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1. 发明申请

US20060039003A1 Measuring apparatus and measuring chip 失效
公开(公告)号：US20060039003A1
公开(公告)日：2006-02-23
申请号：US11256151
申请日：2005-10-24
申请人： Takashi Kubo , Katsuaki Muraishi , Toshihito Kimura , Hitoshi Shimizu , Nobufumi Mori
发明人： Takashi Kubo , Katsuaki Muraishi , Toshihito Kimura , Hitoshi Shimizu , Nobufumi Mori
IPC分类号： G01N21/55
CPC分类号： G01N21/553
摘要： Disclosed herein is a measuring apparatus equipped with a plurality of measuring units. Each measuring unit includes a dielectric block, a thin film layer formed on the dielectric block, and a sample holding mechanism for holding a sample on the thin film layer. The measuring apparatus is further equipped with an optical system for making a light beam enter the dielectric block at an angle of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer, and photodetectors for measuring the intensity of the light beam totally reflected at the interface. The optical system is constructed so that light beams simultaneously enter the dielectric blocks of the measuring units. The number of photodetectors corresponds to the number of the light beams.

2. 发明授权

US07075654B2 Measuring apparatus and measuring chip 失效
公开(公告)号：US07075654B2
公开(公告)日：2006-07-11
申请号：US11256151
申请日：2005-10-24
申请人： Takashi Kubo , Katsuaki Muraishi , Toshihito Kimura , Hitoshi Shimizu , Nobufumi Mori
发明人： Takashi Kubo , Katsuaki Muraishi , Toshihito Kimura , Hitoshi Shimizu , Nobufumi Mori
IPC分类号： G01N21/55 , G01N21/01
CPC分类号： G01N21/553
摘要： Disclosed herein is a measuring apparatus equipped with a plurality of measuring units. Each measuring unit includes a dielectric block, a thin film layer formed on the dielectric block, and a sample holding mechanism for holding a sample on the thin film layer. The measuring apparatus is further equipped with an optical system for making a light beam enter the dielectric block at an angle of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer, and photodetectors for measuring the intensity of the light beam totally reflected at the interface. The optical system is constructed so that light beams simultaneously enter the dielectric blocks of the measuring units. The number of photodetectors corresponds to the number of the light beams.

3. 发明授权

US07030988B2 Measuring apparatus and measuring chip 失效
公开(公告)号：US07030988B2
公开(公告)日：2006-04-18
申请号：US10102203
申请日：2002-03-21
申请人： Takashi Kubo , Katsuaki Muraishi , Toshihito Kimura , Hitoshi Shimizu , Nobufumi Mori
发明人： Takashi Kubo , Katsuaki Muraishi , Toshihito Kimura , Hitoshi Shimizu , Nobufumi Mori
IPC分类号： G01N21/55
CPC分类号： G01N21/553
摘要： Disclosed herein is a measuring apparatus equipped with a plurality of measuring units. Each measuring unit includes a dielectric block, a thin film layer formed on the dielectric block, and a sample holding mechanism for holding a sample on the thin film layer. The measuring apparatus is further equipped with an optical system for making a light beam enter the dielectric block at an angle of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer, and photodetectors for measuring the intensity of the light beam totally reflected at the interface. The optical system is constructed so that light beams simultaneously enter the dielectric blocks of the measuring units. The number of photodetectors corresponds to the number of the light beams.

