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1. 发明授权

US06810386B1 Company information disclosure system and memory medium 失效
标题翻译：公司信息披露制度和记忆媒体
公开(公告)号：US06810386B1
公开(公告)日：2004-10-26
申请号：US09144638
申请日：1998-08-31
申请人： Toshiki Yurino , Satoshi Koga , Takafumi Asakura , Shuji Yamamoto
发明人： Toshiki Yurino , Satoshi Koga , Takafumi Asakura , Shuji Yamamoto
IPC分类号： G11B1900
CPC分类号： G06Q30/06 , G06Q40/00 , G06Q40/06
摘要： A company information disclosure system quickly discloses information about companies listed in a securities exchange with fairness and in an adequate time to enhance the trading of the securities. A transmission server stores a registration program which registers company information while a disclosure time determining program produces a table required for disclosing processes at the time of registration of the company information. The disclosure time determining program uses the registration program by setting the company information disclosure time to be a time determined by adding a predetermined time to a closing time of trading in the securities exchange. A satellite distribution program distributes company information by way of satellite and a server distribution program distributes company information using a terrestrial line. A reception verification program receives a reception completion message from a reception server, which in turn has received information via the satellite, and provides notification of a message to verify the reception of information to an ordinary WWW server. The reception verification program thereby controls the start of disclosure of information via the WWW server.
摘要翻译：公司信息披露制度迅速公开披露证券交易所上市公司的信息，并在适当的时间内加强证券交易。传送服务器存储登记公司信息的注册程序，而公开时间确定程序在注册公司信息时产生公开处理所需的表格。披露时间确定程序通过将公司信息披露时间设置为通过将预定时间添加到证券交易所的交易的结束时间而确定的时间来使用注册程序。卫星分配方案通过卫星分配公司信息，服务器分发程序使用地面线分配公司信息。接收验证程序从接收服务器接收接收完成消息，接收服务器又经由卫星接收到信息，并且向普通WWW服务器提供消息的通知以验证信息的接收。因此，接收验证程序通过WWW服务器控制信息的公开开始。

2. 发明授权

US08314940B2 Probe microscope 有权
标题翻译：探头显微镜
公开(公告)号：US08314940B2
公开(公告)日：2012-11-20
申请号：US12831651
申请日：2010-07-07
申请人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
发明人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
IPC分类号： G01B11/24
CPC分类号： G01B9/02027 , G01B9/02007 , G01B2290/45 , G01Q20/02
摘要： A probe microscope includes a cantilever having a probe for contact with an object, first and second displacement detection optical systems, and an object lens. The first displacement detection optical system includes a first light source and a first displacement detecting section that detects displacement of the cantilever. The second displacement detection optical system includes a second light source and a second displacement detecting section that detects displacement of the object. The object lens is provided between the cantilever and the first light source and between the cantilever and the second light source. The object lens has a focal position for the light that is emitted from the first light source and has a first wavelength at the position of the cantilever and has a focal position for the light that is emitted from the second light source and has a second wavelength at the position of the object.
摘要翻译：探针显微镜包括具有用于与物体接触的探针的悬臂，第一和第二位移检测光学系统以及物镜。第一位移检测光学系统包括检测悬臂的位移的第一光源和第一位移检测部。第二位移检测光学系统包括第二光源和检测物体的位移的第二位移检测部。物镜设置在悬臂与第一光源之间以及悬臂与第二光源之间。物镜具有用于从第一光源发出的光的焦点位置，并且在悬臂的位置处具有第一波长，并且具有用于从第二光源发射的光的焦点位置，并具有第二波长在对象的位置。

