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1. 发明授权

US09122363B2 Touch panel 有权
标题翻译：触控面板
公开(公告)号：US09122363B2
公开(公告)日：2015-09-01
申请号：US13315383
申请日：2011-12-09
申请人： Kazuyuki Yoshifusa , Koichi Kondoh , Takashi Nakajima , Genichi Matsuda
发明人： Kazuyuki Yoshifusa , Koichi Kondoh , Takashi Nakajima , Genichi Matsuda
IPC分类号： G06F3/041 , G06F3/047 , G06F3/045
CPC分类号： G06F3/047 , G06F3/045 , G06F2203/04103
摘要： Disclosed is a touch panel including a first electrode substrate including a first conductive layer; and a second electrode substrate including a second conductive layer and being stacked with the first electrode substrate such that the first conductive layer and the second conductive layer face each other. The first conductive layer is composed of a first line of conductive areas and a second line of conductive areas adjacent to the first line where each of the first and the second lines includes an odd number greater than or equal to three of the conductive areas aligned in a second direction, and the conductive areas positioned in the middle of the first line and the second line are respectively connected with extracting areas extending toward different edges in the second direction.
摘要翻译：公开了一种触摸面板，包括：第一电极基板，包括第一导电层; 以及包括第二导电层并与第一电极基板堆叠的第二电极基板，使得第一导电层和第二导电层彼此面对。第一导电层由第一导电区域线和邻近第一线路的第二导电区域线构成，其中第一和第二线路中的每条线路包括大于或等于三个导电区域中的三个，第二方向，并且位于第一线和第二线的中间的导电区域分别与在第二方向上朝向不同边缘延伸的提取区域连接。

2. 发明申请

US20120278779A1 CHARACTERIZATION DEVICE AND COMPUTER PROGRAM THEREOF 有权
标题翻译：特征设备及其计算机程序
公开(公告)号：US20120278779A1
公开(公告)日：2012-11-01
申请号：US13451091
申请日：2012-04-19
申请人： Masahiko OMURA , Takashi Nakajima
发明人： Masahiko OMURA , Takashi Nakajima
IPC分类号： G06F17/50
CPC分类号： G06F17/5022 , G06F17/5031 , G06F2217/84
摘要： A characterization device capable of extracting the characteristic values of high-reliability hard macros at high speed. A characteristic value extraction unit calculates the delay time at measurement points within the hard macro and extracts the characteristic values by applying a slew to the signal waveform that is inputted to the hard macro and making a static path search. A dynamic verification unit verifies whether the characteristic values are adequate or not by carrying out a dynamic verification of the hard macro utilizing the characteristic values extracted by the characteristic value extraction unit. The characterization device can therefore shorten the time required to make a dynamic verification, and further is capable of extracting the characteristic values of high-reliability hard macros at high-speed.
摘要翻译：能够高速提取高可靠性硬宏的特征值的表征装置。特征值提取单元计算硬宏内的测量点的延迟时间，并通过向输入到硬宏的信号波形施加旋转并进行静态路径搜索来提取特征值。动态验证单元通过利用由特征值提取单元提取的特征值执行硬宏的动态验证来验证特征值是否足够。因此，表征装置可以缩短进行动态验证所需的时间，并且还能够高速地提取高可靠性硬宏的特征值。

