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1. 发明授权

US5210754A Pattern synchronizing circuit 失效
标题翻译：图案同步电路
公开(公告)号：US5210754A
公开(公告)日：1993-05-11
申请号：US710522
申请日：1991-06-04
申请人： Toshiro Takahashi , Takayuki Nakajima , Tetsuo Sotome , Noboru Akiyama
发明人： Toshiro Takahashi , Takayuki Nakajima , Tetsuo Sotome , Noboru Akiyama
IPC分类号： H04L1/00 , H04J3/06 , H04L7/00
CPC分类号： H04J3/0608
摘要： An Nth one of N parallel sequences of low-speed data demultiplexed by a demultiplexer from high-speed input data in synchronization with a high-speed clock is compared by N comparators with N parallel sequences of reference patterns. The N parallel sequences of reference patterns are each generated in synchronization with a frequency divided clock obtained by frequency dividing the high-speed clock into 1/N. When any of the comparators provides a disagreement output at least once, one clock pulse is eliminated by a post-clock eliminating circuit from the divided clock so that the N sequences of reference patterns are each delayed by one bit. When a counter detects that any one of the comparators does not provide the disagreement signal for n consecutive bits, the sequence of reference patterns corresponding to this comparator and the Nth sequence of low-speed data are in synchronization with each other. Clock pulses of the number corresponding to the line position of the synchronized sequence of reference patterns are eliminated by a pre-clock eliminating circuit from the high-speed clock which is applied to the demultiplexer. By this, line positions of the N parallel sequences of low-speed data are sequentially shifted so that the Nth sequence of low-speed data assumes the same line position as that of the synchronized reference pattern, and as a result, the N parallel sequences of low-speed data are synchronized with the N parallel sequences of reference patterns, respectively.

2. 发明授权

US5623497A Bit error rate measurement apparatus 失效
标题翻译：误码率测量装置
公开(公告)号：US5623497A
公开(公告)日：1997-04-22
申请号：US386660
申请日：1995-02-09
申请人： Kazuhiro Shimawaki , Tetsuo Sotome , Takayuki Nakajima
发明人： Kazuhiro Shimawaki , Tetsuo Sotome , Takayuki Nakajima
IPC分类号： G01R31/319 , G06F11/267 , H04L1/24 , G06F11/00
CPC分类号： G06F11/221 , H04L1/244
摘要： A bit error measurement apparatus is capable of easily specifying pattern conditions which cause bit errors in an incoming signal pattern without measuring all of a test pattern by measuring a bit error rate at a selected position or region of a test pattern. The bit error measurement apparatus includes a test pattern generator which generates the test pattern for verifying the incoming signal to be tested, a verifier which receives the incoming signal and the test pattern and generates a bit error detection signal when the incoming signal and the test pattern disagree, a pattern position detector which detects a measurement region of the test pattern when receiving a synchronizing signal from the test pattern generator and generates a count enable signal corresponding to the detected measurement region, and an error counter which counts the bit error detection signal from the verifier based on the count enable signal from the pattern position detector.
摘要翻译：误差测量装置能够容易地指定在输入信号模式中引起位错误的模式条件，而不通过测量测试图案的选定位置或区域的误码率来测量所有测试图案。比特误差测量装置包括产生用于验证待测试的输入信号的测试模式的测试模式发生器，接收输入信号和测试模式的验证器，并且当输入信号和测试模式不同意，图案位置检测器，当从测试图案发生器接收到同步信号时检测测试图案的测量区域，并产生对应于检测到的测量区域的计数使能信号;以及错误计数器，其对来自该验证器基于来自图案位置检测器的计数使能信号。

3. 发明授权

US5761216A Bit error measurement system 失效
标题翻译：位误差测量系统
公开(公告)号：US5761216A
公开(公告)日：1998-06-02
申请号：US732303
申请日：1997-02-10
申请人： Tetsuo Sotome , Takayuki Nakajima , Kazutaka Osawa , Kazuhiro Shimawaki , Kouichi Shiroyama
发明人： Tetsuo Sotome , Takayuki Nakajima , Kazutaka Osawa , Kazuhiro Shimawaki , Kouichi Shiroyama
IPC分类号： G01R31/3181 , G01R31/319 , G06F1/12 , G06F11/24 , G06F11/273 , G06F11/277 , H04L1/24 , G06F11/00
CPC分类号： G01R31/31813 , G01R31/31919 , H04L1/241 , H04L1/242 , G06F11/24
摘要： A bit error measurement system provides means for generating test patterns, multiplexing means and means for specifying and recording a pattern position. In a first aspect, a bit error measurement system has a pattern generator having M channels of pattern generation and a pattern generation controller 10 for controlling the pattern generation in the M channels so that when one channel is selected to generate a pattern the other channels are controlled to be waiting. In a second aspect, a clock frequency difference detector 150 is provided for counting a frequency of an input clock 111 and comparing the results with the frequency at the time of previous switching to detect whether the frequency change is greater than a predetermined value to judge whether the system is in a measurement state and to permit or prohibit a switching operation of a clock switch circuit. In a third aspect, a pattern position recording part 210 is provided to store pattern position information of a reference pattern generator 262 when an error detection signal 265.sub.a is received from a comparator 265.
摘要翻译： PCT No.PCT / JP96 / 00405 Sec。 371日期1997年2月10日 102（e）日期1997年2月10日PCT提交1996年2月22日PCT公布。公开号WO96 / 26451 日期1996年8月2日位误差测量系统提供用于产生测试图案，复用装置和用于指定和记录图案位置的装置的装置。在第一方面中，位误差测量系统具有模式生成器，其具有M个模式生成通道，以及模式生成控制器10，用于控制M个通道中的模式生成，使得当选择一个通道以产生模式时，其他通道控制在等待。在第二方面，提供时钟频率差检测器150，用于对输入时钟111的频率进行计数，并将结果与先前切换时的频率进行比较，以检测频率变化是否大于预定值，以判断是否系统处于测量状态并且允许或禁止时钟切换电路的切换操作。在第三方面，当从比较器265接收到错误检测信号265a时，提供图案位置记录部分210以存储参考图案生成器262的图案位置信息。

