会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 10. 发明申请
    • LIGHT-EMITTING DEVICE AND THE MANUFACTURING METHOD THEREOF
    • 发光装置及其制造方法
    • US20100308348A1
    • 2010-12-09
    • US12795169
    • 2010-06-07
    • Chung-Ying ChangWen-Jia HuangChao-Hsu LaiTien Kun Lin
    • Chung-Ying ChangWen-Jia HuangChao-Hsu LaiTien Kun Lin
    • H01L27/15
    • H01L27/156H01L33/62H01L2924/0002H01L2924/00
    • The disclosure provides a light-emitting device comprising a light-emitting epitaxy structure. The light-emitting epitaxy structure has a modulus of a critical reverse voltage not less than 50 volts while the light-emitting epitaxy structure is reverse-biased at a current density of −10 μA/mm2, and has a luminous efficiency not less than 50 lumen/Watt while the light-emitting epitaxy structure is forward-biased at a current density of 150 mA/mm2. Another aspect of the present disclosure provides a manufacturing method for a light-emitting device. The method comprises the steps of providing a substrate, growing a first epitaxial layer on the substrate with a first growth condition, growing a process-transition layer on the first epitaxial layer with a second growth condition, and growing a second epitaxial layer on the process-transition layer with a third growth condition, wherein a process change exists in the first growth condition and the third growth condition, and wherein the electrical conductivity of the process-transition layer is greater than that of the first epitaxial layer and/or the second epitaxial layer.
    • 本公开提供了包括发光外延结构的发光器件。 发光外延结构具有不小于50伏的临界反向电压的模数,而发光外延结构在-10μA/ mm 2的电流密度下被反向偏置,并且具有不小于50的发光效率 发光外延结构以150mA / mm 2的电流密度正向偏置。 本公开的另一方面提供了一种用于发光装置的制造方法。 该方法包括以下步骤:提供衬底,在第一生长条件下在衬底上生长第一外延层,在第二生长条件下在第一外延层上生长工艺过渡层,以及在工艺上生长第二外延层 - 过渡层,其中在第一生长条件和第三生长条件下存在过程变化,并且其中过程转变层的电导率大于第一外延层和/或第二生长条件的电导率 外延层。