专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US5119452A High efficiency prism coupling device and method for producing the same 失效
标题翻译：高效棱镜联轴器及其制造方法
公开(公告)号：US5119452A
公开(公告)日：1992-06-02
申请号：US534718
申请日：1990-06-07
申请人： Kiyoshi Yokomori , Yoshinobu Nakayama , Shigeyoshi Misawa , Tami Isobe , Syunsuke Fujita , Hiroyoshi Funato , Magane Aoki
发明人： Kiyoshi Yokomori , Yoshinobu Nakayama , Shigeyoshi Misawa , Tami Isobe , Syunsuke Fujita , Hiroyoshi Funato , Magane Aoki
IPC分类号： G02B6/34 , G02B6/42
CPC分类号： G02B6/4212 , G02B6/34 , G02B6/4204
摘要： A high efficiency prism coupling device that comprises a substrate, an optical waveguide layer disposed on the substrate, a gap adjuster layer disposed on the waveguide layer and a prism secured to the gap adjuster layer through a dielectric adhesive agent. The gap adjuster layer has a refractive index which is lower than that of the waveguide layer. The gap adjuster layer has a recess formed therein for guiding an incident beam to the waveguide layer through a bottom portion thereof. The adhesive agent is disposed in and around the recess and has a refractive index which is higher than that of the waveguide layer. The prism is made from a dielectric material and disposed above the recess of the gap adjuster layer through the adhesive agent. The prism has a refractive index which is higher than that of the waveguide layer. The incident beam is introduced from outside through the prism, the adhesive agent and the bottom portion of the recess to the waveguide layer.
摘要翻译：一种高效率的棱镜耦合器件，包括衬底，设置在衬底上的光波导层，设置在波导层上的间隙调节器层和通过介电粘合剂固定到间隙调节器层的棱镜。间隙调整层的折射率低于波导层的折射率。间隙调整器层具有形成在其中的凹部，用于通过其底部将入射光束引导到波导层。粘合剂设置在凹部中和周围，并且具有比波导层的折射率高的折射率。棱镜由介电材料制成，并通过粘合剂设置在间隙调节器层的凹槽之上。棱镜的折射率高于波导层的折射率。入射光束从外部通过棱镜，粘合剂和凹部的底部引入波导层。

2. 发明授权

US5208800A Mode splitter and magneto-optical signal detection device 失效
标题翻译：模式分路器和磁光信号检测装置
公开(公告)号：US5208800A
公开(公告)日：1993-05-04
申请号：US683724
申请日：1991-04-11
申请人： Tami Isobe , Shigeyoshi Misawa , Kiyoshi Yokomori , Syunsuke Fujita , Magane Aoki , Yoshinobu Nakayama , Hiroyoshi Funato
发明人： Tami Isobe , Shigeyoshi Misawa , Kiyoshi Yokomori , Syunsuke Fujita , Magane Aoki , Yoshinobu Nakayama , Hiroyoshi Funato
IPC分类号： G02B6/126 , G02B6/42 , G11B7/12 , G11B11/10 , G11B11/105
CPC分类号： G02B6/126 , G11B11/10543 , G11B7/124
摘要： A magneto-optical signal detection device comprising a thin film type optical waveguide unit having a substrate on which a waveguide is formed. The unit has a coupling portion for coupling two polarization components simultaneously in a same plane of the waveguide as a TE mode and a TM mode. The modes TE and TM are included in reflection light reflected from a magneto-optical recording medium and perpendicular to each other. The unit also has a TE-TM mode separating portion having a taper boundary. A waveguide layer is gradually thinned in the taper boundary toward an outer end thereof.
摘要翻译：一种磁光信号检测装置，包括具有形成波导的基板的薄膜型光波导单元。该单元具有用于在波导的同一平面中同时耦合两个偏振分量的耦合部分，如TE模式和TM模式。模式TE和TM包括在从磁光记录介质反射并且彼此垂直的反射光中。该单元还具有具有锥形边界的TE-TM模式分离部。波导层在锥形边界中朝向其外端逐渐变薄。

