专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US5093797A Apparatus for inspecting packaged electronic device 失效
标题翻译：用于检查包装电子设备的装置
公开(公告)号：US5093797A
公开(公告)日：1992-03-03
申请号：US143084
申请日：1988-01-12
申请人： Teruhisa Yotsuya , Shigeki Kobayashi , Yasuaki Tanimura
发明人： Teruhisa Yotsuya , Shigeki Kobayashi , Yasuaki Tanimura
IPC分类号： G01R31/28 , G01R31/309
CPC分类号： G01R31/309 , G01R31/2806
摘要： A printed circuit board inspecting apparatus, in which image data of a packaged circuit board under inspection obtained by picking up the image of the circuit board are processed through predetermined processing procedure for examining packaged states of parts mounted on the packaged cicuit board. The apparatus comprises an imaging unit for picking up the image of a packaged circuit board, a decision unit for deciding the state of the parts mounted on the packaged circuit board, and a visualizing unit for displaying visibly the result of the decision and position of the relevant part in correspondence with each other. The apparatus can further include a land extracting unit for extracting lands from the image obtained through the imaging of the packaged circuit board under inspection, an alarm condition setting unit for setting the condition for generating an alarm, and an alarm generating unit for generating the alarm when the alarm condition is met by the result of decision made by the decision unit.

2. 发明授权

US5245671A Apparatus for inspecting printed circuit boards and the like, and method of operating same 失效
标题翻译：用于检查印刷电路板和类似物的装置及其操作方法
公开(公告)号：US5245671A
公开(公告)日：1993-09-14
申请号：US601722
申请日：1990-10-26
申请人： Shigeki Kobayashi , Yasuaki Tanimura , Teruhisa Yotsuya
发明人： Shigeki Kobayashi , Yasuaki Tanimura , Teruhisa Yotsuya
IPC分类号： G01N21/88 , G01N21/956 , G01R31/309
CPC分类号： G01N21/95684 , G01N21/8806 , G01R31/309
摘要： Disclosed is an inspection apparatus for a printed circuit board or the like for inspecting the shape of the soldered portion of a part mounted on the printed circuit board, and for judging whether the soldered portion is acceptable or not. In order to illuminate a printed circuit board undergoing inspection, there are provided three types of ring shaped light-emitting elements, which respectively generate red light, green light and blue light, arranged at positions to project this light, at angles of incidence that differ from one another, toward the surface of a body to be inspected. Light rays of the three primary colors emitted by these light-emitting elements have light-emission energy distributions with respect to wavelength that provide white light when these light rays are mixed, and the quantities of light emitted are adjusted in such a manner that white light is obtained. As a result, three-colored light images regarding the surface of the object under inspection can be detected, and it is possible to detect also peripheral information (part number, polarity, color code, various marks, etc.) essential in solder inspections.The present invention discloses also a method of teaching with regard to the mounted position of a part, the type thereof, and a feature quantity of the mounted state, a method of setting an inspection zone on a printed circuit board, and a method of displaying the results of inspection, etc. These methods are performed prior to inspection of the printed circuit board in the inspecting apparatus.
摘要翻译： PCT No.PCT / JP89 / 00470 Sec。 371 1990年10月26日第 102（e）日期1990年10月26日PCT提交1989年5月2日PCT公布。出版物WO89 / 11093 日期为1989年11月16日。公开的是用于检查安装在印刷电路板上的部件的焊接部分的形状并用于判断焊接部分是否可接受的印刷电路板等的检查装置。为了照亮正在进行检查的印刷电路板，提供了三种类型的环形发光元件，其分别产生红光，绿光和蓝光，布置在以不同方向入射的位置突出该光从另一方面看待被检查的身体的表面。由这些发光元件发射的三原色的光线相对于在混合这些光线时提供白光的波长具有发光能量分布，并且以这样的方式调节发光量：白光获得。结果，可以检测到关于检查对象的表面的三色光图像，并且还可以检测焊料检查中所必需的外围信息（部件号，极性，颜色代码，各种标记等）。本发明还公开了一种关于部件的安装位置，其类型和安装状态的特征量的教导方法，在印刷电路板上设置检查区域的方法以及显示方法检查结果等。这些方法在检查检查装置中的印刷电路板之前进行。