4. 发明授权

US06885454B2 Measuring apparatus 失效
标题翻译：测量装置
公开(公告)号：US06885454B2
公开(公告)日：2005-04-26
申请号：US10108258
申请日：2002-03-28
申请人： Masayuki Naya , Nobufumi Mori , Toshihito Kimura , Hitoshi Shimizu , Shu Sato
发明人： Masayuki Naya , Nobufumi Mori , Toshihito Kimura , Hitoshi Shimizu , Shu Sato
IPC分类号： G01N21/55 , G01N21/41 , G02B17/00 , G02B26/08 , H04J14/08
CPC分类号： G01N21/553
摘要： A measuring apparatus is disclosed which includes a measuring unit equipped with a dielectric block and a thin film layer; an incidence system for making a light beam enter the dielectric block so that a condition for total internal reflection is satisfied at an interface between the dielectric block and the thin film layer; and a photodetector for receiving the light beam totally reflected at the interface. The measuring unit is measured a plurality of times, and a change in the state of attenuated total reflection during the plurality of measurements is detected. The sensor further includes a tilt measurement section for measuring the longitudinal tilt of the interface which changes the incidence angles during the plurality of measurements, and a calculating section for obtaining a measured value in which errors due to the longitudinal tilt have been corrected.
摘要翻译：公开了一种测量装置，其包括配备有介质块和薄膜层的测量单元; 用于使光束进入介质块的入射系统使得在介电块和薄膜层之间的界面处满足全内反射条件; 以及用于接收在界面处全反射的光束的光电检测器。测量测量单元多次，并且检测在多个测量期间衰减的全反射状态的变化。传感器还包括用于测量在多个测量期间改变入射角的界面的纵向倾斜的倾斜测量部分，以及用于获得校正了由于纵向倾斜引起的误差的测量值的计算部分。

5. 发明授权

US5067702A Dispenser for dispensing sheets of an alternating first and second kind from a stack 失效
标题翻译：分配器，用于从堆叠中分配交替的第一种和第二种类型的片材
公开(公告)号：US5067702A
公开(公告)日：1991-11-26
申请号：US529219
申请日：1990-05-25
申请人： Katsuaki Muraishi , Masahiro Onishi , Nobufumi Mori , Hiromi Nunome , Tetsuo Oikawa
发明人： Katsuaki Muraishi , Masahiro Onishi , Nobufumi Mori , Hiromi Nunome , Tetsuo Oikawa
IPC分类号： B65H1/24 , B65H3/24 , G03B27/58 , G03B42/04 , G03G15/00
CPC分类号： G03B42/045 , B65H3/24 , G03B27/586 , B65H2301/42322
摘要： An apparatus for successively removing stacked sheets, such as stimulable phosphor sheets used in electron microscopy, from a housing. The stack consists of alternate layers of a first kind and a second kind of sheets. Each sheet of the first kind has a first notch in a first position. Each sheet of the second kind has a second notch in a second position. One edge of the lowermost sheet of the stack is supported on a projection which can be moved along the edge. Thus, the stack is inclined in the housing. The projection is movable from its home position, first and second stop positions aligned with the notches. When the projection is moved to a position registering with the notch on the lowermost sheet, that sheet only is dropped to a position from which it is ejected from the apparatus.
摘要翻译：用于从壳体连续地移除诸如用于电子显微镜的可刺激的磷光体片材的堆叠片材的装置。堆叠由第一类和第二类的替代层组成。第一类的每张纸都具有处于第一位置的第一缺口。第二种类型的片材具有位于第二位置的第二切口。堆叠的最下面的片的一个边缘被支撑在可以沿边缘移动的突起上。因此，堆叠在壳体中倾斜。突起可从其原始位置移动，与凹口对准的第一和第二停止位置。当突起移动到与最下面的片材上的凹口对准的位置时，该片材仅被落下到从该装置喷出的位置。