4. 发明授权

US4696004A Logic analyzer 失效
标题翻译：逻辑分析仪
公开(公告)号：US4696004A
公开(公告)日：1987-09-22
申请号：US737466
申请日：1985-05-24
申请人： Takayuki Nakajima , Tetsuo Aoki , Katsumi Kobayashi , Noboru Akiyama
发明人： Takayuki Nakajima , Tetsuo Aoki , Katsumi Kobayashi , Noboru Akiyama
IPC分类号： G01R31/3177 , G06F11/25 , G06F11/00
CPC分类号： G06F11/25 , G01R31/3177
摘要： Logic output data of a plurality of channels simultaneously obtained from a circuit under test are sequentially input in a memory, and after inputting a predetermined amount of such data, they are compared with corresponding expected values. The input data are divided into blocks, each including a plurality of data. Whether a mismatch is present in the comparison results for each block is indicated by a respective block element, and such block elements are displayed in a predetermined arrangement. It is also possible to provide a conventional list display including the input timing corresponding to the comparison results in which a mismatch is present.
摘要翻译：将从被测电路同时获得的多个通道的逻辑输出数据依次输入到存储器中，并且在输入预定量的这样的数据之后，将它们与相应的预期值进行比较。输入数据被分成块，每个块包括多个数据。每个块的比较结果中是否存在不匹配由相应的块元素指示，并且这些块元素以预定的布置显示。还可以提供包括与存在不匹配的比较结果相对应的输入定时的常规列表显示。

5. 发明授权

US4701918A Logic analyzer 失效
标题翻译：逻辑分析仪
公开(公告)号：US4701918A
公开(公告)日：1987-10-20
申请号：US737467
申请日：1985-05-24
申请人： Takayuki Nakajima , Tetsuo Aoki , Katsumi Kobayashi , Noboru Akiyama
发明人： Takayuki Nakajima , Tetsuo Aoki , Katsumi Kobayashi , Noboru Akiyama
IPC分类号： G01R31/3177 , G06F11/25 , G01R31/28 , G06F11/00
CPC分类号： G01R31/3177 , G06F11/25
摘要： A logic analyzer applies test pattern signals from a pattern generator to a circuit under test and sequentially reads logic outputs into a memory. The output from the circuit under test when it reaches a predetermined logic state is input as an external control signal into the logic analyzer. A change command is generated from the pattern generator in relation to the generation of the test pattern signal. When the change command and the external control signal are obtained at the same time, and flow of the generation of the test pattern signals is changed to a predetermined flow.
摘要翻译：逻辑分析仪将来自模式发生器的测试模式信号应用于被测电路，并将逻辑输出顺序读入存储器。当达到预定逻辑状态时，被测电路的输出作为外部控制信号输入到逻辑分析仪中。相对于测试图形信号的生成，从图案生成器生成变更命令。当同时获得改变命令和外部控制信号时，将测试图形信号的产生流程改变为预定流量。

6. 发明申请

US20150251261A1 SPIRAL TAP 审中-公开
标题翻译：螺旋TAP
公开(公告)号：US20150251261A1
公开(公告)日：2015-09-10
申请号：US14409876
申请日：2012-07-17
申请人： Takayuki Nakajima
发明人： Takayuki Nakajima
IPC分类号： B23G5/06
CPC分类号： B23G5/06 , B23G2200/48 , B23G2240/08 , B23P15/52 , Y10T408/9048
摘要： A spiral tap has a male thread disposed on an outer circumferential portion and a cutting edge formed along a spiral flute disposed spirally around an axial direction so as to divide the male thread, the spiral tap is disposed with a sub-groove formed into a concave shape along a back edge of the spiral flute to make a rake angle of the back edge positive at least in a portion corresponding to a biting portion of the spiral tap in the spiral flute, and a curvature radius of the sub-groove is smaller than a curvature radius of the spiral flute in a cross section perpendicular to the axial direction.
摘要翻译：螺旋丝锥具有设置在外圆周部分上的阳螺纹和沿着螺旋形的螺旋槽形成的切削刃，该螺旋槽沿轴向方向螺旋地设置以分割阳螺纹，螺旋丝锥设置有形成为凹形的子槽形状沿着螺旋槽的后边缘至少在与螺旋槽中的螺旋丝锥的咬入部分对应的部分中使后缘的前角为正，并且子槽的曲率半径小于螺旋槽的曲率半径在垂直于轴向的横截面中。