3. 发明申请

US20090021747A1 Shape measuring apparatus 有权
标题翻译：形状测量仪
公开(公告)号：US20090021747A1
公开(公告)日：2009-01-22
申请号：US12219285
申请日：2008-07-18
申请人： Kazuhiko Kawasaki , Satoshi Koga , Yoshimasa Suzuki
发明人： Kazuhiko Kawasaki , Satoshi Koga , Yoshimasa Suzuki
IPC分类号： G12B21/08
CPC分类号： G01Q10/065 , G01Q20/02 , G01Q60/32
摘要： A shape measuring apparatus includes a probe for scanning across a surface to be measured, while vibrating up and down; a minute-vibration generation section for vibrating the probe up and down; a vertical movement control section for moving the probe up and down to keep a constant contact force or a constant distance between the surface to be measured and the probe; a scanning section for scanning the surface to be measured with the probe; a displacement sensor for measuring the vertical displacement of the probe and outputting a probe displacement signal; and a signal processing section for obtaining information about the contact force or the distance between the surface to be measured and the probe from a high-frequency component of the probe displacement signal, and for obtaining information about profile of the surface to be measured from a low-frequency component of the signal obtained when the surface to be measured is scanned such that the distance or the contact force is kept constant.
摘要翻译：一种形状测量装置，包括用于在被测量表面上扫描同时上下振动的探针; 微振动发生部，用于上下振动探头; 垂直运动控制部分，用于上下移动探头以保持测量表面与探头之间的恒定的接触力或恒定的距离; 扫描部，用于使用所述探针扫描待测量的表面; 用于测量探头的垂直位移并输出探针位移信号的位移传感器; 以及信号处理部分，用于从探头位移信号的高频分量获得关于接触力或待测量表面与探针之间的距离的信息，并且用于从探测位移信号的高频分量获得关于待测量表面的轮廓的信息扫描要测量的表面时获得的信号的低频分量，使得距离或接触力保持恒定。

4. 发明授权

US06678966B1 Reseat system of touch signal probe 有权
标题翻译：触摸信号探头重启系统
公开(公告)号：US06678966B1
公开(公告)日：2004-01-20
申请号：US09596107
申请日：2000-06-16
申请人： Satoshi Koga , Nobuhisa Nishioki
发明人： Satoshi Koga , Nobuhisa Nishioki
IPC分类号： G01B700
CPC分类号： G01B5/012 , G01B7/012 , G01B7/016
摘要： A reseat system of a touch signal probe includes a fixed component, a movable component, a pair of hard balls provided on the fixed component, a cylindrical body provided on the movable component for abutting the hard balls, and a piezoelectric element for relatively sliding the hard balls and the cylindrical body. Since an outer circumference of the cylindrical body has conic shape, both a contact point on the cylindrical body and a contact point on a hard ball change position thereof during relative slide movement.
摘要翻译：触摸信号探头的重新接收系统包括固定部件，可移动部件，设置在固定部件上的一对硬球，设置在用于抵接硬球的可动部件上的圆柱体，以及用于相对滑动的压电元件硬球和圆柱体。由于圆柱体的外周具有圆锥形状，所以圆柱体上的接触点和硬球上的接触点在相对滑动运动期间改变其位置。

5. 发明授权

US08348270B2 Image forming apparatus 有权
标题翻译：图像形成装置
公开(公告)号：US08348270B2
公开(公告)日：2013-01-08
申请号：US13162484
申请日：2011-06-16
申请人： Kazushi Nishikata , Yoji Misao , Satoshi Koga , Kazunari Nishimoto
发明人： Kazushi Nishikata , Yoji Misao , Satoshi Koga , Kazunari Nishimoto
IPC分类号： B65H7/02
CPC分类号： B65H7/14 , B65H2511/20 , B65H2553/416 , B65H2553/81 , B65H2701/132 , B65H2801/06 , B65H2220/03 , B65H2220/01
摘要： An image forming apparatus includes a main body, a sheet conveyance apparatus, and a control unit. The main body includes an image forming unit to form an image on a sheet. The sheet conveyance apparatus and the main body are detachable from each other and the sheet conveyance apparatus may convey the sheet to the image forming unit. The sheet conveyance apparatus includes a sheet conveyance path through which the sheet passes and a detection unit. The detection unit includes light emitting and receiving units that transmit light across the sheet conveyance path therebetween. The detection unit detects a reference and an edge position of the conveyed sheet in a width direction of the sheet orthogonal to a sheet conveyance direction. The control unit determines a position of the sheet based on detections of the reference and the edge position of the conveyed sheet by the detection unit.
摘要翻译：图像形成装置包括主体，片材输送装置和控制单元。主体包括在片材上形成图像的图像形成单元。纸张输送装置和主体彼此可拆卸，纸张输送装置可以将纸张传送到图像形成单元。片材输送装置包括片材通过的片材输送路径和检测单元。检测单元包括发光和接收单元，其透过其间的片材传送路径的光。检测单元检测所输送的纸张在与纸张输送方向正交的纸张的宽度方向上的基准和边缘位置。控制单元基于由检测单元检测所输送的纸张的基准和边缘位置来确定纸张的位置。

