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1. 发明授权

US06310702B1 Testing device for multistage multi-branch optical network 失效
标题翻译：多级多分支光网络测试装置
公开(公告)号：US06310702B1
公开(公告)日：2001-10-30
申请号：US09099502
申请日：1998-06-18
申请人： Takao Minami , Nobuaki Takeuchi , Naoyuki Nozaki , Koichi Shinozaki , Takamu Genji
发明人： Takao Minami , Nobuaki Takeuchi , Naoyuki Nozaki , Koichi Shinozaki , Takamu Genji
IPC分类号： H04B1008
CPC分类号： H04B10/272 , H04B10/071
摘要： A testing device performs testing on a multistage multi-branch optical network, which contains optical lines (such as optical fibers) that are connected together at connection points (e.g., optical couplers) in a multistage multi-branch manner. An OTDR measurement device uses software to perform fault determination with respect to the multistage multi-branch optical network. Herein, optical pulses are input to an input end of the multistage multi-branch optical network, wherein they are reflected at certain portions of the optical lines and the connection points while propagating through the optical lines. Then, reflected beams are returned to the input end and are mixed together as response light, which is measured by the OTDR measurement device. The response light is converted to a plurality of digital waveform data representing a measured waveform, which is then divided into multiple ranges on the basis of the Fresnel reflection points and connection points. Separative analysis is performed on the digital waveform data belonging to each of the ranges of the measured waveform. The separative analysis is repeated at measuring times, which are determined in advance. So, the fault determination is made by comparing results of the separative analysis, which are obtained at the measuring times respectively. By the fault determination, it is possible to determine a fault line and a fault location (or fault distance) as well as a fault time.
摘要翻译：测试装置在多级多分支光网络上进行测试，该多网络光网络包含以多级多分支方式在连接点（例如，光耦合器）处连接在一起的光线路（例如光纤）。 OTDR测量装置使用软件对多级多分支光网络执行故障确定。这里，光脉冲被输入到多级多分支光网络的输入端，其中它们在通过光线路传播的同时在光线路和连接点的某些部分被反射。然后，反射光束返回到输入端，并作为响应光混合在一起，由OTDR测量装置测量。将响应光转换成表示测量波形的多个数字波形数据，然后根据菲涅耳反射点和连接点将其分成多个范围。对属于测量波形的每个范围的数字波形数据执行分离分析。在测量时间重复分离分析，这是预先确定的。因此，通过比较分别在测量时间分别获得的分析结果进行故障确定。通过故障确定，可以确定故障线路和故障位置（或故障距离）以及故障时间。

2. 发明授权

US06512610B1 Device and method for testing of multi-branch optical network 失效
标题翻译：多分支光网络测试装置及方法
公开(公告)号：US06512610B1
公开(公告)日：2003-01-28
申请号：US09261835
申请日：1999-03-03
申请人： Takao Minami , Nobuaki Takeuchi , Keiichi Shimizu , Koichi Shinozaki , Takamu Genji
发明人： Takao Minami , Nobuaki Takeuchi , Keiichi Shimizu , Koichi Shinozaki , Takamu Genji
IPC分类号： H04B1008
CPC分类号： G01M11/3136
摘要： A multi-branch optical network testing method (or device) is provided to perform a fault isolation test on an optical network that branches off at a branch point by a number of optical lines having terminal ends respectively. Herein, optical pulses are input to the optical network, from which they are returned as reflection beams. Then, response beams corresponding to mixture of the reflection beams are converted to OTDR waveform data representing a waveform whose optical power gradually decreases in accordance with a distance from an OTDR measurement device and which has a number of reflection peaks. The OTDR waveform data are subjected to logarithmic conversion to produce logarithmic waveform data representing a logarithmic waveform. An approximation method of least squares is effected on the logarithmic waveform data to produce an approximation line, which crosses the logarithmic waveform at points of intersection corresponding to Fresnel reflection points. Using the Fresnel reflection points as split points to split the OTDR waveform data into a number of ranges. Attenuation constants are repeatedly calculated with respect to each of the ranges every measurement time and are stored in a storage device. Thereafter, fault determination is automatically performed based on the attenuation constants stored in the storage device with respect to the fault occurrence time, fault occurrence line and fault occurrence distance.
摘要翻译：提供了一种多分支光网络测试方法（或设备），用于在分支点分支多个具有终端的光线路的光网络上执行故障隔离测试。这里，光脉冲被输入到光网络，作为反射光束返回。然后，对应于反射光束的混合的响应光束被转换为表示根据与OTDR测量装置的距离而光功率逐渐减小的波形的OTDR波形数据，并且具有多个反射峰值。对OTDR波形数据进行对数转换，生成表示对数波形的对数波形数据。对对数波形数据进行最小二乘法近似法，得到近似线，该近似线与对应于菲涅尔反射点的交点处的对数波形相交。使用菲涅尔反射点作为分割点将OTDR波形数据分割成多个范围。衰减常数相对于每个测量时间的每个范围重复计算并存储在存储装置中。此后，基于存储在存储装置中的故障发生时间，故障发生线和故障发生距离的衰减常数自动执行故障确定。