3. 发明申请

US20110263550A1 THERAPEUTIC AGENT FOR CHRONIC OBSTRUCTIVE PULMONARY DISEASE 审中-公开
标题翻译：慢性阻塞性肺疾病治疗药物
公开(公告)号：US20110263550A1
公开(公告)日：2011-10-27
申请号：US13084503
申请日：2011-04-11
申请人： Toshinari Sugasawa , Takashi Nakajima , Hitoshi Fujita , Toshio Kanai
发明人： Toshinari Sugasawa , Takashi Nakajima , Hitoshi Fujita , Toshio Kanai
IPC分类号： A61K31/56 , A61P11/00 , A61K31/5377
CPC分类号： A61K31/56 , A61K9/10 , A61K31/5377 , C07D277/42
摘要： Disclosed is a method for the prevention and/or treatment of a chronic obstructive pulmonary disease by administrating a 5-membered cyclic compound represented by the formula below: or a pharmaceutically acceptable salt of the compound or a prodrug of the compound or salt: wherein X represents an oxygen or sulfur atom; R1 represents a hydrogen atom, a substituted or unsubstituted alkyl or the like; R2 represents a hydrogen atom, a substituted or unsubstituted alkyl or the like; Y1 represents single bond, a substituted or unsubstituted alkylene or the like; the wavy line means an (E) or (Z) coordination; R3 represents a hydrogen atom, a substituted or unsubstituted aryl or the like; Y2 represents a substituted or unsubstituted alkylene or an alkenylene; R4 represents a hydrogen atom, a substituted or unsubstituted alkanoyl or the like; and R5 represents a hydrogen atom or a substituted or unsubstituted alkyl.
摘要翻译：本发明公开了一种预防和/或治疗慢性阻塞性肺疾病的方法，该方法是通过给予由下式表示的5元环状化合物：或化合物的药学上可接受的盐或其化合物或盐的前体药物：其中X 表示氧或硫原子; R1表示氢原子，取代或未取代的烷基等; R 2表示氢原子，取代或未取代的烷基等; Y1表示单键，取代或未取代的亚烷基等; 波浪线表示（E）或（Z）配位; R3表示氢原子，取代或未取代的芳基等; Y2表示取代或未取代的亚烷基或亚烯基; R4表示氢原子，取代或未取代的烷酰基等; 并且R 5表示氢原子或取代或未取代的烷基。

4. 发明授权

US07432913B2 Touch panel, film therefor, and protection sheet therefor that can extend the life cycle of the touch panel 有权
标题翻译：触摸面板，胶片及其保护板可延长触控面板的使用寿命
公开(公告)号：US07432913B2
公开(公告)日：2008-10-07
申请号：US10870029
申请日：2004-06-18
申请人： Takashi Nakajima
发明人： Takashi Nakajima
IPC分类号： G06F3/041
CPC分类号： G06F3/045
摘要： A touch panel includes a membrane adapted to receive a pressing and/or rubbing operation from an external pen. A transparent conductive film is disposed with respect to the membrane. The membrane includes a structure that suppresses generation of friction heat due to the pressing and/or rubbing operation.
摘要翻译：触摸面板包括适于从外部笔接收按压和/或摩擦操作的膜。透明导电膜相对于膜设置。膜包括抑制由于按压和/或摩擦操作引起的摩擦热的产生的结构。

5. 发明申请

US20050212776A1 Touch panel, film therefor, and protection sheet therefor that can extend the life cycle of the touch panel 有权
标题翻译：触摸面板，胶片及其保护板可延长触控面板的使用寿命
公开(公告)号：US20050212776A1
公开(公告)日：2005-09-29
申请号：US10870029
申请日：2004-06-18
申请人： Takashi Nakajima
发明人： Takashi Nakajima
IPC分类号： G06F3/045 , G06F3/03 , G06F3/033 , G06F3/041 , G09G5/00 , H01H13/70 , H01H13/712
CPC分类号： G06F3/045
摘要： A touch panel includes a membrane adapted to receive a pressing and/or rubbing operation from an external pen. A transparent conductive film is disposed with respect to the membrane. The membrane includes a structure that suppresses generation of friction heat due to the pressing and/or rubbing operation.
摘要翻译：触摸面板包括适于从外部笔接收按压和/或摩擦操作的膜。透明导电膜相对于膜设置。膜包括抑制由于按压和/或摩擦操作引起的摩擦热的产生的结构。