3. 发明授权

US5235589A Apparatus for recording and reproducing optical information and prism coupler 失效
标题翻译：用于记录和再现光学信息和棱镜耦合器的装置
公开(公告)号：US5235589A
公开(公告)日：1993-08-10
申请号：US703294
申请日：1991-05-20
申请人： Kiyoshi Yokomori , Tami Isobe , Shigeyoshi Misawa , Syunsuke Fujita , Magane Aoki
发明人： Kiyoshi Yokomori , Tami Isobe , Shigeyoshi Misawa , Syunsuke Fujita , Magane Aoki
IPC分类号： G02B6/122 , G02B6/34 , G02B6/42 , G11B7/12 , G11B7/135
CPC分类号： G11B7/1359 , G02B6/34 , G11B7/124
摘要： An apparatus for recording and reproducing optical information includes an optical integration detecting element arranged on an optical path of light from a laser beam source to an optical information recording medium. The optical integration detecting element has an optical waveguide layer formed on a substrate; a photodetector connected to the optical waveguide layer; a first gap layer formed on the optical waveguide layer and having a refractive index lower than that of the optical waveguide layer; a second gap layer formed on the first gap layer and having an opening portion and a refractive index lower than that of the optical waveguide layer; an adhesive layer having a refractive index higher than that of the optical waveguide layer and adhered to the first gap layer such that the opening portion of the second gap layer is filled with the adhesive layer; and a prism adhesively fixed to an upper portion of the adhesive layer and constructed by a dielectric substance having a refractive index higher than that of the optical waveguide layer.
摘要翻译：一种用于记录和再现光学信息的设备包括：光学积分检测元件，其布置在从激光束源到光学信息记录介质的光的光路上。光学积分检测元件具有形成在基板上的光波导层; 连接到光波导层的光电检测器; 第一间隙层，形成在所述光波导层上，折射率低于所述光波导层的折射率; 第二间隙层，其形成在所述第一间隙层上，具有比所述光波导层低的开口部和折射率; 粘合剂层，其折射率高于光波导层的折射率，并粘附到第一间隙层，使得第二间隙层的开口部分填充有粘合剂层; 以及粘合地固定在粘合层的上部并由折射率高于光波导层的介电材料构成的棱镜。

4. 发明授权

US4932743A Optical waveguide device 失效
标题翻译：光波导器件
公开(公告)号：US4932743A
公开(公告)日：1990-06-12
申请号：US338316
申请日：1989-04-14
申请人： Tami Isobe , Kiyoshi Yokomori
发明人： Tami Isobe , Kiyoshi Yokomori
IPC分类号： G02B6/34
CPC分类号： G02B6/34
摘要： An optical waveguide device which comprises a substrate, an optical waveguide layer formed on the substrate, a gap adjusting layer formed on the optical waveguide layer, a metallic layer formed on the gap adjusting layer to partly cover the gap adjusting layer and having an opening therein, a dielectric adhesive layer disposed in contact with the gap adjusting layer through the opening of the metallic layer, and a dielectric prism disposed on the adhesive layer. The gap adjusting layer has an index of refraction which is lower than that of the optical waveguide layer. An incident light passes through the opeining of the metallic layer. The dielectric adhesive layer has an index of refraction which is higher than that of the optical waveguide layer. The dielectric prism has an index of refraction which is higher than that of the optical waveguide layer.
摘要翻译：一种光波导装置，其特征在于，具备：基板，形成在所述基板上的光波导层，形成在所述光波导层上的间隙调整层，形成在所述间隙调整层上的部分覆盖所述间隙调整层的金属层，通过金属层的开口设置成与间隙调整层接触的介电粘合剂层和设置在粘合剂层上的电介质棱镜。间隙调整层的折射率低于光波导层的折射率。入射光通过金属层的操作。电介质粘合剂层的折射率高于光波导层的折射率。介质棱镜的折射率高于光波导层的折射率。

