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    • 5. 发明授权
    • Solder ball collapse control apparatus and method thereof
    • 焊球塌陷控制装置及其方法
    • US06798667B2
    • 2004-09-28
    • US10064857
    • 2002-08-23
    • Vincent K. Chan
    • Vincent K. Chan
    • H05K710
    • B23K1/0016H01L23/49816H01L2924/0002H05K3/3436H05K3/3463H05K2201/094H05K2201/2036Y02P70/613H01L2924/00
    • A solder ball collapse control apparatus and method thereof includes a plurality of first solder members, pieces of solder material in a shape capable of being used to properly create a solder joint. The first solder members have a first solder dimension and a first melting temperature and are disposed on a carrier substrate, wherein the first solder members include any piece of material capable of being disposed using a solder dispensing machine. The apparatus and method further includes a plurality of second members having a second dimension and a second melting temperature, disposed on the carrier substrate in relation to the plurality of first solder members. The second members include any piece of material capable of being disposed using the solder dispensing machine, wherein the first solder member dimension is greater than the second member dimension and the second melting temperature is greater than the first melting temperature.
    • 焊球塌陷控制装置及其方法包括多个第一焊料构件,能够用于适当地形成焊点的形状的焊料材料片。 第一焊料构件具有第一焊料尺寸和第一熔融温度并且设置在载体基板上,其中第一焊料构件包括能够使用焊料分配机布置的任何材料片。 该装置和方法还包括多个具有第二尺寸和第二熔化温度的第二构件,其相对于多个第一焊料构件设置在载体衬底上。 第二构件包括能够使用焊料分配机布置的任何一种材料,其中第一焊料构件尺寸大于第二构件尺寸,并且第二熔化温度大于第一熔化温度。
    • 7. 发明授权
    • Method and apparatus for making semiconductor packages
    • 制造半导体封装的方法和装置
    • US07985621B2
    • 2011-07-26
    • US11469256
    • 2006-08-31
    • Vincent K. ChanNeil McLellanRoden Topacio
    • Vincent K. ChanNeil McLellanRoden Topacio
    • H01L21/00H01L23/34H01L23/48H01L23/52H01L23/40
    • H01L21/563H01L21/6835H01L23/16H01L23/562H01L2221/68345H01L2224/73203H01L2924/09701H01L2924/19041H01L2924/351
    • A method of packaging a plurality of semiconductor chips comprises: providing a substrate panel having a first coefficient of thermal expansion (CTE); providing a carrier having a second CTE that is less than the first CTE; heating the substrate panel and the carrier to first and second elevated temperatures respectively; mounting the substrate panel at about the first elevated temperature to the carrier, the carrier being at said second elevated temperature, to provide a connection between the carrier and the substrate panel; and cooling the carrier and the substrate panel from the first and second elevated temperatures thereby putting the substrate panel into tension in at least one direction. A stiffener panel may be affixed to the substrate panel and heated to an elevated temperature and while the substrate panel is heated to an elevated temperature. A plurality of dies may be mounted and electrically connected to the substrate panel. Under-filling of the plurality of dies may occur with the stiffener panel affixed to the substrate panel.
    • 包装多个半导体芯片的方法包括:提供具有第一热膨胀系数(CTE)的基板; 提供具有小于所述第一CTE的第二CTE的载体; 将基板和载体分别加热到第一和第二升高温度; 将所述衬底面板在所述第一升高温度下安装到所述载体,所述载体处于所述第二升高温度,以提供所述载体和所述衬底面板之间的连接; 以及从所述第一和第二升高的温度冷却所述载体和所述基板,从而使所述基板在至少一个方向上处于张力状态。 加强板可以固定到基板面板上并加热到升高的温度,同时将基板面板加热到升高的温度。 可以将多个管芯安装并电连接到衬底面板。 多个模具的欠填充可以在加强板固定到基板上的情况下发生。
    • 8. 发明申请
    • METHOD AND APPARATUS FOR MAKING SEMICONDUCTOR PACKAGES
    • 制造半导体封装的方法和装置
    • US20080057625A1
    • 2008-03-06
    • US11469256
    • 2006-08-31
    • Vincent K. ChanNeil McLellanRoden Topacio
    • Vincent K. ChanNeil McLellanRoden Topacio
    • H01L21/58
    • H01L21/563H01L21/6835H01L23/16H01L23/562H01L2221/68345H01L2224/73203H01L2924/09701H01L2924/19041H01L2924/351
    • A method of packaging a plurality of semiconductor chips comprises: providing a substrate panel having a first coefficient of thermal expansion (CTE); providing a carrier having a second CTE that is less than the first CTE; heating the substrate panel and the carrier to first and second elevated temperatures respectively; mounting the substrate panel at about the first elevated temperature to the carrier, the carrier being at said second elevated temperature, to provide a connection between the carrier and the substrate panel; and cooling the carrier and the substrate panel from the first and second elevated temperatures thereby putting the substrate panel into tension in at least one direction. A stiffener panel may be affixed to the substrate panel and heated to an elevated temperature and while the substrate panel is heated to an elevated temperature. A plurality of dies may be mounted and electrically connected to the substrate panel. Under-filling of the plurality of dies may occur with the stiffener panel affixed to the substrate panel.
    • 包装多个半导体芯片的方法包括:提供具有第一热膨胀系数(CTE)的基板; 提供具有小于所述第一CTE的第二CTE的载体; 将基板和载体分别加热到第一和第二升高温度; 将所述衬底面板在所述第一升高温度下安装到所述载体,所述载体处于所述第二升高温度,以提供所述载体和所述衬底面板之间的连接; 以及从所述第一和第二升高的温度冷却所述载体和所述基板,从而使所述基板在至少一个方向上处于张力状态。 加强板可以固定到基板面板上并加热到升高的温度,同时将基板面板加热到升高的温度。 可以将多个管芯安装并电连接到衬底面板。 多个模具的欠填充可以在加强板固定到基板上的情况下发生。