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1. 发明公开

US20240044968A1 METHOD AND APPARATUS FOR DETERMINING OUTPUT CHARGE OF WIDE BANDGAP DEVICES WITHOUT HARDWARE MODIFICATION 审中-公开
公开(公告)号：US20240044968A1
公开(公告)日：2024-02-08
申请号：US18361672
申请日：2023-07-28
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R. Hegde , Krishna N H Sri , Abhishek Naik , Shubha B , Yogesh M. Pai , Venkatraj Melinamane
IPC分类号： G01R31/26 , G01R31/28 , G01R1/067
CPC分类号： G01R31/2603 , G01R31/2889 , G01R1/06788
摘要： A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.

2. 发明申请

US20230133047A1 REVERSE RECOVERY MEASUREMENTS AND PLOTS 有权
公开(公告)号：US20230133047A1
公开(公告)日：2023-05-04
申请号：US17976644
申请日：2022-10-28
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R Hegde , Parjanya Adiga , Krishna N H Sri , Tsuyoshi Miyazaki , Yogesh M. Pai , Venkatraj Melinamane
IPC分类号： G01R31/28
摘要： A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive waveform data from the DUT after activation of the DUT by application of power from a power supply, and application of at least a first and second pulse from a source instrument, locate one or more reverse recovery regions in the waveform data, determine a reverse recovery time for the DUT from the reverse recovery region, and display a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display one or more of the reverse recovery regions, and including at least one characteristic for the one or more reverser recovery regions annotated on the reverse recovery plot. A method of providing reverse recovery measurements for a device under test (DUT) includes receiving waveform data through the probes from the DUT after activation of the DUT by application of power from a power supply, and application of a first and second pulse from a source instrument, locating one or more reverse recovery regions in the waveform data, determining a reverse recovery time for the DUT for the one or more reverse recovery regions, and displaying a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display the one or more reverse recovery regions, and including at least one characteristic of the one or more reverse recovery regions annotated on the reverse recovery plot.

3. 发明公开

US20240027513A1 AUTOMATED DE-SKEW SYSTEM AND METHOD FOR HIGH VOLTAGE SEMICONDUCTORS 审中-公开
公开(公告)号：US20240027513A1
公开(公告)日：2024-01-25
申请号：US18220222
申请日：2023-07-10
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R. Hedge , Shubha B , Krishna N H Sri , Yogesh M. Pai , Venkatraj Melinamane
IPC分类号： G01R31/26
CPC分类号： G01R31/2608
摘要： A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.

4. 发明申请

US20230133743A1 FLEXIBLE WIDE BANDGAP DOUBLE PULSE TESTING METHODOLOGY 有权
公开(公告)号：US20230133743A1
公开(公告)日：2023-05-04
申请号：US17976617
申请日：2022-10-28
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R Hegde , Parjanya Adiga , Krishna N H Sri , Tsuyoshi Miyazaki , Yogesh M. Pai , Venkatraj Melinamane
IPC分类号： G01R31/28
摘要： A test and measurement instrument has a user interface, one or more probes to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the user interface, at least one of the user inputs to identify at least one analysis to be performed on the DUT, receive waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and second pulse or multiple pulses from a source instrument, perform the at least one analysis on the waveform data, and display the waveform data and analysis on the user interface. A method of automatically performing a double pulse test and analysis on a device under test (DUT) includes receiving a user input through a user interface on a test and measurement instrument, the user input to identify at least one analysis to be performed on waveform data received from the DUT, receiving the waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and a second pulse or multiple pulses from a source instrument, performing the analysis on the waveform data, and displaying the waveform data and analysis on the user interface.

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