3. 发明授权

US5731869A Optical fiber testing method for measuring connection location and connection loss 失效
标题翻译：用于测量连接位置和连接损耗的光纤测试方法
公开(公告)号：US5731869A
公开(公告)日：1998-03-24
申请号：US672565
申请日：1996-06-28
申请人： Takao Minami
发明人： Takao Minami
IPC分类号： G02B6/00 , G01M11/00 , G01M11/02 , H04B3/46 , H04B3/48 , H04B10/071 , H04B10/077 , H04B10/25 , H04B10/2507 , H04B17/00 , G01N21/88
CPC分类号： G01M11/3145
摘要： In an optical fiber testing method, light are supplied to a measuring optical fiber so that return light, consisting of back-scattering light and Fresnel-reflection light, is outputted from the measuring optical fiber. A waveform representing the return light is used to perform testing of the measuring optical fiber. Herein, a detection range of the waveform used for detection of connections is defined and is partitioned into a plurality of regions in connection with Fresnel-reflection space. Then, at least a noise index and a constant are calculated for each region; and HOUGH conversion is performed on each region of the waveform. In addition, a center-value filtering process is performed, using the constant, with respect to each region of the waveform to create a filtered waveform. Further, a mean difference process is performed on the filtered waveform to create a mean difference waveform. A location of a temporary connection is set at a specific location of the mean difference waveform whose level exceeds a predetermined range. Approximate lines are calculated with respect to a left-side section and a right-side section of the temporary connection on the mean difference waveform. A connection loss is calculated for the temporary connection based on the approximate lines. Then, a decision is made, based on the connection loss, as to whether or not the temporary connection indicates a real connection. Thus, it is possible to automatically detect locations of connections and connection loss with high precision.
摘要翻译：在光纤测试方法中，光被提供给测量光纤，使得从测量光纤输出由背散射光和菲涅耳反射光组成的返回光。使用表示返回光的波形来进行测量光纤的测试。这里，定义了用于检测连接的波形的检测范围，并将其划分为与菲涅尔反射空间有关的多个区域。然后，对于每个区域计算至少噪声指数和常数; 并在波形的每个区域执行HOUGH转换。此外，使用关于波形的每个区域的常数来执行中心值滤波处理以产生滤波波形。此外，对经滤波的波形执行平均差分处理以产生平均差波形。临时连接的位置被设置在其电平超过预定范围的均值差波形的特定位置。相对于平均差波形上的临时连接的左侧部分和右侧部分计算近似线。基于近似线计算临时连接的连接损耗。然后，基于连接丢失作出决定，临时连接是否表示真实的连接。因此，可以以高精度自动检测连接的位置和连接损耗。

