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1. 发明授权

US08600309B2 Methods for dynamic calibration of over-the-air path loss in over-the-air radio-frequency test systems 有权
标题翻译：用于空中无线射频测试系统中空中路径损耗的动态校准方法
公开(公告)号：US08600309B2
公开(公告)日：2013-12-03
申请号：US12872711
申请日：2010-08-31
申请人： Thomas W. Chang , Justin Gregg
发明人： Thomas W. Chang , Justin Gregg
IPC分类号： H04B17/00
CPC分类号： H04B17/0085 , H04B17/21 , H04B17/24 , H04B17/309
摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with an over-the-air (OTA) antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference devices under test (DUTs) may be used to calibrate the OTA path loss of each test station at desired frequencies. Once calibrated, the test chambers may be used during production testing to test factory DUTs to determine whether a particular production DUT is a passing or failing DUT according to pass/fail criteria. A running average path loss value may be constantly updated based on path loss values measured using the reference DUTs and the passing production DUTs. Dynamically updating the path loss value using this statistical approach can properly track the behavior of each test station as operating conditions shift over time.
摘要翻译：提供了用于在测试系统中校准多个测试站的校准设备。每个测试站可以包括测试单元，具有空中（OTA）天线的测试室和将测试单元连接到测试室的射频（RF）电缆。被测参考设备（DUT）可用于校准每个测试站在所需频率下的OTA路径损耗。一旦校准，在生产测试期间可以使用测试室来测试工厂DUT，以根据通过/失败标准来确定特定生产DUT是否是通过或失败的DUT。可以基于使用参考DUT和经过的生产DUT测量的路径损耗值来不断更新运行平均路径损耗值。使用这种统计方法动态地更新路径损耗值可以随着时间的推移随着操作条件的变化而正确地跟踪每个测试站的行为。

2. 发明申请

US20120052815A1 METHODS FOR DYNAMIC CALIBRATION OF OVER-THE-AIR PATH LOSS IN OVER-THE-AIR RADIO-FREQUENCY TEST SYSTEMS 有权
标题翻译：超空中无线电频率测试系统中空中路径损失的动态校准方法
公开(公告)号：US20120052815A1
公开(公告)日：2012-03-01
申请号：US12872711
申请日：2010-08-31
申请人： Thomas W. Chang , Justin Gregg
发明人： Thomas W. Chang , Justin Gregg
IPC分类号： H04B17/00
CPC分类号： H04B17/0085 , H04B17/21 , H04B17/24 , H04B17/309
摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with an over-the-air (OTA) antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference devices under test (DUTs) may be used to calibrate the OTA path loss of each test station at desired frequencies. Once calibrated, the test chambers may be used during production testing to test factory DUTs to determine whether a particular production DUT is a passing or failing DUT according to pass/fail criteria. A running average path loss value may be constantly updated based on path loss values measured using the reference DUTs and the passing production DUTs. Dynamically updating the path loss value using this statistical approach can properly track the behavior of each test station as operating conditions shift over time.
摘要翻译：提供了用于在测试系统中校准多个测试站的校准设备。每个测试站可以包括测试单元，具有空中（OTA）天线的测试室和将测试单元连接到测试室的射频（RF）电缆。被测参考设备（DUT）可用于校准每个测试站在所需频率下的OTA路径损耗。一旦校准，在生产测试期间可以使用测试室来测试工厂DUT，以根据通过/失败标准来确定特定生产DUT是否是通过或失败的DUT。可以基于使用参考DUT和经过的生产DUT测量的路径损耗值来不断更新运行平均路径损耗值。使用这种统计方法动态地更新路径损耗值可以随着时间的推移随着操作条件的变化而正确地跟踪每个测试站的行为。

3. 发明授权

US08527229B2 Test systems with multiple antennas for characterizing over-the-air path loss 有权
标题翻译：具有多个天线的测试系统，用于表征空中路径损耗
公开(公告)号：US08527229B2
公开(公告)日：2013-09-03
申请号：US12872206
申请日：2010-08-31
申请人： Thomas W. Chang , Peter Bevelacqua
发明人： Thomas W. Chang , Peter Bevelacqua
IPC分类号： G01C19/00
CPC分类号： G01C19/00 , H04B7/0608 , H04B17/12 , H04B17/16 , H04B17/21 , H04B17/26
摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with multiple antennas, and radio-frequency (RF) cables that connect the test unit to the multiple antennas within the test chamber. Reference devices under test (DUTs) may be used to calibrate the OTA path loss of each test station while switching one of the multiple antennas into use one at a time at desired frequencies. A preferred antenna list indicating the preferred antenna that provides the optimal path loss for each desired frequency may be generated. Once calibrated, the test stations may be used during product testing to test factory DUTs to determine whether a particular production DUT satisfies pass/fail criteria. During product testing, a selected one of the multiple antennas is enabled based on the preferred antenna list to perform desired measurements.
摘要翻译：提供了用于在测试系统中校准多个测试站的校准设备。每个测试台可以包括测试单元，具有多个天线的测试室和将测试单元连接到测试室内的多个天线的射频（RF）电缆。被测试的参考设备（DUT）可用于校准每个测试站的OTA路径损耗，同时在期望的频率上一次切换多个天线之一。可以产生指示为每个期望频率提供最佳路径损耗的优选天线的优选天线列表。一旦校准，测试站可以在产品测试期间使用，以测试工厂DUT以确定特定的生产DUT是否满足通过/失败标准。在产品测试期间，基于优选的天线列表启用多个天线中的选定的一个以执行期望的测量。

