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热词
    • 7. 发明授权
    • Circuit test device
    • 电路测试装置
    • US5608329A
    • 1997-03-04
    • US393965
    • 1995-02-24
    • Makoto Imamura
    • Makoto Imamura
    • G01R31/26G01R31/28G01R31/30G01R31/319G01R31/00
    • G01R31/3004G01R31/31924
    • A circuit test device for carrying out a DC Test and a Function Test on a test object without using a relay, wherein a first differential circuit receives a signal from a test object; a current source supplies a current to the test object; a second differential circuit receives an output from the first differential circuit and supplies a current to the test object; a current measuring circuit measures the current flowing through the second differential circuit; and a control circuit controls the current source and the current in the second differential circuit while applying a voltage to the first differential circuit and provides a set voltage to the first differential circuit for the test object when carrying out the DC Test, and provides a set current in the second differential circuit when carrying out the Function Test.
    • 一种用于在不使用继电器的情况下在测试对象上执行DC测试和功能测试的电路测试装置,其中第一差分电路接收来自测试对象的信号; 电流源向测试对象提供电流; 第二差分电路接收来自第一差分电路的输出并向测试对象提供电流; 电流测量电路测量流过第二差分电路的电流; 并且控制电路在对第一差分电路施加电压的同时控制第二差分电路中的电流源和电流,并且在进行DC测试时向测试对象的第一差分电路提供设定电压,并提供一组 执行功能测试时第二个差分电路中的电流。