5. 发明授权

US4877301A Covered optical waveguide having an inlet opening 失效
标题翻译：具有入口开口的覆盖光波导
公开(公告)号：US4877301A
公开(公告)日：1989-10-31
申请号：US255702
申请日：1988-10-11
申请人： Kiyoshi Yokomori , Tami Isobe
发明人： Kiyoshi Yokomori , Tami Isobe
IPC分类号： G02B6/13 , G02B6/34 , G11B7/12 , G11B7/135
CPC分类号： G11B7/1384 , G02B6/13 , G02B6/34 , G11B7/124 , G11B7/1359
摘要： An optical waveguide device includes an optical waveguide extending straight over a predetermined length, a metal cover layer formed on the optical waveguide at least partly and formed with an opening extending therethrough, and a prism fixedly attached to the metal cover film covering the opening. The prism has an index of refraction higher than that of the optical waveguide and the prism receives an incoming light beam and causes the light beam thus received to be coupled into the optical waveguide through the opening. The device may include a substrate on which the optical waveguide is formed with or without a buffer layer therebetween. A photodetector may also be formed integrally with the optical waveguide at one end thereof for detecting light coupled into and propagating along the optical waveguide. Such a device including a photodetector may be used as an optical component of an optical pick-up for use in an optical information recording and reproducing system.
摘要翻译：一种光波导装置包括直线延伸预定长度的光波导，至少部分地形成有光波导的金属覆盖层，并且形成有延伸穿过其的开口，以及固定在覆盖开口的金属覆盖膜上的棱镜。棱镜的折射率高于光波导的折射率，并且棱镜接收入射光束，并使得如此接收的光束通过开口耦合到光波导中。该器件可以包括其上形成有或不具有缓冲层的光波导的衬底。光电检测器也可以在其一端与光波导一体形成，用于检测耦合到光波导中并沿光波导传播的光。包括光电检测器的这种装置可以用作光学信息记录和再现系统中使用的光学拾取器的光学部件。

6. 发明授权

US5096298A Method for measuring refractive index of thin film layer 失效
$Method for measuring refractive index of thin film layer$
标题翻译：薄膜层折射率测量方法
公开(公告)号：US5096298A
公开(公告)日：1992-03-17
申请号：US453902
申请日：1989-12-20
申请人： Tami Isobe
发明人： Tami Isobe
IPC分类号： G01N21/21 , G01N21/41
CPC分类号： G01N21/41 , G01N2021/4126 , G01N21/21
摘要： A method for measuring refractive index of a thin film layer formed on the other layer having a known refractive index includes following steps. A step of irradiating P-polarized monochromatic light and S-polarized monochromatic light individually on the thin film layer with a prescribed angle of incidence, a step of determining reflectances R.sub.p and R.sub.s for the P-polarized monochromatic light and S-polarized monochromatic light, respectively, by detecting luminous intensity of reflected light from the thin film layer, and a step of specifying the refractive index of the thin film layer by prescribed calculation either using the amount of phase changes produced by reflection of said P-polarized light and S-polarized light on a boundary surface between the thin film layer and the medium, the phase changes being determined in accordance with the refractive index of the medium and the reflectances R.sub.p and R.sub.s, or using the amount of phase changes of lights during propagation from an upper surface of the thin film layer to a lower surface thereof the phase changes being determined in accordance with the refractive index of the medium and the reflectances R.sub.p and R.sub.s.

