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    • 3. 发明授权
    • Method of fabricating a quasi-substrate wafer and semiconductor body fabricated using such a quasi-substrate wafer
    • 使用这种准基板晶片制造准基板晶片和半导体主体的方法
    • US08012256B2
    • 2011-09-06
    • US11668718
    • 2007-01-30
    • Georg BrüderlChristoph EichlerUwe Strauss
    • Georg BrüderlChristoph EichlerUwe Strauss
    • C30B29/06
    • H01L21/76254
    • Disclosed are a method of fabricating a quasi-substrate wafer with a subcarrier wafer and a growth layer, and a semiconductor body fabricated using such a quasi-substrate wafer. In the method of fabricating a quasi-substrate wafer, a growth substrate water is fabricated that is provided with a separation zone and comprises the desired material of the growth layer. The growth substrate wafer is provided with a stress that counteracts a stress generated by the formation of the separation zone, and/or the stress generated by the formation of the separation zone is distributed, by structuring a first main race of the growth substrate water and/or the separation zone, to a plurality of subregions along the first main face. The growth substrate wafer with separation zone exhibits no or only slight bowing.
    • 公开了一种制造具有子载波晶片和生长层的准衬底晶片的方法,以及使用这种准衬底晶片制造的半导体本体。 在制造准衬底晶片的方法中,制造生长衬底晶片,其生长具有分离区并且包含生长层的所需材料。 生长衬底晶片具有抵消由形成分离区产生的应力的应力和/或分离区形成所产生的应力,通过构建生长衬底晶片的第一主面和 /或分离区,沿着第一主面向多个子区域。 具有分离区的生长衬底晶片没有显示或仅显示轻微的弯曲。