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    • 5. 发明授权
    • Image signal processor and deficient pixel detection method
    • 图像信号处理器和缺陷像素检测方法
    • US07755680B2
    • 2010-07-13
    • US11426754
    • 2006-06-27
    • Tohru Watanabe
    • Tohru Watanabe
    • H04N9/64
    • G09G3/006G06T5/005G06T5/20G06T7/0002G09G2330/10H01L27/14806H04N5/21H04N5/367H04N5/3675
    • A deficiency candidate detection circuit detects a deficient pixel candidate by comparing the image signal of a target pixel with the image signals of peripheral pixels, and address information of the deficient pixel candidate is stored in a position memory circuit. A deficiency determining circuit repeats the determination of a deficient pixel a number of times based on the address information stored in the position memory circuit, and determines address information of a deficient pixel from the continuity of the determination results. A deficiency registering circuit registers the determined address information in the position memory circuit. A deficiency correction circuit corrects the image signal of the deficient pixel according to the registered address information of the deficient pixel.
    • 不足候选检测电路通过将目标像素的图像信号与周边像素的图像信号进行比较来检测缺陷像素候选,并且将不良像素候选的地址信息存储在位置存储电路中。 缺陷判定电路基于存储在位置存储电路中的地址信息重复不良像素的判定次数,根据判定结果的连续性来判定缺陷像素的地址信息。 缺陷登记电路将确定的地址信息登记在位置存储电路中。 缺陷校正电路根据缺陷像素的注册地址信息校正缺陷像素的图像信号。