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1. 发明授权

US08106673B2 Probe for high frequency signal transmission 有权
标题翻译：探头用于高频信号传输
公开(公告)号：US08106673B2
公开(公告)日：2012-01-31
申请号：US12788291
申请日：2010-05-26
申请人： Wei-Cheng Ku , Chih-Hao Ho , Chia-Tai Chang , Ho-Hui Lin , Chien-Ho Lin
发明人： Wei-Cheng Ku , Chih-Hao Ho , Chia-Tai Chang , Ho-Hui Lin , Chien-Ho Lin
IPC分类号： G01R31/20
CPC分类号： G01R1/06772
摘要： A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of the probe is substantially equal to or smaller than two times of the diameter of the metal pin. Under this circumstance, a big amount of probes can be installed in a probe card for probing a big amount of electronic devices, so that a wafer-level electronic test can be achieved efficiently and rapidly.
摘要翻译：用于高频信号传输的探针包括金属引脚和间隔布置在金属引脚上并与金属引脚电绝缘的金属线，并且电连接到接地电位，以便在传输高频信号时保持探针的特性阻抗。探头的最大直径基本上等于或小于金属销的直径的两倍。在这种情况下，可以在探针卡中安装大量的探头，用于探测大量电子设备，从而可以高效快速地实现晶圆级电子测试。

2. 发明申请

US20100253378A1 PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION 有权
标题翻译：高频信号传输探测
公开(公告)号：US20100253378A1
公开(公告)日：2010-10-07
申请号：US12788291
申请日：2010-05-26
申请人： Wei-Cheng Ku , Chih-Hao Ho , Chia-Tai Chang , Ho-Hui Lin , Chien-Ho Lin
发明人： Wei-Cheng Ku , Chih-Hao Ho , Chia-Tai Chang , Ho-Hui Lin , Chien-Ho Lin
IPC分类号： G01R31/02
CPC分类号： G01R1/06772
摘要： A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of the probe is substantially equal to or smaller than two times of the diameter of the metal pin. Under this circumstance, a big amount of probes can be installed in a probe card for probing a big amount of electronic devices, so that a wafer-level electronic test can be achieved efficiently and rapidly.
摘要翻译：用于高频信号传输的探针包括金属引脚和间隔布置在金属引脚上并与金属引脚电绝缘的金属线，并且电连接到接地电位，以便在传输高频信号时保持探针的特性阻抗。探头的最大直径基本上等于或小于金属销的直径的两倍。在这种情况下，可以在探针卡中安装大量的探头，用于探测大量电子设备，从而可以高效快速地实现晶圆级电子测试。

3. 发明授权

US07791359B2 Probe for high frequency signal transmission and probe card using the same 有权
标题翻译：探头用于高频信号传输和探针卡使用相同
公开(公告)号：US07791359B2
公开(公告)日：2010-09-07
申请号：US11970739
申请日：2008-01-08
申请人： Wei-Cheng Ku , Chih-Hao Ho , Chia-Tai Chang , Ho-Hui Lin , Chien-Ho Lin
发明人： Wei-Cheng Ku , Chih-Hao Ho , Chia-Tai Chang , Ho-Hui Lin , Chien-Ho Lin
IPC分类号： G01R31/02
CPC分类号： G01R1/06772
摘要： A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of the probe is substantially equal to or smaller than two times of the diameter of the metal pin. Under this circumstance, a big amount of probes can be installed in a probe card for probing a big amount of electronic devices, so that a wafer-level electronic test can be achieved efficiently and rapidly.
摘要翻译：用于高频信号传输的探针包括金属引脚和间隔布置在金属引脚上并与金属引脚电绝缘的金属线，并且电连接到接地电位，以便在传输高频信号时保持探针的特性阻抗。探头的最大直径基本上等于或小于金属销的直径的两倍。在这种情况下，可以在探针卡中安装大量的探头，用于探测大量电子设备，从而可以高效快速地实现晶圆级电子测试。