4. 发明授权

US4714501A Method for thermal treatment of alloy for heat transfer pipes 失效
标题翻译：换热管合金热处理方法
公开(公告)号：US4714501A
公开(公告)日：1987-12-22
申请号：US798702
申请日：1985-11-15
申请人： Kazuo Yamanaka , Hiroo Nagano , Takao Minami , Yaautaka Okada , Mamoru Inoue , Hiroshi Susukida , Kichiro Onimura , Toshio Yonezawa , Nobuya Sasaguri , Katsuji Kawaguchi , Takaya Kusakabe
发明人： Kazuo Yamanaka , Hiroo Nagano , Takao Minami , Yaautaka Okada , Mamoru Inoue , Hiroshi Susukida , Kichiro Onimura , Toshio Yonezawa , Nobuya Sasaguri , Katsuji Kawaguchi , Takaya Kusakabe
IPC分类号： C22C19/05 , C22C30/00 , C22F1/10
CPC分类号： C22F1/10 , C22C19/05
摘要： An alloy for heat transfer pipes excellent in an alkali stress corrosion cracking resistance which is obtained by heating and retaining said alloy at a temperature within the range of a temperature (T.degree.C.), at which a carbide in said alloy is thoroughly solubilized, to T+100.degree. C. for 1 minute or more; cooling it once to a level of 200.degree. C. or less; and carrying out a thermal treatment under conditions within a hatched range Z in FIG. 2, said alloy comprising: in terms of % by weight, 0.15% or less of C; 1.0% or less of Si; 1.0% or less of Mn; 25 to 35% of Cr; 40 to 70% of Ni; 0.5% or less of Al; 0.01 to 1.0% of Ti; 0.5 to 5.0%, in all, of one or more of Mo, W and V; 0.30% or less of P; 0.020% or less of S; and the residue of Fe and impurities.
摘要翻译：一种耐碱腐蚀开裂性优异的传热管用合金，其特征在于，在将上述合金中的碳化物充分溶解的温度（T℃）下进行加热保持，至T + 100℃1分钟以上; 冷却一次至200℃以下; 并在图1中的阴影范围Z内的条件下进行热处理。 2，所述合金包含：按重量％计，0.15％或更少的C; 1.0％以下的Si; 1.0％以下的Mn; 25〜35％的Cr; 40〜70％的Ni; 0.5％以下的Al; 0.01〜1.0％Ti; 0.5〜5.0％，全部为Mo，W和V中的一种或多种; 0.30％以下的P; 0.020％以下的S; 并残留Fe和杂质。

5. 发明授权

US07133574B2 Method for recognizing position of honeycomb structure 失效
公开(公告)号：US07133574B2
公开(公告)日：2006-11-07
申请号：US10225292
申请日：2002-08-22
申请人： Takao Minami
发明人： Takao Minami
IPC分类号： G06K9/36
CPC分类号： G01N21/95692
摘要： A position of a honeycomb structure, which is comprised of an outer shell, separation walls arranged in the form of a honeycomb within the outer shell, and a number of axially extending cells which are defined by the separation walls, is recognized. When the position recognition is carried out, the honeycomb structure is located with the axis extending in an upward and downward direction. A camera to pickup image data is disposed out of an area directly above an upper surface of the honeycomb structure in the axial direction. Image data including the entirety of the upper surface of the honeycomb structure is picked up by the camera, so that the position of the honeycomb structure is recognized based on the image data.

6. 发明授权

US5668627A Optical line testing device and method for automatically and efficiently measuring properties of the optical line 失效
标题翻译：光线路测试装置及其自动高效测量光线路性能的方法
公开(公告)号：US5668627A
公开(公告)日：1997-09-16
申请号：US635490
申请日：1996-04-22
申请人： Takao Minami
发明人： Takao Minami
IPC分类号： H04B10/07 , G01M11/00 , G01M11/02 , H04B3/46 , H04B3/48 , H04B10/071 , H04B10/077 , H04B17/00 , G01N21/88
CPC分类号： G01M11/3145
摘要： In an optical line testing device, light pulses are radiated to an optical line so as to receive response light, corresponding to each of the light pulses reflected by the optical line, for a certain period of time. The response light is converted to waveform data. The waveform data are averaged to create averaged data. The averaged data are stored in a memory and are also used to visually display a response waveform corresponding to the response light. A human operator manipulates an operator console while looking at the response waveform so as to analyze the response waveform, thus detecting a property of the optical line. A data range is set between first data and last data selected from among the averaged data representing the response waveform. According to an optical line testing method, the data range is partitioned into several regions so that an approximate line is calculated, using a method of least squares, with respect to each of the regions. Based on the relationship between the approximate line and the level of the response waveform, the property of the optical line is measured with respect to a terminal end of the optical line, a position of Fresne's reflection, and a connection loss of the optical line.
摘要翻译：在光线路测试装置中，将光脉冲辐射到光线路，以便接收对应于由光线路反射的每个光脉冲的响应光一定时间。响应光被转换为波形数据。对波形数据进行平均以创建平均数据。平均数据存储在存储器中，并且还用于可视地显示对应于响应光的响应波形。人操作者在观察响应波形时操纵操作员控制台，以便分析响应波形，从而检测光线路的属性。从表示响应波形的平均数据中选择的第一数据和最后数据之间设置数据范围。根据光线测试方法，将数据范围划分成若干区域，以便使用相对于每个区域的最小二乘法的近似线。基于近似线和响应波形的电平之间的关系，相对于光学线路的终端，Fresne反射的位置和光学线路的连接损耗来测量光学线路的性质。

