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    • 5. 发明申请
    • METHOD AND SYSTEM FOR NON-DESTRUCTIVELY EVALUATING A HIDDEN WORKPIECE
    • 用于非破坏性评估隐藏工作的方法和系统
    • US20150055757A1
    • 2015-02-26
    • US14505043
    • 2014-10-02
    • The Boeing Company
    • Roger W. EngelbartTaisia Tsukruk Lou
    • G01N23/203G01B15/02
    • G01N23/203G01B15/02G01N17/043
    • A method and system are provided for non-destructively evaluating a workpiece hidden by an overlying structure. In the context of a method, a workpiece is interrogated with radiation, such as x-ray radiation, that also propagates through the overlying structure. The method further includes collecting data representative of radiation backscattered from the workpiece. Based upon a thickness and material of the overlying structure, the method compares the data that has been collected from the workpiece with reference data representative of radiation backscattered from a standard that includes different respective material loss indicators hidden by an overlying structure of the same thickness and material. Each material loss indicator is a physical representation of a different amount of material loss. As a result of the comparison, the method estimates the material loss of the workpiece.
    • 提供了一种用于非破坏性地评估由上覆结构隐藏的工件的方法和系统。 在一种方法的上下文中,工件被询问,其中辐射例如x射线辐射也传播通过上覆结构。 该方法还包括收集表示从工件反向散射的辐射的数据。 基于上覆结构的厚度和材料,该方法将从工件收集的数据与表示从包括由相同厚度的上覆结构隐藏的各种材料损失指标的标准的标准反射散射的参考数据进行比较,以及 材料。 每个物料损失指标是不同物质损失量的物理表示。 作为比较的结果,该方法估计工件的材料损失。
    • 7. 发明授权
    • Method and system for non-destructively evaluating a hidden workpiece
    • 非腐蚀性评估隐藏工件的方法和系统
    • US09506879B2
    • 2016-11-29
    • US14505043
    • 2014-10-02
    • The Boeing Company
    • Roger W. EngelbartTaisia Tsukruk Lou
    • G01N23/00G01N23/203G01B15/02G01N17/04
    • G01N23/203G01B15/02G01N17/043
    • A method and system are provided for non-destructively evaluating a workpiece hidden by an overlying structure. In the context of a method, a workpiece is interrogated with radiation, such as x-ray radiation, that also propagates through the overlying structure. The method further includes collecting data representative of radiation backscattered from the workpiece. Based upon a thickness and material of the overlying structure, the method compares the data that has been collected from the workpiece with reference data representative of radiation backscattered from a standard that includes different respective material loss indicators hidden by an overlying structure of the same thickness and material. Each material loss indicator is a physical representation of a different amount of material loss. As a result of the comparison, the method estimates the material loss of the workpiece.
    • 提供了一种用于非破坏性地评估由上覆结构隐藏的工件的方法和系统。 在一种方法的上下文中,工件被询问,其中辐射例如x射线辐射也传播通过上覆结构。 该方法还包括收集表示从工件反向散射的辐射的数据。 基于上覆结构的厚度和材料,该方法将从工件收集的数据与表示从包括由相同厚度的上覆结构隐藏的各种材料损失指标的标准的标准反射散射的参考数据进行比较,以及 材料。 每个物料损失指标是不同物质损失量的物理表示。 作为比较的结果,该方法估计工件的材料损失。