6. 发明授权

US06897570B2 Semiconductor device and method of manufacturing same 失效
标题翻译：半导体装置及其制造方法
公开(公告)号：US06897570B2
公开(公告)日：2005-05-24
申请号：US10340307
申请日：2003-01-09
申请人： Takashi Nakajima , Naotaka Tanaka , Yasuyuki Nakajima , Ryo Haruta , Tomoo Matsuzawa , Masashi Sahara , Ken Okutani
发明人： Takashi Nakajima , Naotaka Tanaka , Yasuyuki Nakajima , Ryo Haruta , Tomoo Matsuzawa , Masashi Sahara , Ken Okutani
IPC分类号： H01L21/60 , H01L23/485 , H01L23/522 , H01L29/40
CPC分类号： H01L24/05 , H01L23/485 , H01L23/5226 , H01L24/03 , H01L24/45 , H01L24/48 , H01L2224/02166 , H01L2224/04042 , H01L2224/05082 , H01L2224/05093 , H01L2224/05096 , H01L2224/05166 , H01L2224/05187 , H01L2224/05556 , H01L2224/05557 , H01L2224/05558 , H01L2224/05624 , H01L2224/45015 , H01L2224/45124 , H01L2224/45144 , H01L2224/45147 , H01L2224/4807 , H01L2224/48453 , H01L2224/48463 , H01L2224/48624 , H01L2224/48724 , H01L2224/48799 , H01L2224/48824 , H01L2224/85205 , H01L2924/01006 , H01L2924/01014 , H01L2924/01022 , H01L2924/01027 , H01L2924/01029 , H01L2924/01044 , H01L2924/0105 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/014 , H01L2924/04941 , H01L2924/05042 , H01L2924/20106 , H01L2924/20303 , H01L2924/20752 , H01L2924/30105 , H01L2924/00014 , H01L2924/04953 , H01L2924/00 , H01L2924/00011
摘要： A highly reliable semiconductor device provided herein can prevent a junction between a pad and a wire from coming off, and pads from peeling off an underlying insulating layer on the interface thereof. The semiconductor device has plugs formed in a region in which an electrode pad is formed over a substrate. The plugs protrude into the electrode pad.
摘要翻译：这里提供的高度可靠的半导体器件可以防止焊盘和电线之间的接合脱落，并且焊盘从其界面上的下面的绝缘层剥离。半导体器件具有形成在电极焊盘形成在衬底上的区域中的插塞。插头突出到电极垫中。

7. 发明授权

US06845301B2 System for protecting and controlling substation main circuit components 有权
标题翻译：变电站主电路部件保护和控制系统
公开(公告)号：US06845301B2
公开(公告)日：2005-01-18
申请号：US10059089
申请日：2002-01-30
申请人： Koichi Hamamatsu , Tokuo Ito , Hachidai Ito , Yoshito Sameda , Toshiyuki Saida , Noriyoshi Suga , Hiromi Nagasaki , Yuuji Minami , Takashi Nakajima , Shiro Maruyama , Minoru Saito , Tatsuji Tanaka , Masao Takahashi , Setsuo Tamura , Masayuki Kosakada
发明人： Koichi Hamamatsu , Tokuo Ito , Hachidai Ito , Yoshito Sameda , Toshiyuki Saida , Noriyoshi Suga , Hiromi Nagasaki , Yuuji Minami , Takashi Nakajima , Shiro Maruyama , Minoru Saito , Tatsuji Tanaka , Masao Takahashi , Setsuo Tamura , Masayuki Kosakada
IPC分类号： H02H3/02 , H02H3/05 , H02H7/26 , H02J13/00 , H04L12/24 , H04L12/26 , G08B23/00
CPC分类号： H02H7/26 , H02H3/05 , H02H7/261 , H04L41/00
摘要： The present invention relates to a system for protecting and controlling main-circuit components of an electricity transmission substation. The system includes devices for digital data output, protection-and-controlling, component controlling-and-monitoring, and communication. The digital data output devices input analogue AC electric values and output digital data. The protection-and-controlling devices input the data from the digital data output devices, and further control, monitor, and protect the substation main-circuit components. The component controlling-and-monitoring devices receive commands from the protection-and-controlling devices or from the substation controlling-and-monitoring equipment, and further control and monitor the substation main-circuit components. The devices for digital data output, the protection-and-controlling, and component controlling-and-monitoring are disposed near or within their corresponding substation main-circuit components.
摘要翻译：本发明涉及一种用于保护和控制输电变电站主电路部件的系统。该系统包括用于数字数据输出，保护和控制，组件控制和监控以及通信的设备。数字数据输出设备输入模拟交流电值并输出数字数据。保护和控制设备从数字数据输出设备输入数据，并进一步控制，监控和保护变电站主电路组件。组件控制和监视设备从保护和控制设备或变电站控制和监控设备接收命令，并进一步控制和监控变电站主电路组件。用于数字数据输出的装置，保护和控制以及部件控制和监视装置设置在它们相应的变电站主电路部件附近或内部。

