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1. 发明申请

US20160011259A1 INTEGRATED CIRCUIT DEVICE AND METHOD THEREFOR 有权
标题翻译：集成电路设备及其方法
公开(公告)号：US20160011259A1
公开(公告)日：2016-01-14
申请号：US14330544
申请日：2014-07-14
申请人： VLADIMIR LITOVCHENKO , HEIKO AHRENS , ANDREAS ROLAND STAHL
发明人： VLADIMIR LITOVCHENKO , HEIKO AHRENS , ANDREAS ROLAND STAHL
IPC分类号： G01R31/3177 , G01R31/317
CPC分类号： G01R31/3187 , G01R31/31721 , G01R31/31727
摘要： An integrated circuit device comprising at least one self-test component arranged to execute self-testing within at least one self-test structure during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the at least one self-test component at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication of at least one power dissipation parameter for at least a part of the IC device, and modulate the at least one clock signal provided to the at least one self-test component based at least partly on the received at least one power dissipation parameter for at least a part of the IC device.
摘要翻译：一种集成电路装置，包括至少一个自检部件，被布置成在IC器件的自检执行阶段期间在至少一个自检结构内执行自检，以及至少一个时钟控制部件，被布置成至少提供至少在IC器件的自检执行阶段期间至少一个自检部件的一个时钟信号。所述至少一个时钟控制部件还被布置成接收至少一个IC器件的至少一部分功率耗散参数的指示，并且调制提供给所述至少一个自检的至少一个时钟信号至少部分地基于所述IC器件的至少一部分的所接收的至少一个功耗参数。

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