6. 发明授权

US07907288B2 Shape measuring apparatus 有权
标题翻译：形状测量仪
公开(公告)号：US07907288B2
公开(公告)日：2011-03-15
申请号：US12219285
申请日：2008-07-18
申请人： Kazuhiko Kawasaki , Satoshi Koga , Yoshimasa Suzuki
发明人： Kazuhiko Kawasaki , Satoshi Koga , Yoshimasa Suzuki
IPC分类号： G01B5/28 , G01B11/02
CPC分类号： G01Q10/065 , G01Q20/02 , G01Q60/32
摘要： A shape measuring apparatus includes a probe for scanning across a surface to be measured, while vibrating up and down; a minute-vibration generation section for vibrating the probe up and down; a vertical movement control section for moving the probe up and down to keep a constant contact force or a constant distance between the surface to be measured and the probe; a scanning section for scanning the surface to be measured with the probe; a displacement sensor for measuring the vertical displacement of the probe and outputting a probe displacement signal; and a signal processing section for obtaining information about the contact force or the distance between the surface to be measured and the probe from a high-frequency component of the probe displacement signal, and for obtaining information about profile of the surface to be measured from a low-frequency component of the signal obtained when the surface to be measured is scanned such that the distance or the contact force is kept constant.
摘要翻译：一种形状测量装置，包括用于在被测量表面上扫描同时上下振动的探针; 微振动发生部，用于上下振动探头; 垂直运动控制部分，用于上下移动探头以保持测量表面与探头之间的恒定的接触力或恒定的距离; 扫描部，用于使用所述探针扫描待测量的表面; 用于测量探头的垂直位移并输出探针位移信号的位移传感器; 以及信号处理部分，用于从探头位移信号的高频分量获得关于接触力或待测量表面与探针之间的距离的信息，并且用于从探测位移信号的高频分量获得关于待测量表面的轮廓的信息扫描要测量的表面时获得的信号的低频分量，使得距离或接触力保持恒定。

7. 发明申请

US20110007324A1 PROBE MICROSCOPE 有权
标题翻译：探针显微镜
公开(公告)号：US20110007324A1
公开(公告)日：2011-01-13
申请号：US12831651
申请日：2010-07-07
申请人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
发明人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
IPC分类号： G01B11/24
CPC分类号： G01B9/02027 , G01B9/02007 , G01B2290/45 , G01Q20/02
摘要： A probe microscope includes a cantilever having a probe for contact with an object, first and second displacement detection optical systems, and an object lens. The first displacement detection optical system includes a first light source and a first displacement detecting section that detects displacement of the cantilever. The second displacement detection optical system includes a second light source and a second displacement detecting section that detects displacement of the object. The object lens is provided between the cantilever and the first light source and between the cantilever and the second light source. The object lens has a focal position for the light that is emitted from the first light source and has a first wavelength at the position of the cantilever and has a focal position for the light that is emitted from the second light source and has a second wavelength at the position of the object.
摘要翻译：探针显微镜包括具有用于与物体接触的探针的悬臂，第一和第二位移检测光学系统以及物镜。第一位移检测光学系统包括检测悬臂的位移的第一光源和第一位移检测部。第二位移检测光学系统包括第二光源和检测物体的位移的第二位移检测部。物镜设置在悬臂与第一光源之间以及悬臂与第二光源之间。物镜具有用于从第一光源发出的光的焦点位置，并且在悬臂的位置处具有第一波长，并且具有用于从第二光源发射的光的焦点位置，并具有第二波长在对象的位置。