7. 发明授权

US08894932B2 Reagent preparing device and specimen processing system 有权
标题翻译：试剂制备装置和样品处理系统
公开(公告)号：US08894932B2
公开(公告)日：2014-11-25
申请号：US12732964
申请日：2010-03-26
申请人： Koichi Okubo , Noriyuki Nakanishi , Masahiko Oguro , Tomoyuki Asahara , Takayuki Nakajima
发明人： Koichi Okubo , Noriyuki Nakanishi , Masahiko Oguro , Tomoyuki Asahara , Takayuki Nakajima
IPC分类号： G01N35/10 , G01N1/38 , G01N27/06 , G01N35/00
CPC分类号： G01N27/06 , G01N35/00594 , G01N35/00693 , G01N2035/00673 , Y10T436/25625
摘要： A reagent preparing device capable of supplying a predetermined reagent, which includes a first liquid and a second liquid different from the first liquid, to a measurement section for measuring a specimen using the reagent, comprising: a reagent preparing section for preparing the predetermined reagent; a characteristic measurement device for measuring characteristic of the reagent prepared by the reagent preparing section; and a controller configured for performing operations comprising, controlling the supply of reagent prepared by the reagent preparing section to the measurement section according to the measurement result by the characteristic measurement device, and calibrating the characteristic measurement device based on a known characteristic value of a standard liquid having the known characteristic value and a measurement result obtained by measuring the characteristic of the standard liquid by the characteristic measurement device, is disclosed. A specimen processing system is also disclosed.
摘要翻译：一种试剂调制装置，其能够将包含第一液体和与第一液体不同的第二液体的规定试剂供给到使用试剂测定试样的测定部，其特征在于，包括：准备所述试剂的试剂调制部; 用于测量由所述试剂调制部制备的试剂的特性的特征测量装置; 以及控制器，其被配置为执行以下操作，所述控制器包括：根据所述特性测量装置的测量结果，控制向所述测量部分供应由所述试剂调制部件准备的试剂，并且基于标准的已知特征值校准所述特性测量装置公开了具有已知特征值的液体和通过特征测量装置测量标准液体的特性而获得的测量结果。还公开了一种样品处理系统。

8. 发明授权

US07815512B2 Thread forming tap and method for manufacturing the same 有权
标题翻译：螺纹成型丝锥及其制造方法
公开(公告)号：US07815512B2
公开(公告)日：2010-10-19
申请号：US11918243
申请日：2005-04-27
申请人： Takayuki Nakajima , Kentarou Norimatsu
发明人： Takayuki Nakajima , Kentarou Norimatsu
IPC分类号： B21J13/02 , B24B1/00
CPC分类号： B23G7/02
摘要： A following margin of a following flank of an external thread is shifted more in a screw-rotation direction than a leading margin of a leading flank. Thus, during biting, the following margin bites first, thereby suppressing a force that pushes back a tap and reducing a tapping torque. Because margin portions can be disposed parallel to an axis of a thread forming tap, working is easy and manufacture can be performed inexpensively. When, in forming an external thread by grinding by a grinding abrasive, an inclination angle of the axis of a tap blank and an abrasive axis of the grinding abrasive is equal to a lead angle of the external thread, the margins are formed symmetrically across a root. On the other hand, if the inclination angle is made greater than the lead angle, the following margin can be shifted in the screw-rotation direction, enabling manufacture to be performed as easily and inexpensively as in a conventional case.
摘要翻译：外螺纹的后端的跟随余量在螺旋旋转方向上比前导侧面的前缘更多地偏移。因此，在咬入时，以下边缘首先咬伤，从而抑制推回龙头的力并减小攻丝扭矩。因为边缘部分可以平行于螺纹成型丝锥的轴线布置，所以加工容易，并且可以廉价地进行制造。当通过研磨研磨剂研磨形成外螺纹时，丝锥坯料的轴线和研磨研磨剂的研磨轴线的倾斜角度等于外螺纹的导程角，边缘对称地形成根。另一方面，如果倾斜角度大于导向角，则能够使螺纹旋转方向上的下一个边缘移动，从而能够像以往那样容易且廉价地进行制造。

9. 外观设计

USD571270S1 Control panel for an automobile 有权
标题翻译：汽车控制面板
公开(公告)号：USD571270S1
公开(公告)日：2008-06-17
申请号：US29287697
申请日：2007-09-10
申请人： Takayuki Nakajima
设计人： Takayuki Nakajima

10. 外观设计

USD570756S1 Instrument panel for an automobile 有权
标题翻译：汽车仪表板
公开(公告)号：USD570756S1
公开(公告)日：2008-06-10
申请号：US29287696
申请日：2007-09-10
申请人： Takayuki Nakajima
设计人： Takayuki Nakajima

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