7. 发明授权

US4710237A Method for thermal treatment of nickel based alloy materials 失效
标题翻译：镍基合金材料热处理方法
公开(公告)号：US4710237A
公开(公告)日：1987-12-01
申请号：US815774
申请日：1986-01-02
申请人： Toshio Yonezawa , Nobuya Sasaguri , Kichiro Onimura , Hiroshi Susukida , Katsuji Kawaguchi , Hiroo Nagano , Takao Minami , Kazuo Yamanaka , Yasutaka Okada , Mamoru Inoue
发明人： Toshio Yonezawa , Nobuya Sasaguri , Kichiro Onimura , Hiroshi Susukida , Katsuji Kawaguchi , Hiroo Nagano , Takao Minami , Kazuo Yamanaka , Yasutaka Okada , Mamoru Inoue
IPC分类号： C22C19/05 , C22F1/00 , C22F1/10
CPC分类号： C22C19/05 , C22F1/10
摘要： A method for a thermal treatment of a nickel based alloy, characterized in that said nickel based alloy for a material which will be subjected to a high-temperature and high-pressure water or vapor comprises, in terms of % by weight, 58% or more of Ni, 25 to 35% of Cr, 0.003% or less of B, 0.012 to 0.035% of C, 1% or less of Mn, 0.5% or less of Si, 0.015% or less of P, 0.015% or less of S, and the residue of Fe and usual impurities; in a first thermal treatment process, said nickel based alloy is heated and retained at a temperature of T.degree. C. to (T+100).degree.C. and is cooled at a cooling rate of a furnace cooling rate or more; and in a second thermal treatment process, said nickel based alloy is then retained at a temperature of 600.degree. to 750.degree. C. and at a temperature within a sensitization recovery range for a period of 0.1 to 100 hours and is cooled at a cooling rate of said furnace cooling rate or more.
摘要翻译：一种镍基合金的热处理方法，其特征在于，用于经受高温高压水或蒸汽的材料的所述镍基合金以重量％计含有58％或较多的Ni，25〜35％的Cr，0.003％以下的B，0.012〜0.035％的C，1％以下的Mn，0.5％以下的Si，0.015％以下的P，0.015％以下的S，以及Fe和常规杂质的残留物; 在第一热处理工艺中，将所述镍基合金在T℃至（T + 100）℃的温度下加热并保持，并以炉冷却速率或更高的冷却速率冷却; 然后在第二热处理工艺中，然后将所述镍基合金保持在600至750℃的温度和在致敏恢复范围内的温度下进行0.1至100小时的时间，并以冷却速率所述炉冷却速度或更高。