3. 发明授权

US4953100A Apparatus for inspecting packaged electronic device 失效
标题翻译：用于检查包装电子装置的装置
公开(公告)号：US4953100A
公开(公告)日：1990-08-28
申请号：US104149
申请日：1987-10-05
申请人： Teruhisa Yotsuya
发明人： Teruhisa Yotsuya
IPC分类号： G01N21/88 , G01N21/956 , G06T7/00
CPC分类号： G06T7/004 , G01N21/95684 , G06T7/0002 , G06T2207/30148
摘要： A component-mounted printed circuit board inspecting apparatus comprises an imaging device for picking up images of printed circuit board. Land images are extracted from the image of a bare printed circuit board and that of a component-mounted printed circuit board. On the basis of the shapes of the land extracted from the bare printed circuit board and those of the component-mounted printed circuit board, the positional relationship between a comonent mounted on the printed circuit board and the land thereon is determined. This positional relationship is utilized to decide if the component is mounted properly on the printed circuit board.
摘要翻译：组件安装的印刷电路板检查装置包括用于拾取印刷电路板的图像的成像装置。从裸印刷电路板的图像和部件安装的印刷电路板的图像中提取土地图像。基于从裸机印刷电路板提取的地面和组件安装印刷电路板的形状的形状，确定安装在印刷电路板上的共振器与其上的焊盘之间的位置关系。该位置关系用于确定组件是否正确安装在印刷电路板上。

4. 发明授权

US07869644B2 Methods of and apparatus for inspecting substrate 失效
标题翻译：检查基板的方法和装置
公开(公告)号：US07869644B2
公开(公告)日：2011-01-11
申请号：US11186151
申请日：2005-07-20
申请人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
IPC分类号： G06K9/00 , G06K9/48 , G06K9/36 , H04N7/18 , B23P19/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/001 , G06T7/254 , G06T2207/30141 , G06T2207/30152 , H05K13/0817 , H05K13/083 , Y10T29/53174
摘要： Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process and the soldering process and their differences are extracted. Each component on the substrate may be identified by differentiation and binarization processes and setting conditions for windows are determined corresponding to identified components. Windows are set according to determined setting conditions for inspecting the conditions of the substrate by using image data in the set windows and standard inspection data corresponding to component identification data.
摘要翻译：使用检查装置来检查基板，因为焊料被印刷，部件被安装并且基板被加热用于焊接工艺。在诸如部件安装工艺和焊接工艺的生产过程之前和之后都采集衬底的图像，并且提取它们的差异。可以通过微分和二值化处理识别衬底上的每个组件，并且对应于所识别的组件确定窗口的设置条件。 Windows根据设定条件设定，通过使用设定窗口中的图像数据和对应于部件识别数据的标准检查数据来检查基板的状况。

