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1. 发明申请

US20070223804A1 CAM reference for inspection of contour images 审中-公开
标题翻译： CAM参考用于检查轮廓图像
公开(公告)号：US20070223804A1
公开(公告)日：2007-09-27
申请号：US11785838
申请日：2007-04-20
申请人： Tally Gilat-Bernshtein , Zeev Gutman
发明人： Tally Gilat-Bernshtein , Zeev Gutman
IPC分类号： G06K9/00
CPC分类号： G06T7/0006 , G01N21/95607 , G01N21/95684 , G01N2021/95615 , G01N2021/95638 , G01R31/311 , G06T2207/30148
摘要： This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analyzing the inspection output, the analyzing including comparing the inspection output with a computer file reference identifying more than two different types of regions. A method for inspecting an electrical circuit inspection is also disclosed.
摘要翻译：本发明公开了一种电路检查系统，包括光学子系统，用于光学检查电路并提供识别两个以上不同类型的区域的检查输出和用于分析检查输出的分析子系统，该分析包括将检查输出与计算机文件参考标识两个以上不同类型的区域。还公开了一种检查电路检查的方法。

2. 发明授权

US07218771B2 Cam reference for inspection of contour images 失效
标题翻译：凸轮参考用于检查轮廓图像
公开(公告)号：US07218771B2
公开(公告)日：2007-05-15
申请号：US10168713
申请日：2000-12-22
申请人： Tally Gilat-Bernshtein , Zeev Gutman
发明人： Tally Gilat-Bernshtein , Zeev Gutman
IPC分类号： G06K9/00
CPC分类号： G06T7/0006 , G01N21/95607 , G01N21/95684 , G01N2021/95615 , G01N2021/95638 , G01R31/311 , G06T2207/30148
摘要： This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analyzing the inspection output, the analyzing including comparing the inspection output with a computer file reference identifying more than two different types of regions. A method for inspecting an electrical circuit inspection is also disclosed.
摘要翻译：本发明公开了一种电路检查系统，包括光学子系统，用于光学检查电路并提供识别两个以上不同类型的区域的检查输出和用于分析检查输出的分析子系统，该分析包括将检查输出与计算机文件参考标识两个以上不同类型的区域。还公开了一种检查电路检查的方法。

3. 发明申请

US20070133862A1 Detection of surface defects employing subsampled images 审中-公开
标题翻译：使用二次采样图像检测表面缺陷
公开(公告)号：US20070133862A1
公开(公告)日：2007-06-14
申请号：US11701354
申请日：2007-02-01
申请人： Uri Gold , Eli Parente , Tally Gilat-Bernshtein , Edward Baranovsky , Tamir Margalit
发明人： Uri Gold , Eli Parente , Tally Gilat-Bernshtein , Edward Baranovsky , Tamir Margalit
IPC分类号： G06K9/00
CPC分类号： G06K9/0014 , G06T7/0004 , G06T7/12 , G06T7/155 , G06T2207/10016 , G06T2207/30141
摘要： A method for determining a location of a border in a color image, the image including at least two color populations, between a first color region associated with a first one of the two color populations and a second color region associated with a second one of the two color populations, both the first color region and the second color region being in the color image, the method includes identifying an approximate border location between the first color region and the second color region, determining a plurality of candidate border locations between the first color region and the second color region, each of the plurality of candidate border locations being determined by applying a corresponding border location method chosen from among a plurality of border location methods, choosing one method from among the plurality of border location methods as a preferred method, and determining a location of a border between the first color region and the second color region by designating one of the plurality of candidate border locations associated with the preferred method as the border. Also, an automated optical inspection device suitable for inspection of patterned articles.
摘要翻译：一种用于确定彩色图像中的边界的位置的方法，所述图像包括与所述两个颜色群体中的第一颜色群体相关联的第一颜色区域和与所述两个颜色群体中的第二颜色群体相关联的第二颜色区域之间的至少两个颜色群体两个颜色群体，第一颜色区域和第二颜色区域都在彩色图像中，该方法包括识别第一颜色区域和第二颜色区域之间的近似边界位置，确定第一颜色和第二颜色区域之间的多个候选边界位置区域和第二颜色区域，通过应用从多个边界位置方法中选择的对应边界位置方法来确定多个候选边界位置中的每一个，从多个边界位置方法中选择一个方法作为优选方法，以及通过指定其中之一来确定所述第一颜色区域和所述第二颜色区域之间的边界的位置与优选方法相关联的多个候选边界位置作为边界。另外，适合于图案化物品的检查的自动化光学检查装置。

4. 发明授权

US07388978B2 Apparatus and methods for the inspection of objects 失效
标题翻译：用于检查物体的装置和方法
公开(公告)号：US07388978B2
公开(公告)日：2008-06-17
申请号：US10706489
申请日：2003-11-12
申请人： Sharon Duvdevani , Tally Gilat-Bernshtein , Eyal Klingbell , Meir Mayo , Shmuel Rippa , Zeev Smilansky
发明人： Sharon Duvdevani , Tally Gilat-Bernshtein , Eyal Klingbell , Meir Mayo , Shmuel Rippa , Zeev Smilansky
IPC分类号： G06K9/00 , G06K9/48 , G06K9/68
CPC分类号： G06K9/6253 , G06K9/00973 , G06K9/481 , G06K9/6204 , G06T7/001 , G06T2207/30141
摘要： An electrical circuit inspection method including, for each of a plurality of types of local characteristics, each type occurring at least once within electrical circuitry to be inspected, identifying at least one portion of interest within the electrical circuitry whereat the local characteristic is expected to occur, and inspecting an image of each portion of interest, using an inspection task selected in response to the type of local characteristic expected to occur in the portion of interest.
摘要翻译：一种电路检查方法，对于多种类型的局部特性中的每一种，包括在待检查的电路内至少一次的每种类型，识别电气系统内的至少一部分感兴趣的部分，其中局部特征将被预期发生并且使用根据期望发生在感兴趣部分中的局部特征的类型来选择的检查任务来检查每个感兴趣部分的图像。

