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    • 4. 发明授权
    • Coaxial type impedance matching device and impedance detecting method for plasma generation
    • 同轴型阻抗匹配装置及等离子体发生阻抗检测方法
    • US06819052B2
    • 2004-11-16
    • US10441899
    • 2003-05-20
    • Toshiaki KitamuraKoichi RokuyamaShigeru KasaiTakashi OginoYuki Osada
    • Toshiaki KitamuraKoichi RokuyamaShigeru KasaiTakashi OginoYuki Osada
    • H01J724
    • H01J37/32174H01J37/32082H01J37/32183H01P5/026H01P5/04
    • For plasma generation, an impedance matching device and a process of controlling and detecting the impedance matching device are provided to satisfy a preset matching condition. The impedance matching device includes a tubular external conductor and an internal conductor disposed therein, a matching device body including a plurality of dielectrics, a moving mechanism, a storing unit for storing a data table, a measuring device, and a calculation control unit. The impedance detecting process includes inputting a progressive wave and a reflected wave outputted by a directional coupler connected to an object to be matched, generating different signals, and mixing the signals to determine relative phase differences and amplitude ratios of the signals, and detecting an input impedance of the object to be matched on a basis of the detected amplitude ratios and that of a true phase difference between the progressive wave and the reflected wave that is detected by referring to a relationship prepared in advance.
    • 对于等离子体产生,提供阻抗匹配装置和控制和检测阻抗匹配装置的过程以满足预设的匹配条件。 阻抗匹配装置包括管状外部导体和布置在其中的内部导体,包括多个电介质的匹配装置主体,移动机构,用于存储数据表的存储单元,测量装置和计算控制单元。 阻抗检测处理包括:输入由连接到要匹配对象的定向耦合器输出的行波和反射波,产生不同的信号,以及混合信号以确定信号的相对相位差和振幅比,以及检测输入 基于检测到的振幅比来匹配的物体的阻抗以及通过参照预先准备的关系检测到的行进波和反射波之间的真相位差的阻抗。