4. 发明申请

US20080164900A1 PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION AND PROBE CARD USING THE SAME 有权
标题翻译：用于高频信号传输的探头和使用它的探头卡
公开(公告)号：US20080164900A1
公开(公告)日：2008-07-10
申请号：US11970739
申请日：2008-01-08
申请人： Wei-Cheng KU , Chih-Hao Ho , Chia-Tai Chang , Ho-Hui Lin , Chien-Ho Lin
发明人： Wei-Cheng KU , Chih-Hao Ho , Chia-Tai Chang , Ho-Hui Lin , Chien-Ho Lin
IPC分类号： G01R1/067
CPC分类号： G01R1/06772
摘要： A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of the probe is substantially equal to or smaller than two times of the diameter of the metal pin. Under this circumstance, a big amount of probes can be installed in a probe card for probing a big amount of electronic devices, so that a wafer-level electronic test can be achieved efficiently and rapidly.
摘要翻译：用于高频信号传输的探针包括金属引脚和间隔布置在金属引脚上并与金属引脚电绝缘的金属线，并且电连接到接地电位，以便在传输高频信号时保持探针的特性阻抗。探头的最大直径基本上等于或小于金属销的直径的两倍。在这种情况下，可以在探针卡中安装大量的探头，用于探测大量电子设备，从而可以高效快速地实现晶圆级电子测试。

5. 发明申请

US20090009198A1 PROBING DEVICE 有权
标题翻译：探测器件
公开(公告)号：US20090009198A1
公开(公告)日：2009-01-08
申请号：US12133249
申请日：2008-06-04
申请人： Wei-Cheng Ku , Chih-Hao Ho , Ho-Hui Lin , Te-Chen Feng , Jun-Liang Lai , Jia-Chi Ho , Chih-Chung Chien , Chien-Huei Huang , Ai-Chuan Chang , Horng-Chuan Sun
发明人： Wei-Cheng Ku , Chih-Hao Ho , Ho-Hui Lin , Te-Chen Feng , Jun-Liang Lai , Jia-Chi Ho , Chih-Chung Chien , Chien-Huei Huang , Ai-Chuan Chang , Horng-Chuan Sun
IPC分类号： G01R1/073
CPC分类号： G01R31/2889 , G01R1/06772 , H01L2924/0002 , H01L2924/00
摘要： A probing device includes a rack that has an outer support member supporting a circuit layer and a center support member supporting a probe assembly. When the tester touching down the circuit layer of the probing device from the top side, the outer support member of the rack bears this touchdown stress. When the probes of the probe holder touching down the electronic components of an IC wafer under test, the center support member of the rack bears the reaction force from the IC wafer.
摘要翻译：探测装置包括具有支撑电路层的外部支撑构件的支架和支撑探针组件的中心支撑构件。当测试仪从顶侧触摸探测装置的电路层时，机架的外部支撑构件承受该接地应力。当探针支架的探针接触测试中的IC晶片的电子部件时，支架的中心支撑部件承受来自IC晶片的反作用力。

6. 发明授权

US07782070B2 Probing device 有权
标题翻译：探测装置
公开(公告)号：US07782070B2
公开(公告)日：2010-08-24
申请号：US12133249
申请日：2008-06-04
申请人： Wei-Cheng Ku , Chih-Hao Ho , Ho-Hui Lin , Te-Chen Feng , Jun-Liang Lai , Jia-Chi Ho , Chih-Chung Chien , Chien-Huei Huang , Ai-Chuan Chang , Horng-Chuan Sun
发明人： Wei-Cheng Ku , Chih-Hao Ho , Ho-Hui Lin , Te-Chen Feng , Jun-Liang Lai , Jia-Chi Ho , Chih-Chung Chien , Chien-Huei Huang , Ai-Chuan Chang , Horng-Chuan Sun
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R1/06772 , H01L2924/0002 , H01L2924/00
摘要： A probing device includes a rack that has an outer support member supporting a circuit layer and a center support member supporting a probe assembly. When the tester touching down the circuit layer of the probing device from the top side, the outer support member of the rack bears this touchdown stress. When the probes of the probe holder touching down the electronic components of an IC wafer under test, the center support member of the rack bears the reaction force from the IC wafer.
摘要翻译：探测装置包括具有支撑电路层的外部支撑构件的支架和支撑探针组件的中心支撑构件。当测试仪从顶侧触摸探测装置的电路层时，机架的外部支撑构件承受该接地应力。当探针支架的探针接触测试中的IC晶片的电子部件时，支架的中心支撑部件承受来自IC晶片的反作用力。