7. 发明授权

US5073026A Method for measuring refractive index of thin film layer 失效
$Method for measuring refractive index of thin film layer$
标题翻译：薄膜层折射率测量方法
公开(公告)号：US5073026A
公开(公告)日：1991-12-17
申请号：US256991
申请日：1988-10-13
申请人： Tami Isobe
发明人： Tami Isobe
IPC分类号： G01N21/21 , G01N21/41
CPC分类号： G01N21/41 , G01N2021/4126 , G01N21/21
摘要： A method for measuring refractive index of a thin film layer formed on the other layer having a known refractive index includes following steps. A step of irradiating P-polarized monochromatic light and S-polarized monochromatic light individually on the thin film layer with a prescribed angle of incidence, a step of determining reflections R.sub.p and R.sub.s for the P-polarized monochromatic light and S-polarized monochromatic light, respectively, by detecting luminous intensity of reflected light from the thin film layer, and a step of specifying the refractive index of the thin film layer by prescribed calculation either using the amount of phase changes produced by the reflection of said P-polarized light and S-polarized light on a boundary surface between the thin film layer and the medium, the phase changes being determined in accordance with the refractive index of the medium and the reflectances R.sub.p and Rs, or using the amount of phase changes of lights during propagation from an upper surface of the thin film layer to a lower surface thereof the phase changes being determined in accordance with the refractive index of the medium and the reflectances R.sub.p and R.sub.s.
摘要翻译：用于测量在具有已知折射率的另一层上形成的薄膜层的折射率的方法包括以下步骤。以规定的入射角度在薄膜层上分别照射P偏振单色光和S偏振单色光的步骤，确定P偏振单色光和S偏振单色光的反射Rp和Rs的步骤，分别通过检测来自薄膜层的反射光的发光强度和通过规定的计算来指定薄膜层的折射率的步骤，即使用由所述P偏振光的反射产生的相位量和S 在薄膜层和介质之间的边界表面上的偏振光，相变根据介质的折射率和反射率Rp和Rs确定，或者使用从传播过程中的光的相位变化量薄膜层的上表面到其下表面，相变根据介质的折射率确定和反射率Rp和Rs。

8. 发明申请

US20080068647A1 IMAGE PROCESSING SYSTEM, IMAGE MANAGING DEVICE, METHOD, STORAGE MEDIUM AND IMAGE PROCESSING DEVICE 有权
标题翻译：图像处理系统，图像管理装置，方法，存储介质和图像处理装置
公开(公告)号：US20080068647A1
公开(公告)日：2008-03-20
申请号：US11856934
申请日：2007-09-18
申请人： Tami Isobe , Takao Saka
发明人： Tami Isobe , Takao Saka
IPC分类号： G06F3/12
CPC分类号： H04N1/00413 , H04N1/00474 , H04N1/00501 , H04N1/00832 , H04N1/4413 , H04N1/4426 , H04N1/4433 , H04N2201/3202
摘要： An authentication server receives user information from an MFP, and acquires information on a service available for the user. The authentication server creates information on a menu screen having a selection function of selecting the service available for the user based on the acquired service information. The MFP receives the customized menu screen provided from the authentication server, and displays the menu screen on a display device.
摘要翻译：验证服务器从MFP接收用户信息，并且获取关于可用于该用户的服务的信息。认证服务器根据所获取的服务信息在具有选择可用于用户的服务的选择功能的菜单屏幕上创建信息。 MFP从认证服务器接收定制的菜单画面，并在显示装置上显示菜单画面。