4. 发明授权

US08706044B2 Methods of testing wireless devices in over-the-air radio-frequency test systems without path loss characterization 有权
标题翻译：无线射频测试系统中测试无线设备的方法，无路径损耗表征
公开(公告)号：US08706044B2
公开(公告)日：2014-04-22
申请号：US12872963
申请日：2010-08-31
申请人： Thomas W. Chang , Adil Syed , David A. Donovan
发明人： Thomas W. Chang , Adil Syed , David A. Donovan
IPC分类号： H04B17/00
CPC分类号： H04W24/06
摘要： A method for testing wireless devices under test (DUTs) in a wireless test station is provided. Each test station may include a test unit, a test chamber with an antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference DUTs may be used to calibrate each test station to compute a corrected linear equation based on a nominal path loss value. Over-the-air (OTA) path loss of each test station may not be directly measured. Once calibrated, the test chambers may be used during product testing to test factory DUTs to determine whether a particular factory DUT satisfies pass/fail criteria. During product testing, measured output power levels may be compared with expected output power levels computed using the corrected linear equation. The amount of error between the measured and expected output power levels will determine whether a production DUT satisfies the pass/fail criteria.
摘要翻译：提供了一种用于在无线测试台中测试被测设备（DUT）的方法。每个测试台可以包括测试单元，具有天线的测试室和将测试单元连接到测试室的射频（RF）电缆。参考DUT可用于校准每个测试站，以基于标称路径损耗值计算校正的线性方程。每个测试站的空中（OTA）路径损耗可能无法直接测量。一旦校准，在产品测试期间可以使用测试室来测试工厂DUT以确定特定工厂DUT是否满足通过/失败标准。在产品测试期间，测量的输出功率水平可以与使用校正的线性方程计算的预期输出功率水平进行比较。测量和预期输出功率水平之间的误差量将决定生产DUT是否满足通过/失败标准。

5. 发明申请

US20120052816A1 METHODS OF TESTING WIRELESS DEVICES IN OVER-THE-AIR RADIO-FREQUENCY TEST SYSTEMS WITHOUT PATH LOSS CHARACTERIZATION 有权
标题翻译：无空气无线电频率测试系统中测试无线设备的方法，无路径损耗特性
公开(公告)号：US20120052816A1
公开(公告)日：2012-03-01
申请号：US12872963
申请日：2010-08-31
申请人： Thomas W. Chang , Adil Syed , David A. Donovan
发明人： Thomas W. Chang , Adil Syed , David A. Donovan
IPC分类号： H04W24/00
CPC分类号： H04W24/06
摘要： A method for testing wireless devices under test (DUTs) in a wireless test station is provided. Each test station may include a test unit, a test chamber with an antenna, and a radio-frequency (RF) cable that connects the test unit to the test chamber. Reference DUTs may be used to calibrate each test station to compute a corrected linear equation based on a nominal path loss value. Over-the-air (OTA) path loss of each test station may not be directly measured. Once calibrated, the test chambers may be used during product testing to test factory DUTs to determine whether a particular factory DUT satisfies pass/fail criteria. During product testing, measured output power levels may be compared with expected output power levels computed using the corrected linear equation. The amount of error between the measured and expected output power levels will determine whether a production DUT satisfies the pass/fail criteria.
摘要翻译：提供了一种用于在无线测试台中测试被测设备（DUT）的方法。每个测试台可以包括测试单元，具有天线的测试室和将测试单元连接到测试室的射频（RF）电缆。参考DUT可用于校准每个测试站，以基于标称路径损耗值计算校正的线性方程。每个测试站的空中（OTA）路径损耗可能无法直接测量。一旦校准，在产品测试期间可以使用测试室来测试工厂DUT以确定特定工厂DUT是否满足通过/失败标准。在产品测试期间，测量的输出功率水平可以与使用校正的线性方程计算的预期输出功率水平进行比较。测量和预期输出功率水平之间的误差量将决定生产DUT是否满足通过/失败标准。

6. 发明申请

US20120053879A1 TEST SYSTEMS WITH MULTIPLE ANTENNAS FOR CHARACTERIZING OVER-THE-AIR PATH LOSS 有权
标题翻译：用于表征空中路径损失的多个天线的测试系统
公开(公告)号：US20120053879A1
公开(公告)日：2012-03-01
申请号：US12872206
申请日：2010-08-31
申请人： Thomas W. Chang , Peter Bevelacqua
发明人： Thomas W. Chang , Peter Bevelacqua
IPC分类号： G01D18/00 , H01Q1/50
CPC分类号： G01C19/00 , H04B7/0608 , H04B17/12 , H04B17/16 , H04B17/21 , H04B17/26
摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with multiple antennas, and radio-frequency (RF) cables that connect the test unit to the multiple antennas within the test chamber. Reference devices under test (DUTs) may be used to calibrate the OTA path loss of each test station while switching one of the multiple antennas into use one at a time at desired frequencies. A preferred antenna list indicating the preferred antenna that provides the optimal path loss for each desired frequency may be generated. Once calibrated, the test stations may be used during product testing to test factory DUTs to determine whether a particular production DUT satisfies pass/fail criteria. During product testing, a selected one of the multiple antennas is enabled based on the preferred antenna list to perform desired measurements.
摘要翻译：提供了用于在测试系统中校准多个测试站的校准设备。每个测试台可以包括测试单元，具有多个天线的测试室和将测试单元连接到测试室内的多个天线的射频（RF）电缆。被测试的参考设备（DUT）可用于校准每个测试站的OTA路径损耗，同时在期望的频率上一次切换多个天线之一。可以产生指示为每个期望频率提供最佳路径损耗的优选天线的优选天线列表。一旦校准，测试站可以在产品测试期间使用，以测试工厂DUT以确定特定的生产DUT是否满足通过/失败标准。在产品测试期间，基于优选的天线列表启用多个天线中的选定的一个以执行期望的测量。

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