , G02B21/06 , G02B21/08 , G02B21/16 , G02B21/32
摘要： A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
摘要翻译：公开了具有ev逝样品照明的显微镜和用于测试样品的方法。产生在样品中呈现第一穿透深度的第一渐逝场和在样品中显示大于第一穿透深度的第二穿透深度的第二渐逝场。提供一种检测器，其检测第一检测光，该第一检测光从第一消逝场照射的样品的一部分离开，并从其产生第一检测光数据，并且第二检测光从样品的一部分离开具有第二消逝场，并且从其产生第二检测光数据。此外，提供处理模块来处理第一和第二检测光数据。

10. 发明申请

US20060245049A1 Scanning microscope 审中-公开
标题翻译：扫描显微镜
公开(公告)号：US20060245049A1
公开(公告)日：2006-11-02
申请号：US10565615
申请日：2004-07-26
申请人： Werner Knebel
发明人： Werner Knebel
IPC分类号： G02B21/06
CPC分类号： G02B21/0024 , G01J3/0205 , G02B21/18
摘要： The invention relates to a scanning microscope with a light source, defining an illumination light beam, and a spectral detector for detection of the detection light coming from the sample, which defines a detection beam and which contains a spectral splitter component. The scanning microscope is characterized in that the spectral splitting component separates the illumination and the detection beams.
摘要翻译：本发明涉及一种具有限定一个照明光束的光源的扫描显微镜和用于检测来自该样本的检测光的光谱检测器，该检测光限定一个检测光束并且包含一个光谱分离器部件。扫描显微镜的特征在于，光谱分离部件分离照明和检测光束。

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