6. 发明授权

US4928016A Magazine for accommodating recording medium for electron microscope 失效
标题翻译：用于容纳电子显微镜记录介质的杂志
公开(公告)号：US4928016A
公开(公告)日：1990-05-22
申请号：US281414
申请日：1988-12-08
申请人： Nobufumi Mori , Katsuaki Muraishi , Terumi Matsuda , Masahiro Ohnishi , Hiromi Nunome , Tadao Koyama , Tetsuo Oikawa
发明人： Nobufumi Mori , Katsuaki Muraishi , Terumi Matsuda , Masahiro Ohnishi , Hiromi Nunome , Tadao Koyama , Tetsuo Oikawa
IPC分类号： G01Q30/02 , G03B27/58 , H01J37/22
CPC分类号： H01J37/224 , G03B27/585
摘要： A rack for housing recording media for an electron microscope includes a vertically movable rack for accommodating the recording media and composed of a plurality of shelves, and a unit for pushing out the recording media as well as a unit for entrance and exit of the recording media are provided at a predetermined height position. Two-dimensional sensors or cassettes for photographic films are accommodated within the rack. For photography, the rack is moved up and down to extract the desired two-dimensional sensors or cassettes for photographic films by the recording media pushing unit and the exit unit. After photography, the recording media are returned by the recording media entrance unit to the original position in the rack, so that a single magazine suffices for the receiving magazine and the feed magazine.
摘要翻译：用于容纳用于电子显微镜的记录介质的机架包括用于容纳记录介质并由多个搁架构成的可垂直移动的架，以及用于推出记录介质的单元以及用于记录介质的入口和出口的单元设置在预定高度位置。用于摄影胶片的二维传感器或盒式磁带容纳在机架内。对于摄影，机架上下移动以通过记录介质推动单元和出口单元提取用于摄影胶片的所需二维传感器或盒。拍摄后，记录介质由记录介质入口单元返回到机架中的原始位置，从而单个的杂志足以用于接收盒和进纸盒。

7. 发明授权

US06697158B2 Measuring apparatus utilizing attenuated total reflection 失效
标题翻译：利用衰减全反射的测量装置
公开(公告)号：US06697158B2
公开(公告)日：2004-02-24
申请号：US10113960
申请日：2002-04-02
申请人： Nobuhiko Ogura , Nobufumi Mori , Katsumi Hayashi , Toshihito Kimura
发明人： Nobuhiko Ogura , Nobufumi Mori , Katsumi Hayashi , Toshihito Kimura
IPC分类号： G01N2155
CPC分类号： G01N21/553
摘要： Disclosed herein is a measuring apparatus utilizing attenuated total reflection. The measuring apparatus is equipped with a dielectric block, a thin film layer formed on one surface of the dielectric block, an optical system for making a light beam enter the dielectric block so that a condition for total internal reflection is satisfied at an interface between the dielectric block and the thin film layer, and a two-piece photodiode for detecting the light beam totally reflected at the interface. When attenuated total reflection is detected a plurality of times for a single sample, the two-piece photodiode is disposed at a predetermined position relative to a dark line when a first measurement is made. The two-piece photodiode is also disposed at the same position as the predetermined position stored in a storage unit when a second measurement and measurements thereafter are made.
摘要翻译：本文公开了一种利用衰减全反射的测量装置。测量装置配备有介质块，形成在介质块的一个表面上的薄膜层，用于使光束进入介电块的光学系统，使得在内部反射的一个界面处满足完全内部反射的条件介质块和薄膜层，以及用于检测在界面处全反射的光束的两片光电二极管。当对单个样本检测多次衰减的全反射时，当进行第一测量时，两片光电二极管相对于暗线设置在预定位置。当进行第二测量和其后的测量时，两件式光电二极管也被设置在与存储单元中存储的预定位置相同的位置。