8. 发明申请

US20100199393A1 PROBE MICROSCOPE 失效
标题翻译：探针显微镜
公开(公告)号：US20100199393A1
公开(公告)日：2010-08-05
申请号：US12699321
申请日：2010-02-03
申请人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
发明人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
IPC分类号： G01Q20/02
CPC分类号： G01Q20/02
摘要： A probe microscope includes a cantilever having a probe, a displacement detecting optical system, an observation optical system, an objective lens, and a parallel glass. The displacement detecting optical system includes a first light source and a light detecting element. The observation optical system includes a second light source, an image forming lens, and a camera. The objective lens is disposed between the cantilever and the first and second light sources, and is commonly used by the displacement detecting optical system and the observation optical system. The parallel glass is capable of being inserted and retracted freely between the cantilever and the objective lens to adjust a focal point of the objective lens.
摘要翻译：探针显微镜包括具有探针的悬臂，位移检测光学系统，观察光学系统，物镜和平行玻璃。位移检测光学系统包括第一光源和光检测元件。观察光学系统包括第二光源，图像形成透镜和照相机。物镜设置在悬臂与第一和第二光源之间，并且通常由位移检测光学系统和观察光学系统使用。平行玻璃能够在悬臂和物镜之间自由地插入和缩回以调节物镜的焦点。

9. 发明授权

US08108942B2 Probe microscope 失效
标题翻译：探头显微镜
公开(公告)号：US08108942B2
公开(公告)日：2012-01-31
申请号：US12699321
申请日：2010-02-03
申请人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
发明人： Yoshimasa Suzuki , Kazuhiko Kawasaki , Satoshi Koga
IPC分类号： G01N12/16 , G01Q20/02 , G01B7/34
CPC分类号： G01Q20/02
摘要： A probe microscope includes a cantilever having a probe, a displacement detecting optical system, an observation optical system, an objective lens, and a parallel glass. The displacement detecting optical system includes a first light source and a light detecting element. The observation optical system includes a second light source, an image forming lens, and a camera. The objective lens is disposed between the cantilever and the first and second light sources, and is commonly used by the displacement detecting optical system and the observation optical system. The parallel glass is capable of being inserted and retracted freely between the cantilever and the objective lens to adjust a focal point of the objective lens.
摘要翻译：探针显微镜包括具有探针的悬臂，位移检测光学系统，观察光学系统，物镜和平行玻璃。位移检测光学系统包括第一光源和光检测元件。观察光学系统包括第二光源，图像形成透镜和照相机。物镜设置在悬臂与第一和第二光源之间，并且通常由位移检测光学系统和观察光学系统使用。平行玻璃能够在悬臂和物镜之间自由地插入和缩回以调节物镜的焦点。

10. 发明授权

US06178658B2 Micrometer 失效
标题翻译：千分尺
公开(公告)号：US06178658B2
公开(公告)日：2001-01-30
申请号：US09217840
申请日：1998-12-22
申请人： Satoshi Koga
发明人： Satoshi Koga
IPC分类号： G01B300
CPC分类号： G01B3/18 , G01B1/00
摘要： An inside of a U-shaped frame of a micrometer is made of a material having a smaller linear thermal expansion coefficient than an outside of the U-shaped configuration. Furthermore, a spindle can be made of a material having an extremely small linear thermal expansion coefficient. Accordingly, thermal deformation of the micrometer can be made smaller, and measurement accuracy is maintained even under a widely changing temperature.
摘要翻译：千分尺的U形框架的内部由具有比U形构造的外侧更小的线性热膨胀系数的材料制成。此外，主轴可以由具有极小线性热膨胀系数的材料制成。因此，可以使千分尺的热变形更小，即使在广泛变化的温度下也能够维持测量精度。

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