5. 发明授权

US07680320B2 Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data 失效
标题翻译：图像处理方法，基板检查方法，基板检查装置以及生成基板检查数据的方法
公开(公告)号：US07680320B2
公开(公告)日：2010-03-16
申请号：US11317415
申请日：2005-12-22
申请人： Kiyoshi Murakami , Masato Ishiba , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Teruhisa Yotsuya
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/30152
摘要： A color image as a combination of color data corresponding to a plural n-number of different hues is processed by extracting a target object from the image and carrying out a specified image processing. A reference image is obtained in the absence of the target object. Color data corresponding to specified less than n of the different hues are considered and difference in the degree of intensity of the considered color data relative to the combination of color data corresponding to n different hues between each pixel of the target image containing the target object and a corresponding pixel on the reference image are extracted. Pixels for which the extracted difference is greater than a specified threshold value and is in a specified direction are extracted. An image area formed by the extracted pixels are recognized as the target object.
摘要翻译：通过从图像中提取目标对象并执行指定的图像处理来处理与多个n个不同色调相对应的颜色数据的组合的彩色图像。在没有目标对象的情况下获得参考图像。考虑对应于不同色调的指定小于n的颜色数据，并且所考虑的颜色数据的强度的程度与对应于包含目标对象的目标图像的每个像素之间的n个不同色调的颜色数据的组合的差异，以及提取参考图像上的对应像素。提取提取的差异大于指定阈值并且在指定方向上的像素。由提取的像素形成的图像区域被识别为目标对象。

6. 发明申请

US20060018531A1 Methods of and apparatus for inspecting substrate 失效
标题翻译：检查基板的方法和装置
公开(公告)号：US20060018531A1
公开(公告)日：2006-01-26
申请号：US11186151
申请日：2005-07-20
申请人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Masato Ishiba , Jun Kuriyama , Teruhisa Yotsuya
IPC分类号： G06K9/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/001 , G06T7/254 , G06T2207/30141 , G06T2207/30152 , H05K13/0817 , H05K13/083 , Y10T29/53174
摘要： Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process and the soldering process and their differences are extracted. Each component on the substrate may be identified by differentiation and binarization processes and setting conditions for windows are determined corresponding to identified components. Windows are set according to determined setting conditions for inspecting the conditions of the substrate by using image data in the set windows and standard inspection data corresponding to component identification data.
摘要翻译：使用检查装置来检查基板，因为焊料被印刷，部件被安装并且基板被加热用于焊接工艺。在诸如部件安装工艺和焊接工艺的生产过程之前和之后都采集衬底的图像，并且提取它们的差异。可以通过微分和二值化处理识别衬底上的每个组件，并且对应于所识别的组件确定窗口的设置条件。 Windows根据设定条件设定，通过使用设定窗口中的图像数据和对应于部件识别数据的标准检查数据来检查基板的状况。

7. 发明申请

US20060002510A1 Inspection method and system for and method of producing component mounting substrate 失效
标题翻译：组件安装基板的检查方法和系统及其制造方法
公开(公告)号：US20060002510A1
公开(公告)日：2006-01-05
申请号：US11168015
申请日：2005-06-27
申请人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01B15/06 , G01N23/02
CPC分类号： G01N23/04
摘要： On a production line for component mounting substrate, mutually communicating inspection apparatus are each provided to a different one of production processes that are carried out sequentially such as the solder printing, component mounting and soldering processes. Each inspection apparatus can generate an X-ray transmission image of the substrate. Each inspection apparatus on the downstream side inputs an image from another inspection apparatus on the upstream side and generates a differential image of the inputted image and an X-ray transmission image of the same substrate generated by itself after the production process associated with itself is carried out. The differential image thus generated is used for inspecting the substrate such that the effect of the associated production process can be more accurately inspected.
摘要翻译：在用于部件安装基板的生产线上，相互连通的检查装置分别设置在与焊接印刷，部件安装和焊接工序相关的不同的制造工序中。每个检查装置可以产生基板的X射线透射图像。下游侧的检查装置在上游侧输入来自另一检查装置的图像，并生成输入图像的差分图像，并且在与其自身相关联的制作处理之后自身产生的相同基板的X射线透射图像被携带出来由此生成的差分图像用于检查基板，从而可以更精确地检查相关生产过程的效果。