8. 发明授权

US06864984B2 Measuring method and apparatus using attenuation in total reflection 失效
标题翻译：在全反射中使用衰减的测量方法和装置
公开(公告)号：US06864984B2
公开(公告)日：2005-03-08
申请号：US09959645
申请日：2001-03-14
申请人： Masayuki Naya , Takashi Kubo , Nobuhiko Ogura , Nobufumi Mori
发明人： Masayuki Naya , Takashi Kubo , Nobuhiko Ogura , Nobufumi Mori
IPC分类号： G01N21/55 , G01N21/27
CPC分类号： G01N21/553
摘要： A plurality of measuring units each comprising a dielectric block, a metal film layer which is formed on a surface of the dielectric block and a sample holder are supported on a support. The support is moved by a support drive means to bring in sequence the measuring units to a measuring portion comprising an optical system which projects a light beam emitted from a light source, and a photodetector which detects attenuation in total internal reflection by detecting the intensity of the light beam which is reflected in total internal reflection at the interface between the dielectric block and the metal film layer. In this measuring apparatus, lots of samples can be measured in a short time.
摘要翻译：多个测量单元，每个测量单元包括介质块，形成在介质块的表面上的金属膜层和样品保持器支撑在支撑体上。支撑体通过支撑驱动装置移动，以将测量单元顺序地调节到包括投影从光源发射的光束的光学系统的测量部分，以及通过检测全部内部反射的强度来检测全内反射的衰减的光电检测器所述光束在介电块和金属膜层之间的界面处被反射在全内反射中。在该测量装置中，可以在短时间内测量许多样品。

9. 发明授权

US07495768B2 Analysis method and apparatus and analysis unit 有权
标题翻译：分析方法及装置与分析单位
公开(公告)号：US07495768B2
公开(公告)日：2009-02-24
申请号：US11077159
申请日：2005-03-11
申请人： Nobufumi Mori , Katsumi Hayashi
发明人： Nobufumi Mori , Katsumi Hayashi
IPC分类号： G01N21/55
CPC分类号： G01N21/7703 , G01N21/553
摘要： An analysis chip comprises a thin film layer, which is formed on a dielectric material block and has two different regions. A flow path unit comprising a supply path for supplying a sample onto the thin film layer and a discharging path for discharging the sample is releasably loaded into the analysis chip. A light beam is irradiated to a first interface between one region of the thin film layer and the dielectric material block, and a second interface between the other region of the thin film layer and the dielectric material block, in a parallel manner. Refractive index information with regard to a substance to be analyzed, which is located on the thin film layer, is acquired from intensities of the light beam totally reflected from the first interface and the light beam totally reflected from the second interface.
摘要翻译：分析芯片包括形成在电介质材料块上并具有两个不同区域的薄膜层。包括用于将样品供应到薄膜层上的供应路径和用于排出样品的排出路径的流路单元可释放地装载到分析芯片中。平行地将光束照射到薄膜层的一个区域和电介质材料块之间的第一界面，以及薄膜层的另一个区域和电介质材料块之间的第二界面。从位于薄膜层上的待分析物质的折射率信息是从第一界面全反射的光束和从第二界面全反射的光束的强度获得的。

10. 发明申请

US20070015272A1 Toxicity testing apparatus for cell stack cultures 审中-公开
标题翻译：细胞堆培养的毒性试验装置
公开(公告)号：US20070015272A1
公开(公告)日：2007-01-18
申请号：US11485274
申请日：2006-07-13
申请人： Nobuhiko Ogura , Yasuhiro Shimada , Satoru Toda , Nobufumi Mori
发明人： Nobuhiko Ogura , Yasuhiro Shimada , Satoru Toda , Nobufumi Mori
IPC分类号： C12M3/00
CPC分类号： C12M41/46 , C12M23/12 , C12M33/04 , G01N2035/0427
摘要： A toxicity testing apparatus for testing toxicity of a sample with respect to a cell stack culture comprises an incubator for incubating at least one cell stack culture, a culture medium exchanger for exchanging a culture medium for the cell stack culture, a sample dispenser for adding the sample to the cell stack culture, and a detector for detecting an effect of the sample with respect to the cell stack culture.
摘要翻译：用于测试样品相对于细胞堆叠培养物的毒性的毒性测试装置包括用于孵育至少一个细胞堆叠培养物的培养箱，用于更换用于细胞堆叠培养的培养基的培养基交换器，用于添加样品到细胞堆培养物，以及检测器，用于检测样品相对于细胞堆培养物的影响。

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