7. 发明授权

US08638116B2 Probe card having configurable structure for exchanging or swapping electronic components for impedance matching and impedance matching method therefore 有权
标题翻译：因此，具有用于交换或交换用于阻抗匹配和阻抗匹配方法的电子部件的可配置结构的探针卡
公开(公告)号：US08638116B2
公开(公告)日：2014-01-28
申请号：US13044564
申请日：2011-03-10
申请人： Chao-Ching Huang , Chih-Hao Ho , Wei-Cheng Ku
发明人： Chao-Ching Huang , Chih-Hao Ho , Wei-Cheng Ku
IPC分类号： G01R31/00
CPC分类号： G01R31/2887 , G01R1/07314 , G01R31/2889
摘要： A probe card having a configurable structure for exchanging/swapping electronic components for impedance matching and an impedance method therefore are provided. In the probe card, an applied force is exerted on the electronic component so as to make the electronic component electrically connected with at least one conductive contact pad of a supporting unit. The supporting unit is a circuit board or a space transformer. In order to facilitate the exchange or swap of the electronic component, the applied force can be removed. The probe card includes a pressing plate which can be moved between a pressing position and a non-pressing position. The pressing plate has a pressing surface which is contacted with the top end of the electronic component while the pressing plate is in the pressing position. Therefore, the applied force can be generated or removed by changing the positioning of the pressing plate.
摘要翻译：提供具有用于交换/交换用于阻抗匹配的电子部件的可配置结构的探针卡和阻抗方法。在探针卡中，施加的力施加在电子部件上，以使电子部件与支撑单元的至少一个导电接触垫电连接。支持单元是电路板或空间变压器。为了促进电子部件的交换或交换，可以移除施加的力。探针卡包括能够在按压位置和非按压位置之间移动的按压板。按压板具有在按压板处于按压位置时与电子部件的顶端接触的按压面。因此，可以通过改变压板的定位来产生或去除施加的力。

8. 发明申请

US20080007278A1 High-frequency probe card and transmission line for high-frequency probe card 有权
标题翻译：高频探针卡和高频探针卡传输线
公开(公告)号：US20080007278A1
公开(公告)日：2008-01-10
申请号：US11583740
申请日：2006-10-20
申请人： Wei-Cheng Ku , Hsin-Hung Lin , Chih-Hao Ho , Te-Chen Feng
发明人： Wei-Cheng Ku , Hsin-Hung Lin , Chih-Hao Ho , Te-Chen Feng
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R1/06772
摘要： A high-frequency probe card includes a circuit board having signal circuits and grounding circuits, transmission lines each having a bi-wire structure including a first lead wire for transmitting high-frequency signal and a second lead wire connected to the grounding circuits, and signal probes. High-frequency test signal provided by a test machine to the signal circuits can be transmitted to the signal probes through the first lead wires. Since the grounding circuits and second lead wires are provided adjacent to the signal circuits and first lead wires respectively, the high-frequency signal can be efficiently transmitted and the characteristic impedance matching can be maintained during high-frequency signal transmission. The bi-wire structure of the transmission lines has a diameter equal to or less than 1 millimeter, thereby allowing installation of a big number of the transmission lines such that the high-frequency test for a big number of electronic elements can be realized.
摘要翻译：高频探针卡包括具有信号电路和接地电路的电路板，各传输线均具有双线结构，包括用于传输高频信号的第一引线和连接到接地电路的第二引线，以及信号探针。由测试机提供的信号电路的高频测试信号可以通过第一个引线传输到信号探头。由于接地电路和第二引线分别与信号电路和第一引线相邻地设置，所以可以有效地发送高频信号，并且可以在高频信号传输期间保持特性阻抗匹配。传输线的双线结构的直径等于或小于1毫米，从而可以安装大量的传输线，从而可以实现大量电子元件的高频测试。