5. 发明授权

US07206443B1 Apparatus and methods for the inspection of objects 有权
标题翻译：用于检查物体的装置和方法
公开(公告)号：US07206443B1
公开(公告)日：2007-04-17
申请号：US09633756
申请日：2000-08-07
申请人： Sharon Duvdevani , Tally Gilat-Bernshtein , Eyal Klingbell , Meir Mayo , Shmuel Rippa , Zeev Smilansky
发明人： Sharon Duvdevani , Tally Gilat-Bernshtein , Eyal Klingbell , Meir Mayo , Shmuel Rippa , Zeev Smilansky
IPC分类号： G06K9/00
CPC分类号： G06K9/6253 , G06K9/00973 , G06K9/481 , G06K9/6204 , G06T7/001 , G06T2207/30141
摘要： A method for inspecting objects comprising: creating a reference image for a representative object, the reference image comprising an at least partially vectorized first representation of boundaries representing the representative object; acquiring an image of an object under inspection comprising a second representation of boundaries representing the object under inspection; and comparing a location of at least some boundaries in the second representation of boundaries to a location of corresponding boundaries in the at least partially vectorized first representation of boundaries, thereby to identify defects.
摘要翻译：一种用于检查对象的方法，包括：为代表对象创建参考图像，所述参考图像包括表示代表对象的边界的至少部分向量化的第一表示; 获取被检查对象的图像，包括表示被检查对象的边界的第二表示; 以及将边界的第二表示中的至少一些边界的位置与所述至少部分向量化的边界的第一表示中的相应边界的位置进行比较，从而识别缺陷。

6. 发明授权

US07200259B1 Optical inspection system 失效
标题翻译：光学检测系统
公开(公告)号：US07200259B1
公开(公告)日：2007-04-03
申请号：US10031045
申请日：2000-07-23
申请人： Uri Gold , Eli Parente , Tally Gilat-Bernshtein , Edward Baranovsky , Tamir Margalit
发明人： Uri Gold , Eli Parente , Tally Gilat-Bernshtein , Edward Baranovsky , Tamir Margalit
IPC分类号： G06K9/00
CPC分类号： G06K9/0014 , G06T7/0004 , G06T7/12 , G06T7/155 , G06T2207/10016 , G06T2207/30141
摘要： This invention discloses a method for determining a location of a border in a color image, the image comprising at least two color populations, between a first color region associated with a first one of the two color populations and a second color region associated with a second one of the two color populations, both the first color region and the second color region being comprised in the color image, the method includes identifying an approximate border location between the first color region and the second color region, determining a plurality of candidate border locations between the first color region and the second color region, each of the plurality of candidate border locations being determined by applying a corresponding border location method chosen from among a plurality of border location methods, choosing one method from among the plurality of border location methods as a preferred method, and determining a location of a border between the first color region and the second color region by designating one of the plurality of candidate border locations associated with the preferred method as the border. An automated optical inspection device suitable for inspection of patterned articles is also disclosed.
摘要翻译：本发明公开了一种用于确定彩色图像中的边界的位置的方法，该图像包括与两个颜色群体中的第一个相关联的第一颜色区域和与第二个颜色区域相关联的第二颜色区域之间的至少两个颜色群体两个颜色群体中的一个，第一颜色区域和第二颜色区域都包括在彩色图像中，该方法包括识别第一颜色区域和第二颜色区域之间的近似边界位置，确定多个候选边界位置在第一颜色区域和第二颜色区域之间，通过应用从多个边界位置方法中选择的对应边界位置方法来确定多个候选边界位置中的每一个，从多个边界位置方法中选择一个方法作为优选方法，以及确定第一颜色区域和第二颜色之间的边界的位置通过指定与优选方法相关联的多个候选边界位置中的一个作为边界来指定颜色区域。还公开了一种适用于图案化物品检查的自动光学检测装置。

7. 发明授权

US07181059B2 Apparatus and methods for the inspection of objects 失效
标题翻译：用于检查物体的装置和方法
公开(公告)号：US07181059B2
公开(公告)日：2007-02-20
申请号：US10706440
申请日：2003-11-12
申请人： Sharon Duvdevani , Tally Gilat-Bernshtein , Eyal Klingbell , Meir Mayo , Shmuel Rippa , Zeev Smilansky
发明人： Sharon Duvdevani , Tally Gilat-Bernshtein , Eyal Klingbell , Meir Mayo , Shmuel Rippa , Zeev Smilansky
IPC分类号： G06K9/00 , G06K9/62 , G06K9/36 , G06K9/48 , H04N7/18 , H04N9/47 , G06K9/40
CPC分类号： G06K9/6253 , G06K9/00973 , G06K9/481 , G06K9/6204 , G06T7/001 , G06T2207/30141
摘要： A method for inspecting electrical circuits, and a system for carrying out the method, generating a representation of boundaries of elements in an image of an electrical circuit which is under inspection, and analyzing at least some locations of at least some boundaries in the representation of boundaries of elements to identify defects in the electrical circuit.
摘要翻译：一种用于检查电路的方法，以及用于执行该方法的系统，产生正在检查的电路的图像中的元件的边界的表示，并分析至少一些边界的至少一些位置识别电路缺陷的元件边界。

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