8. 发明授权

US06617691B2 Semiconductor device 失效
公开(公告)号：US06617691B2
公开(公告)日：2003-09-09
申请号：US10252534
申请日：2002-09-24
申请人： Takashi Nakajima , Tomio Iwasaki , Hiroyuki Ohta , Hideo Miura , Shinji Nishihara , Masashi Sahara , Kentaro Yamada , Masayuki Suzuki
发明人： Takashi Nakajima , Tomio Iwasaki , Hiroyuki Ohta , Hideo Miura , Shinji Nishihara , Masashi Sahara , Kentaro Yamada , Masayuki Suzuki
IPC分类号： H01L2348
CPC分类号： H01L23/485 , H01L23/53257 , H01L2924/0002 , H01L2924/00
摘要： The object of the invention is to provide such a highly reliable semiconductor device as no defect such as the breakage of a tungsten conductor occurs. This object is achieved by the following means, i.e., a molybdenum film, a tungsten film and another molybdenum film are deposited in this order on an interlayer dielectric film formed on a silicon substrate.

9. 发明授权

US06557150B1 Method of extracting timing characteristics of transistor circuits, storage medium storing timing characteristic library, LSI designing method, and gate extraction method 失效
标题翻译：提取晶体管电路的时序特性，存储介质存储定时特征库，LSI设计方法和门提取方法的方法
公开(公告)号：US06557150B1
公开(公告)日：2003-04-29
申请号：US09485169
申请日：2000-02-07
申请人： Tetsuroo Honmura , Takashi Nakajima , Kenzo Goto , Shoichi Watanabe
发明人： Tetsuroo Honmura , Takashi Nakajima , Kenzo Goto , Shoichi Watanabe
IPC分类号： G06K1750
CPC分类号： G06F17/5022
摘要： A method of extracting timing characteristics from transistor circuit data of modularity design products (a module) such as a CPU core in which the extracted timing characteristics are used for the timing verification of a circuit including a module to be extracted and timing constraints when logical synthesis or timing-driven layout is made. Particularly, since conditions fit for a timing rule of the module are included in timing characteristics when timing verification is executed by simulation, verification free of pseudo error is enabled. Also, the configuration of a timing characteristic library, a storage medium storing it and an LSI designing method using the storage medium are provided.
摘要翻译：提供诸如CPU核心的模块化设计产品（模块）的晶体管电路数据的定时特性的方法，其中提取的定时特性被用于包括要提取的模块的电路的定时验证和当逻辑合成时的定时约束或定时驱动布局。特别地，由于当通过模拟执行定时验证时，由于适合于模块的定时规则的条件被包括在定时特性中，因此能够进行没有伪错误的验证。此外，提供了定时特征库，存储介质的存储介质和使用存储介质的LSI设计方法的配置。

10. 发明授权

US06548904B2 Semiconductor device having a capacitor and a metal interconnect layer with tungsten as a main constituent material and containing molybdenum 失效
标题翻译：具有电容器和具有钨作为主要构成材料并含有钼的金属互连层的半导体器件
公开(公告)号：US06548904B2
公开(公告)日：2003-04-15
申请号：US10252685
申请日：2002-09-24
申请人： Tomio Iwasaki , Hideo Miura , Takashi Nakajima , Hiroyuki Ohta , Shinji Nishihara , Masashi Sahara
发明人： Tomio Iwasaki , Hideo Miura , Takashi Nakajima , Hiroyuki Ohta , Shinji Nishihara , Masashi Sahara
IPC分类号： H01L2348
CPC分类号： H01L23/53257 , H01L27/10814 , H01L27/10894 , H01L28/55 , H01L28/60 , H01L2924/0002 , H01L2924/00
摘要： In a semiconductor device, which comprises a capacitor component comprising a first electrode, an oxide film with a high dielectric constant or ferroelectricity in contact with the first electrode and a second electrode in contact with the oxide film, as formed in this order, on one principal side of a silicon substrate with a metal wiring layer formed thereon, such problems as breaking of tungsten interconnect, lowering of reliability, lowering of yield, etc. of semi-conductor devices can be solved by using molybdenum-containing tungsten as the material of metal interconnect layer.
摘要翻译：在包括第一电极的电容器组件，具有高介电常数或与第一电极接触的铁电性的氧化膜和与该氧化物膜接触的第二电极的电容器组件中，在其上形成有金属布线层的硅衬底的主面上，通过使用含钼钨作为材料，可以解决半导体器件的钨互连断裂，可靠性降低，成品率降低等问题金属互连层。

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