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    • 10. 发明申请
    • SYSTEMS AND METHODS FOR X-RAY DIFFRACTION
    • X射线衍射的系统和方法
    • US20150253262A1
    • 2015-09-10
    • US14639460
    • 2015-03-05
    • UNITED TECHNOLOGIES CORPORATION
    • Iuliana CernatescuDavid U. Furrer
    • G01N23/20G01N23/207
    • G01N23/20008G01N23/20G01N23/20025G01N23/207H01J35/02H01J35/025H01J35/08H01J35/10H01J35/101H01J35/16H01J35/24H01J35/26H01J2235/081H01J2235/086
    • An x-ray diffraction system includes an x-ray source having a first interchangeable x-ray generating component, a second interchangeable x-ray generating component, an actuator and a controller operatively connected to the actuator. The first and second interchangeable x-ray generating components are interchangeable with one another. The actuator is operatively connected to the first and second interchangeable x-ray generating components. A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first x-ray generating component with a second x-ray generating component to form a modified x-ray source, and emitting a second x-ray beam from the modified x-ray source based on a second desired depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.
    • x射线衍射系统包括具有第一可互换x射线产生部件的X射线源,第二可互换x射线产生部件,致动器和可操作地连接到致动器的控制器。 第一和第二可互换的X射线产生部件彼此可互换。 致动器可操作地连接到第一和第二可互换的X射线产生部件。 用于非破坏性X射线衍射的方法包括基于第一期望深度从具有第一x射线产生部件的X射线源发射第一X射线束,以测量第一期望的样品的晶体学特征 将第一X射线产生部件与第二X射线产生部件交换以形成修改的X射线源,并且基于第二期望深度从修改的X射线源发射第二x射线束, 在第二个期望的深度上非破坏性地测量样品的结晶学特征。