会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Defect inspection apparatus and defect inspection method
    • 缺陷检查装置和缺陷检查方法
    • US07706597B2
    • 2010-04-27
    • US10773524
    • 2004-02-06
    • Takashi YoneyamaEriko Tsuji
    • Takashi YoneyamaEriko Tsuji
    • G06K9/00
    • G06T7/0004G01N21/9501G01N21/95607G02B21/245
    • A defect inspection apparatus which includes a pattern image obtaining unit obtaining a pattern image of a predetermined part by causing focusing control to be performed in order to achieve focus on the predetermined part within an observation object according to set focusing control parameters, a pattern image storing unit storing the pattern image, and a detecting unit detecting the presence/absence of an abnormal condition of a part to be inspected by making a comparison between the pattern image of a reference part within the observation object, and the pattern image of the part to be inspected within the observation object. The focusing control parameters, set when the pattern image of the part to be inspected is obtained, are determined based on sample information obtained when the pattern image of the reference part is obtained.
    • 一种缺陷检查装置,其包括图案图像获取单元,通过进行聚焦控制来获得预定部分的图案图像,以便根据设定的聚焦控制参数来对观察对象内的预定部分进行聚焦,存储图形图像 存储图案图像的单元,以及通过对观察对象内的参考部分的图案图像与部分的图案图像进行比较来检测待检查部分的异常状态的存在/不存在的检测单元, 在观察对象内进行检查。 基于得到被检查部件的图案图像而得到的聚焦控制参数,是根据得到的参考部分的图案图像获得的样本信息来确定的。
    • 2. 发明申请
    • Defect inspection apparatus and defect inspection method
    • 缺陷检查装置和缺陷检查方法
    • US20050175233A1
    • 2005-08-11
    • US10773524
    • 2004-02-06
    • Takashi YoneyamaEriko Tsuji
    • Takashi YoneyamaEriko Tsuji
    • G01B11/30G01N21/95G01N21/956G02B7/28G02B7/36G03B15/00G06K9/00G06T7/00
    • G06T7/0004G01N21/9501G01N21/95607G02B21/245
    • A defect inspection apparatus comprises a pattern image obtaining unit obtaining a pattern image of a predetermined part by causing focusing control to be performed in order to achieve focus on the predetermined part within an observation object according to set focusing control parameters, a pattern image storing unit storing the pattern image, and a detecting unit detecting the presence/absence of an abnormal condition of a part to be inspected by making a comparison between the pattern image of a reference part within the observation object, and the pattern image of the part to be inspected within the observation object. The focusing control parameters set when the pattern image of the part to be inspected is obtained are determined based on sample information obtained when the pattern image of the reference part is obtained.
    • 缺陷检查装置包括:图案图像获取单元,通过进行聚焦控制来获得预定部分的图案图像,以便根据设定的聚焦控制参数来对观察对象内的预定部分进行聚焦;图案图像存储单元 存储图案图像,以及检测单元,通过对观察对象内的基准部分的图案图像与待观察对象部分的图案图像进行比较,来检测待检查部位的异常状况的存在/不存在 在观察对象内检查。 当获取被检测部件的图案图像时设置的聚焦控制参数是基于获得参考部分的图案图像时获得的样本信息来确定的。
    • 3. 发明授权
    • Microscope apparatus and method for image acquisition of specimen slides having scattered specimens
    • 具有分散标本的标本片的图像采集显微镜装置和方法
    • US08890947B2
    • 2014-11-18
    • US13160201
    • 2011-06-14
    • Takashi YoneyamaChika Nakajima
    • Takashi YoneyamaChika Nakajima
    • H04N9/47H04N7/18G02B21/36G02B21/24
    • H04N7/183G02B21/241G02B21/367
    • Provided is a microscope apparatus including a macro-image, acquisition section that acquires a macro image of a glass slide having a specimen mounted thereon; an extraction section that extracts the specimen in the acquired macro image; a block setting section that sets, when the extracted specimen is scattered to form a plurality of lumps, a plurality of blocks that include the lumps of the specimen; an area dividing section that divides an area that includes the specimen in each of the blocks into a plurality of small regions; and a micro-image acquisition section that acquires, for each of the small regions, a micro image while performing an automatic focusing operation for the specimen in the small region, in which the micro-image acquisition section searches for an autofocusing in-focus position in each of the blocks set by the block setting section.
    • 本发明提供一种显微镜装置,其包括宏观图像,获取部件,其获取安装有样本的载玻片的宏观图像; 提取部,其提取所获取的宏图像中的样本; 块设置部分,当提取的样本被散射以形成多个块时,设置包括样本块的多个块; 区域分割部,其将包含在各块中的检体的区域分割为多个小区域; 以及微图像获取部,其对于每个所述小区域,在对所述微图像获取部搜索自动聚焦对焦位置的小区域中的样本进行自动聚焦操作时,获取微图像 在块设置部分设置的每个块中。
    • 5. 发明申请
    • PHOTOMICROSCOPY SYSTEM, IMAGE INPUT DEVICE, AND AUTOMATIC EXPOSURE METHOD
    • 光电子系统,图像输入装置和自动曝光方法
    • US20100214403A1
    • 2010-08-26
    • US12651678
    • 2010-01-04
    • Hitoshi UEDATakashi YoneyamaYasuko Ishii
    • Hitoshi UEDATakashi YoneyamaYasuko Ishii
    • H04N7/18
    • G02B21/365H04N5/2353H04N5/243
    • A photomicroscopy system includes a microscope unit which outputs an enlarged image of a subject as a light flux, an image capturing unit which forms an image of the light flux output by the microscope unit and converts the formed image into digital data, a sensitivity changing unit which changes a sensitivity of the image capturing unit, and a computing unit which obtains an exposure time by using the digital data captured by the image capturing unit in a state where the sensitivity is increased to the high sensitivity after instructing the sensitivity changing unit to increase the sensitivity of the image capturing unit to the high sensitivity while calculating the exposure time for obtaining a suitable brightness by the image capturing unit, and sets the sensitivity of the image capturing unit to a low sensitivity after the exposure time is set in the image capturing unit.
