专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20110102778A1 Geometric Error Measuring Device 有权
标题翻译：几何误差测量装置
公开(公告)号：US20110102778A1
公开(公告)日：2011-05-05
申请号：US12612400
申请日：2009-11-04
申请人： Wen-Yuh Jywe , Teng-Yu Yang , Tung-Hui Hsu
发明人： Wen-Yuh Jywe , Teng-Yu Yang , Tung-Hui Hsu
IPC分类号： G01B11/27
CPC分类号： G01B11/002
摘要： A geometric error measuring device includes a measuring module and at least one (quadrant) photodiode. The measuring module has an emitting deice, which may emit at least one light ray; the photodiode may receive the incident ray. Also, the trajectory of the incident ray is parallel with the direction of measurement. If there is no geometric error, the position of the incident light ray will coincide with the position of the measured light ray. If there is a geometric error, the position of the measured light ray will not coincide with the position of the incident light ray. After the data are processed and calculated, geometric errors in straightness, squareness and rotational angles (pitch, yaw and roll) may be obtained. These geometric errors may then be corrected in the setup of a machine.
摘要翻译：几何误差测量装置包括测量模块和至少一个（象限）光电二极管。测量模块具有可发射至少一个光线的发射导体; 光电二极管可以接收入射光线。此外，入射光线的轨迹与测量方向平行。如果没有几何误差，则入射光线的位置与被测光线的位置一致。如果存在几何误差，则测量光线的位置与入射光线的位置不一致。在处理和计算数据之后，可以获得平直度，矩形度和旋转角度（俯仰，偏航和滚动）的几何误差。然后可以在机器的设置中校正这些几何误差。

2. 发明申请

US20110261348A1 Optical Calibration and Testing Device for Machine Tools 失效
标题翻译：机床光学校准和测试装置
公开(公告)号：US20110261348A1
公开(公告)日：2011-10-27
申请号：US13075249
申请日：2011-03-30
申请人： Wen-Yuh Jywe , Chia-Hung Wu , I-Ching Chen , Tung-Hui Hsu , Ren-Chieh Fung , Teng-Yu Yang
发明人： Wen-Yuh Jywe , Chia-Hung Wu , I-Ching Chen , Tung-Hui Hsu , Ren-Chieh Fung , Teng-Yu Yang
IPC分类号： G01B11/02
CPC分类号： G01B11/272 , G01B11/26
摘要： An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.
摘要翻译：用于机床的光学校准和测试装置包括光源单元，分束器和至少一个光电检测器。光源发射激光束击中光束分离器，并被分成两束。一个垂直于光源单元的基础，另一个与基座平行，以测试机床的直线度，倾斜角度，垂直度，垂直列倾斜度，垂直列平行度和导杆倾斜度。如果没有测试错误，则测试光点的位置与初始光斑的位置一致。如果有错误，则测试光斑的位置会根据错误而有所不同。

3. 发明授权

US08325333B2 Geometric error measuring device 有权
标题翻译：几何误差测量装置
公开(公告)号：US08325333B2
公开(公告)日：2012-12-04
申请号：US12612400
申请日：2009-11-04
申请人： Wen-Yuh Jywe , Teng-Yu Yang , Tung-Hui Hsu
发明人： Wen-Yuh Jywe , Teng-Yu Yang , Tung-Hui Hsu
IPC分类号： G01B11/26
CPC分类号： G01B11/002
摘要： A geometric error measuring device includes a measuring module and at least one (quadrant) photodiode. The measuring module has an emitting deice, which may emit at least one light ray; the photodiode may receive the incident ray. Also, the trajectory of the incident ray is parallel with the direction of measurement. If there is no geometric error, the position of the incident light ray will coincide with the position of the measured light ray. If there is a geometric error, the position of the measured light ray will not coincide with the position of the incident light ray. After the data are processed and calculated, geometric errors in straightness, squareness and rotational angles (pitch, yaw and roll) may be obtained. These geometric errors may then be corrected in the setup of a machine.
摘要翻译：几何误差测量装置包括测量模块和至少一个（象限）光电二极管。测量模块具有可发射至少一个光线的发射导体; 光电二极管可以接收入射光线。此外，入射光线的轨迹与测量方向平行。如果没有几何误差，则入射光线的位置与被测光线的位置一致。如果存在几何误差，则测量光线的位置与入射光线的位置不一致。在处理和计算数据之后，可以获得平直度，矩形度和旋转角度（俯仰，偏航和滚动）的几何误差。然后可以在机器的设置中校正这些几何误差。

4. 发明授权

US08542358B2 Optical calibration and testing device for machine tools 失效
标题翻译：机床光学校准和测试装置
公开(公告)号：US08542358B2
公开(公告)日：2013-09-24
申请号：US13075249
申请日：2011-03-30
申请人： Wen-Yuh Jywe , Chia-Hung Wu , I-Ching Chen , Tung-Hui Hsu , Ren-Chieh Fung , Teng-Yu Yang
发明人： Wen-Yuh Jywe , Chia-Hung Wu , I-Ching Chen , Tung-Hui Hsu , Ren-Chieh Fung , Teng-Yu Yang
IPC分类号： G01B11/00 , G01B11/26
CPC分类号： G01B11/272 , G01B11/26
摘要： An optical calibration and testing device for machine tools includes a light source unit, a beam splitter, and at least one photo detector. The light source emits a laser light hitting the beam splitter and is split into two beams. One is perpendicular to the foundation of the light source unit, and the other is parallel with the foundation so as to test straightness, inclination angle, verticalness, vertical column inclination, vertical column parallelism and guide bar inclination of a machine tool. If there is no tested error, the position of the testing light spot coincides with that of the initial light spot. If there is an error, the position of testing light spot varies according to the error.
摘要翻译：用于机床的光学校准和测试装置包括光源单元，分束器和至少一个光电检测器。光源发射激光束击中光束分离器，并被分成两束。一个垂直于光源单元的基础，另一个与基座平行，以测试机床的直线度，倾斜角度，垂直度，垂直列倾斜度，垂直列平行度和导杆倾斜度。如果没有测试错误，则测试光点的位置与初始光斑的位置一致。如果有错误，则测试光斑的位置会根据错误而有所不同。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式