9. 发明授权

US08816713B2 Probe card having adjustable high frequency signal transmission path for transmission of high frequency signal 有权
标题翻译：探头卡具有可调高频信号传输路径，用于传输高频信号
公开(公告)号：US08816713B2
公开(公告)日：2014-08-26
申请号：US13554528
申请日：2012-07-20
申请人： Wei-Cheng Ku , Chih-Hao Ho , Chen-Kuo Kao , Chao-Ping Hsieh
发明人： Wei-Cheng Ku , Chih-Hao Ho , Chen-Kuo Kao , Chao-Ping Hsieh
IPC分类号： G01R31/00 , G01R1/073 , G01R31/28 , G01R1/06 , G01R1/067
CPC分类号： G01R31/2889 , G01R1/06 , G01R1/067 , G01R1/06772 , G01R1/073
摘要： A probe card for high-frequency signal transmission includes a circuit board with transmission lines, a plurality of probes, and a signal path adjuster having first lead wires with a same length respectively connected between the transmission lines and the probes. Each first lead wire is selectively replaceable by a second lead having a length different from that of the first lead wire. As a result, a first high-frequency signal transmitting from one transmission line through the associated first lead wire to the associated probe and a second high-frequency signal transmitting from another transmission line through the associated second lead wire to the associated probe may have a same output timing when the first and second high-frequency signals are synchronously inputted into the circuit board.
摘要翻译：用于高频信号传输的探针卡包括具有传输线的电路板，多个探针和信号路径调节器，其具有分别连接在传输线和探针之间的具有相同长度的第一导线。每个第一引线可以由具有与第一引线的长度不同的长度的第二引线选择性地替换。结果，从一条传输线通过相关联的第一引线传输到相关联的探头的第一高频信号和从另一传输线通过相关联的第二引线传输到相关探头的第二高频信号可以具有当第一和第二高频信号被同步输入到电路板中时，具有相同的输出定时。

10. 发明申请

US20130021053A1 PROBE CARD HAVING ADJUSTABLE HIGH FREQUENCY SIGNAL TRANSMISSION PATH FOR TRANSMISSION OF HIGH FREQUENCY SIGNAL 有权
标题翻译：具有用于传输高频信号的可调高频信号传输路径的探针卡
公开(公告)号：US20130021053A1
公开(公告)日：2013-01-24
申请号：US13554528
申请日：2012-07-20
申请人： Wei-Cheng KU , Chih-Hao Ho , Chen-Kuo Kao , Chao-Ping Hsieh
发明人： Wei-Cheng KU , Chih-Hao Ho , Chen-Kuo Kao , Chao-Ping Hsieh
IPC分类号： G01R31/00
CPC分类号： G01R31/2889 , G01R1/06 , G01R1/067 , G01R1/06772 , G01R1/073
摘要： A probe card for high-frequency signal transmission includes a circuit board with transmission lines, a plurality of probes, and a signal path adjuster having first lead wires with a same length respectively connected between the transmission lines and the probes. Each first lead wire is selectively replaceable by a second lead having a length different from that of the first lead wire. As a result, a first high-frequency signal transmitting from one transmission line through the associated first lead wire to the associated probe and a second high-frequency signal transmitting from another transmission line through the associated second lead wire to the associated probe may have a same output timing when the first and second high-frequency signals are synchronously inputted into the circuit board.
摘要翻译：用于高频信号传输的探针卡包括具有传输线的电路板，多个探针和信号路径调节器，其具有分别连接在传输线和探针之间的具有相同长度的第一导线。每个第一引线可以由具有与第一引线的长度不同的长度的第二引线选择性地替换。结果，从一条传输线通过相关联的第一引线传输到相关联的探头的第一高频信号和从另一传输线通过相关联的第二引线传输到相关探头的第二高频信号可以具有当第一和第二高频信号被同步输入到电路板中时，具有相同的输出定时。

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