9. 发明授权

US5034617A Method and apparatus for measuring refractive index and thickness of film 失效
$Method and apparatus for measuring refractive index and thickness of film$
标题翻译：用于测量薄膜的折射率和厚度的方法和装置
公开(公告)号：US5034617A
公开(公告)日：1991-07-23
申请号：US330087
申请日：1989-03-17
申请人： Tami Isobe
发明人： Tami Isobe
IPC分类号： G01B11/06 , G01N21/41 , G01N21/45 , G01N21/84
CPC分类号： G01N21/8422 , G01B11/0616 , G01B11/0675 , G01N2021/4126
摘要： A method for measuring a refractive index and a thickness of a dielectric thin film formed on a substrate. The method comprises the following four steps. A step for irradiating a thin film on a substrate with a monochromatic light of a wavelength .lambda., changing the incident angle thereof so as to measure a change of the energy reflection ratio or reflectance in response to changes of the incident angle and detect two incident angles .theta.1 and .theta.2 which correspond to two extreme values of the reflectance change. A step for irradiating the thin film with a monochromatic light of a wavelength .lambda.', changing an incident angle thereof so as to measure change of reflectance in response to the change of the incident angle and detect an incident angle .theta.3 which corresponds to an extreme value of the energy change. A step for calculating the refractive indices and thicknesses of the thin film, on the basis of the incident angle values .theta.1 and .theta.2, changing the interference degree number used as a parameter. And a step for determining the thickness of the thin film and the refractive indices thereof with respect to the light of a wavelength .lambda. and the light of a wavelength .lambda.', on the basis of the incident angle value .theta.3 and the data calculated as mentioned above. The method makes it possible to easily and accurately carry out the measurement.
摘要翻译： PCT No.PCT / JP88 / 00941 Sec。 371日期：1989年3月17日 102（e）日期1989年3月17日PCT提交1988年9月16日PCT公布。出版物WO89 / 02572 日期：1989年3月23日。一种测量形成在基板上的电介质薄膜的折射率和厚度的方法。该方法包括以下四个步骤。用波长为λ的单色光在基板上照射薄膜的步骤，改变其入射角，以便根据入射角的变化测量能量反射率或反射率的变化，并检测两个入射角 θ1和θ2，其对应于反射率变化的两个极值。用波长λ'的单色光照射薄膜的步骤，改变其入射角，以便响应于入射角的变化来测量反射率的变化，并检测对应于极端的入射角θ3 能量变化的价值。基于入射角值θ1和θ2计算薄膜的折射率和厚度的步骤，改变用作参数的干涉度数。以及基于入射角值θ3和如上所述计算的数据，确定相对于波长λ和波长λ'的光的薄膜的厚度及其折射率的步骤以上。该方法使得可以容易且准确地进行测量。

10. 发明授权

US5471440A Magnetooptic apparatus with integrated detecting element providing signal with high S/N ratio 失效
标题翻译：具有集成检测元件的磁光装置提供高S / N比的信号
公开(公告)号：US5471440A
公开(公告)日：1995-11-28
申请号：US127746
申请日：1993-09-27
申请人： Tami Isobe
发明人： Tami Isobe
IPC分类号： G02B6/126 , G11B7/12 , G11B7/135 , G11B11/10 , G11B11/105 , G11B11/00 , G11B7/00
CPC分类号： G11B7/124 , G11B11/10543
摘要： In an apparatus for recording and reading out magnetooptic information an incident light beam polarized in a predetermined direction is modulated by rotating a plane of polarization in accordance with a recording pattern of a magnetooptic information recording medium utilizing magnetooptic Kerr effects. The modulated light beam is detected by a detecting system integrated element to read the recording pattern. The magnetooptic information recording-reading out apparatus has a TE/TM mode separating element of a waveguide type for separating lights in TE and TM modes from each other and disposed in the detecting system integrated element; a waveguide photodetector for detecting light in the TE mode and disposed in the detecting system integrated element; a waveguide photodetector for detecting light in the TM mode and disposed in the detecting system integrated element; and a signal detector for setting outputs I.sub.TE and I.sub.TM of the waveguide photodetectors for detecting lights in the TE and TM modes to be approximately equal to each other.
摘要翻译：在用于记录和读出磁光信息的装置中，通过使用磁光克尔效应根据磁光信息记录介质的记录图案旋转偏振平面来调制沿预定方向偏振的入射光束。调制光束由检测系统集成元件检测以读取记录图案。磁光信息记录读出装置具有用于分离TE和TM模式的光的波导型TE / TM模式分离元件，并且设置在检测系统集成元件中; 波导光电检测器，用于检测TE模式中的光并设置在检测系统集成元件中; 波导光电检测器，用于检测TM模式的光，并设置在检测系统集成元件中; 以及信号检测器，用于设置用于检测TE模式和TM模式中的光的波导光电检测器的输出ITE和ITM彼此近似相等。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式