    • 光学显微镜系统包括:输出被摄体的放大图像作为光束的显微镜单元;形成由显微镜单元输出的光束的图像并将形成的图像转换为数字数据的图像拍摄单元;感光度改变单元 其改变图像拍摄单元的灵敏度,以及计算单元,其在指示灵敏度改变单元增加之后,在灵敏度增加到高灵敏度的状态下通过使用由图像捕获单元捕获的数字数据来获得曝光时间 在计算用于通过图像捕获单元获得合适亮度的曝光时间的同时将图像拍摄单元的灵敏度提高到高灵敏度,并且在图像捕获中设置曝光时间之后的图像拍摄单元的灵敏度为低灵敏度 单元。
    • 9. 发明授权
    • Magnetic recording medium
    • 磁记录介质
    • US4880693A
    • 1989-11-14
    • US170225
    • 1988-03-21
    • Katsumi RyokeMasatoshi TakahashiAkihiro HashimotoTsutomu OkitaTakashi Yoneyama
    • Katsumi RyokeMasatoshi TakahashiAkihiro HashimotoTsutomu OkitaTakashi Yoneyama
    • C09D5/23C09D127/04C09D127/06C09D175/00C09D175/04G11B5/73G11B5/735
    • G11B5/735Y10S428/90Y10T428/25
    • A magnetic recording medium comprising a support having provided on one surface thereof a magnetic recording layer and on the other surface thereof a backing layer containing non-magnetic particles dispersed in a binder, wherein said binder comprises a vinyl chloride/vinyl acetate copolymer resin containing at least one group represented by formula (I) or (II): ##STR1## wherein X represents a --COO-- group, a --CONH-- group, or a --C.sub.6 H.sub.4 -- group; n represents an integer of from 1 to 10; R.sub.1, R.sub.2, and R.sub.3 each represents a hydrogen atom, an alkyl group having from 1 to 10 carbon atoms, or an alkyl derivative having from 1 to 10 carbon atoms, or R.sub.1, R.sub.2, and R.sub.3 may be combined to each other to form a heterocycric ring; and Y.sup..crclbar. represents a halogen atom, ClO.sub.4.sup..crclbar., or HgI.sub.3.sup..crclbar. ; or Y.sup..crclbar. is bound to R.sub.2, R.sub.2 represents an alkylene group having from 1 to 10 carbon atoms, and Y.sup..crclbar. represents a --COO.sup..crclbar. group, an --SO.sub.3.sup..crclbar. group, or an --OSO.sub.3.sup..crclbar. group.
    • 一种磁记录介质,包括在其一个表面上设置有磁记录层的支撑体,在另一表面上具有包含分散在粘合剂中的非磁性颗粒的背衬层,其中所述粘合剂包含氯乙烯/乙酸乙烯酯共聚物树脂,其含有 (I)或(II)表示的至少一个基团:其中X表示-COO-基团,-CONH-基团或-C 6 H 4 - 基团; n表示1〜10的整数, R1,R2和R3各自表示氢原子,具有1至10个碳原子的烷基或具有1至10个碳原子的烷基衍生物,或者R1,R2和R3可以彼此结合形成 杂环; Y( - )表示卤素原子,ClO 4( - )或HgI 3( - ); 或Y( - )与R 2结合,R 2表示具有1〜10个碳原子的亚烷基,Y( - )表示-COO( - )基,-SO 3( - )基或-OSO 3( - )组。
    • 10. 发明授权
    • Microscope apparatus and microscope observation method
    • 显微镜仪器和显微镜观察法
    • US08730315B2
    • 2014-05-20
    • US12908307
    • 2010-10-20
    • Takashi Yoneyama
    • Takashi Yoneyama
    • H04N7/18H04N5/30
    • G02B21/367
    • The number of seams between magnified images in a created virtual slide is reduced to make the virtual slide clear and sharp. Provided is a microscope apparatus including an objective lens that collects light from a sample on a slide; a focus position detecting section that detects a focus position of the objective lens with respect to the sample; a focus state adjustment section that adjusts a focus state with respect to the sample based on a detection result from the focus position detecting section; and a magnified-image acquisition section that acquires a magnified image of each part of the sample, in which, if the focus position detected by the focus position detecting section is changed by more than a predetermined threshold with respect to a focus state in which an adjacent magnified image was obtained, the focus state adjustment section limits the adjustment in the focus state to the predetermined threshold or less.
    • 创建的虚拟幻灯片中放大图像之间的接缝数量减少,使虚拟幻灯片清晰锐利。 本发明提供一种显微镜装置,其包括从载玻片上的样品收集光的物镜; 焦点位置检测部分,其检测物镜相对于样本的聚焦位置; 焦点状态调整部,其基于来自所述焦点位置检测部的检测结果来调整相对于所述样本的聚焦状态; 以及放大图像获取部分,其获取样本的每个部分的放大图像,其中如果由聚焦位置检测部分检测到的对焦位置相对于聚焦状态改变了超过预定阈值,其中 获得相邻的放大图像,聚焦状态调整部将聚焦状态的调整限制为规定的阈值以下。