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    • 7. 发明授权
    • Method and apparatus for using thin-film transistors and MIS capacitors as light-sensing elements in charge mapping arrays
    • 在电荷映射阵列中使用薄膜晶体管和MIS电容器作为光敏元件的方法和装置
    • US08300125B2
    • 2012-10-30
    • US12235534
    • 2008-09-22
    • Tse Nga NgSanjiv SambandanWilliam S. Wong
    • Tse Nga NgSanjiv SambandanWilliam S. Wong
    • H04N3/14
    • H01L27/14647H04N5/374
    • A method and apparatus for using TFT transistors or MIS capacitors as light-sensing elements in charge mapping arrays. A bias stress may be applied to a plurality of pixels in a charge map array. As a result, charge carriers may be trapped in each of the plurality of pixels responsive to the bias stress, which may be observed as a value shift such as a threshold voltage VT shift. Light may then be transmitted toward the plurality of pixels in the charge map array causing some of the pixels to absorb the light. The trapped charge carriers are released in the pixels that absorbed the light and not released in the pixels that did not absorb the light. The value shift in each of the pixels can be compared to determine which of the pixels absorbed the light.
    • 一种用于在电荷映射阵列中使用TFT晶体管或MIS电容器作为光感测元件的方法和装置。 可以对电荷映射阵列中的多个像素施加偏压应力。 结果,响应于偏压应力,电荷载流子可以被捕获在多个像素的每一个中,这可以被观察为诸如阈值电压VT偏移的值偏移。 然后,光可以被传送到电荷映射阵列中的多个像素,导致一些像素吸收光。 捕获的电荷载体在吸收光的像素中被释放,并且在不吸收光的像素中释放。 可以比较每个像素中的值偏移,以确定吸收光的哪个像素。