8. 发明申请

US20060000989A1 Method of generating image and illumination device for inspecting substrate 失效
标题翻译：生成用于检查基板的图像和照明装置的方法
公开(公告)号：US20060000989A1
公开(公告)日：2006-01-05
申请号：US11157749
申请日：2005-06-20
申请人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Jun Kuriyama , Masato Ishiba , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01N21/86
CPC分类号： G01N21/95684 , G01N21/8806 , G01R31/309
摘要： For generating an image for inspection of a substrate, a camera is provided above this substrate with an optical axis orienting downward and a plurality of multi-colored light emitting members are set around the optical axis of the camera so as to be within a specified angular range with respect to a target area on the substrate. The camera is operated to generate an image of the target area for inspection while switched-on conditions of these light emitting members are being controlled such that the colors and angles of light illuminating this target area are varied according to a specified kind of the purpose of this inspection.
摘要翻译：为了生成用于检查基板的图像，在该基板的上方设置有朝向下方的光轴的相机，并且将多个多色发光部件设置在相机的光轴周围，使其处于规定的角度相对于基板上的目标区域的范围。操作摄像机以产生目标区域的图像以进行检查，同时控制这些发光构件的开启状态，使得照亮该目标区域的光的颜色和角度根据指定的目的类型而变化这次检查。

9. 发明授权

US07512260B2 Substrate inspection method and apparatus 失效
标题翻译：基板检查方法和装置
公开(公告)号：US07512260B2
公开(公告)日：2009-03-31
申请号：US11218920
申请日：2005-09-02
申请人： Kiyoshi Murakami , Yasunori Asano , Takashi Kinoshita , Teruhisa Yotsuya
发明人： Kiyoshi Murakami , Yasunori Asano , Takashi Kinoshita , Teruhisa Yotsuya
IPC分类号： G06K9/00 , G01R31/26
CPC分类号： G06T7/0008 , G06T7/001 , G06T7/74 , G06T2207/30141
摘要： Preparation steps are taken before a substrate with components is inspected and a whole image of a standard substrate is prepared preliminarily and inspection areas are determined for target portions to be inspected on this whole image. At the time of the inspection, a camera is positioned corresponding to a target portion to obtain a target image and an area corresponding to the target image is extracted from the whole image and displacement values of this area are calculated relative to the target image. The setting position of the inspection area is corrected by the calculated displacement values and an inspection area is set on the target image based on the corrected coordinates.
摘要翻译：在检查具有部件的基板之前进行准备步骤，并且准备准备标准基板的整体图像，并且在该整个图像上确定要检查的目标部分的检查区域。在检查时，对应于目标部分的相机定位以获得目标图像，并且从整个图像中提取与目标图像相对应的区域，并且相对于目标图像计算该区域的位移值。通过计算的位移值来校正检查区域的设置位置，并且基于校正的坐标将目标图像设置检查区域。

10. 发明授权

US07505149B2 Apparatus for surface inspection and method and apparatus for inspecting substrate 失效
标题翻译：表面检查装置及检查基板的方法和装置
公开(公告)号：US07505149B2
公开(公告)日：2009-03-17
申请号：US11056739
申请日：2005-02-11
申请人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
发明人： Masato Ishiba , Jun Kuriyama , Kiyoshi Murakami , Teruhisa Yotsuya
IPC分类号： G01N21/88
CPC分类号： G01R31/309 , G01N21/95684 , G06T7/0004 , G06T7/90 , G06T2207/10024 , G06T2207/30152
摘要： A target object has its surface condition inspected by having its image taken from above while being irradiated by red, green and blue light beams at different elevation angles. An inspection area is set on the image and a direction is extracted on the image in which a change appears in the color phase according to the arrangement of the light sources and this extracted direction is compared with a preliminarily registered standard direction to judge the surface condition from the result of this comparison.
摘要翻译：目标物体通过在不同仰角的红色，绿色和蓝色光束照射时，从上方拍摄其图像，检查其表面状态。在图像上设置检查区域，并且根据光源的布置在颜色相位中出现改变的图像上提取方向，并将该提取方向与预先登记的标准方向进行比较，以判断表面状况从这个比较的结果。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式