8. 发明授权

US06614511B1 Light wavelength dispersion measuring apparatus and light wavelength dispersion measuring method 失效
标题翻译：光波长色散测量装置和光波长色散测量方法
公开(公告)号：US06614511B1
公开(公告)日：2003-09-02
申请号：US09697903
申请日：2000-10-27
申请人： Yoshiyuki Sakairi , Takao Minami
发明人： Yoshiyuki Sakairi , Takao Minami
IPC分类号： G01N2100
CPC分类号： G01M11/332 , G01J9/00 , G01M11/335 , G01M11/338
摘要： In a light wavelength dispersion measuring apparatus 1, three band-pass filters BPa1 to BPa3 are connected in parallel, three band-pass filters BPb1 to BPb3 are connected in parallel, and three phase comparators PCa to PCc are connected in parallel for making it possible to conduct phase difference measurement of the nth-order harmonics (n=1, 4, 8) at the same time, so that a wavelength dispersion calculator 10 can calculate the wavelength dispersion values of the nth-order harmonics (n=1, 4, 8) at the same time. As a result, measurement time of measuring the wavelength dispersion characteristic in the light wavelength dispersion measuring apparatus 1 can be shortened.
摘要翻译：在光波长色散测量装置1中，并联连接三个带通滤波器BPa1至BPa3，并联连接三个带通滤波器BPb1至BPb3，并联连接三个相位比较器PCa至PCc，以使其成为可能同时进行n次谐波（n = 1,4,8）的相位差测量，使得波长色散计算器10可以计算n次谐波的波长色散值（n = 1,4 ，8）同时。结果，可以缩短测量光波长色散测量装置1中的波长色散特性的测量时间。

9. 发明授权

US06028661A Multi-branched optical line testing apparatus 失效
标题翻译：多分支光线路测试仪
公开(公告)号：US06028661A
公开(公告)日：2000-02-22
申请号：US986733
申请日：1997-12-08
申请人： Takao Minami , Nobuaki Takeuchi , Naoyuki Nozaki , Koichi Shinozaki , Takamu Genji
发明人： Takao Minami , Nobuaki Takeuchi , Naoyuki Nozaki , Koichi Shinozaki , Takamu Genji
IPC分类号： G01B11/00 , G01M11/00 , G01N21/00
CPC分类号： G01M11/3136
摘要： A multi-branched optical line testing apparatus can automatically detect a faulty line in multi-branched optical lines and the distance to the fault point. An optical pulse is introduced to the branch point of optical fibers and is reflected inside the respective optical fibers. The waveform of the returning response light is analyzed by an optical time-domain reflectometer (OTDR) measuring apparatus to detect a fault in the respective optical fibers and to determine the fault point. The OTDR measuring apparatus periodically converts the response light which is returned from the respective optical fibers into a digital waveform data group, calculates the attenuation ratios of the respective optical fibers by performing separation analysis of the digital waveform data group, and determines the faulty line and the position of the fault point based on the change of the attenuation ratio of the respective optical fibers.
摘要翻译：多分支光线路测试装置可以自动检测多分支光线路中的故障线路和故障点的距离。将光脉冲引入到光纤的分支点，并在各光纤内反射。通过光时域反射计（OTDR）测量装置分析返回响应光的波形，以检测各光纤中的故障并确定故障点。 OTDR测量装置将从各个光纤返回的响应光周期性地转换为数字波形数据组，通过执行数字波形数据组的分离分析来计算各个光纤的衰减比，并确定故障线基于相应光纤的衰减比的变化的故障点的位置。

10. 发明授权

US5372168A Thin plate cutting/joining apparatus 失效
标题翻译：薄板切割/接合装置
公开(公告)号：US5372168A
公开(公告)日：1994-12-13
申请号：US134759
申请日：1993-10-12
申请人： Takao Minami
发明人： Takao Minami
IPC分类号： B23D47/04 , B27C5/00 , B27D1/10 , B27G11/00 , B27M1/08 , B27F1/00
CPC分类号： B27G11/00 , B23D47/042 , B27C5/00 , B27D1/10 , B27M1/08
摘要： A thin plate cutting/joining apparatus includes a cutting apparatus for pressing the front end of a following thin plate and the rear end of a preceding thin plate together and cutting the pressed front and rear ends of the thin plates in stepped scarf shapes; an adhesive coating apparatus for coating an adhesive on the cut surfaces of the end portions of the thin plates; and a joining apparatus for pushing the thin plates coated with the adhesive against each other and vertically pressing them, so as to joining the end portions of the thin plates.
摘要翻译：薄板切割/接合装置包括用于将后面的薄板的前端和前一薄板的后端按压在一起的切割装置，并且以阶梯状的围巾形状切割薄板的按压的前端和后端; 用于在薄板的端部的切割表面上涂覆粘合剂的粘合剂涂布装置; 以及接合装置，用于将涂覆有粘合剂的薄板彼此推压并垂直压紧，以便连接薄板的端部。

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