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1. 发明授权

US11921159B2 Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systems 有权
公开(公告)号：US11921159B2
公开(公告)日：2024-03-05
申请号：US18113688
申请日：2023-02-24
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Prakash Narayanan , Rubin A. Parekhji , Arvind Jain , Sundarrajan Subramanian
IPC分类号： G01R31/00 , G01R31/3177 , G01R31/3185
CPC分类号： G01R31/3177 , G01R31/318536 , G01R31/318547
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

2. 发明申请

US20150006987A1 COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS 审中-公开
标题翻译：内部链观察，过程，电路，设备和系统的压缩扫描链诊断
公开(公告)号：US20150006987A1
公开(公告)日：2015-01-01
申请号：US14487538
申请日：2014-09-16
申请人： Texas Instruments Incorporated
发明人： Prakash Narayanan , Arvind Jain , Sundarrajan Subramanian , Rubin A. Parekhji
IPC分类号： G01R31/3185
CPC分类号： G01R31/3177 , G01R31/318536 , G01R31/318547
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.
摘要翻译：电子扫描电路包括解压缩器（510），由解压缩器（510）馈送的多个扫描链（520.i），耦合到多个扫描链（520.i）以扫描的扫描电路（502,504）由扫描链（520.i）馈送的掩蔽电路（590）和耦合到屏蔽电路（590）的可扫描屏蔽鉴定电路（550,560,580），屏蔽鉴定电路（550），560,580）以及扫描链（520.i）的扫描以及可扫描掩蔽鉴定电路（550,560,580）可扫描由解压缩器（510）的位的扫描，以及可扫描掩蔽鉴定电路（550,560,580）通过屏蔽电路扫描扫描链（590）后扫描位。还公开了其它扫描电路，处理，电路，装置和系统。

3. 发明申请

US20210364569A1 COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS 有权
公开(公告)号：US20210364569A1
公开(公告)日：2021-11-25
申请号：US17396079
申请日：2021-08-06
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Prakash Narayanan , Rubin A, Parekhji , Arvind Jain , Sundarrajan Subramanian
IPC分类号： G01R31/3177 , G01R31/3185
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

4. 发明授权

US11119152B2 Functional circuitry, decompressor circuitry, scan circuitry, masking circuitry, qualification circuitry 有权
公开(公告)号：US11119152B2
公开(公告)日：2021-09-14
申请号：US16780119
申请日：2020-02-03
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Prakash Narayanan , Rubin A. Parekhji , Arvind Jain , Sundarrajan Subramanian
IPC分类号： G06F11/00 , G01R31/3177 , G01R31/3185
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

5. 发明授权

US09229055B2 Decompressed scan chain masking circuit shift register with log2(n/n) cells 有权
标题翻译：用log2（n / n）单元解压缩扫描链屏蔽电路移位寄存器
公开(公告)号：US09229055B2
公开(公告)日：2016-01-05
申请号：US14743720
申请日：2015-06-18
申请人： Texas Instruments Incorporated
发明人： Prakash Narayanan , Arvind Jain , Sundarrajan Subramanian , Rubin A. Parekhji
IPC分类号： G06F11/00 , G01R31/3177 , G01R31/3185
CPC分类号： G01R31/3177 , G01R31/318536 , G01R31/318547
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.
摘要翻译：电子扫描电路包括解压缩器（510），由解压缩器（510）馈送的多个扫描链（520.i），耦合到多个扫描链（520.i）以扫描的扫描电路（502,504）由扫描链（520.i）馈送的掩蔽电路（590）和耦合到屏蔽电路（590）的可扫描屏蔽鉴定电路（550,560,580），屏蔽鉴定电路（550），560,580）以及扫描链（520.i）的扫描以及可扫描掩蔽鉴定电路（550,560,580）可扫描由解压缩器（510）的位的扫描，以及可扫描掩蔽鉴定电路（550,560,580）通过屏蔽电路扫描扫描链（590）后扫描位。还公开了其它扫描电路，处理，电路，装置和系统。

6. 发明公开

US20230194605A1 COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS 审中-公开
公开(公告)号：US20230194605A1
公开(公告)日：2023-06-22
申请号：US18113688
申请日：2023-02-24
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Prakash Narayanan , Rubin A, Parekhji , Arvind Jain , Sundarrajan Subramanian
IPC分类号： G01R31/3177 , G01R31/3185
CPC分类号： G01R31/3177 , G01R31/318547 , G01R31/318536
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

7. 发明申请

US20150285860A1 COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS 审中-公开
公开(公告)号：US20150285860A1
公开(公告)日：2015-10-08
申请号：US14743720
申请日：2015-06-18
申请人： Texas Instruments Incorporated
发明人： Prakash Narayanan , Arvind Jain , Sundarrajan Subramanian , Rubin A. Parekhji
IPC分类号： G01R31/3177
CPC分类号： G01R31/3177 , G01R31/318536 , G01R31/318547
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

8. 发明申请

US20180210030A1 COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS 审中-公开
公开(公告)号：US20180210030A1
公开(公告)日：2018-07-26
申请号：US15925200
申请日：2018-03-19
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Prakash Narayanan , Rubin A. Parekhji , Arvind Jain , Sundarrajan Subramanian
IPC分类号： G01R31/3177 , G01R31/3185
CPC分类号： G01R31/3177 , G01R31/318536 , G01R31/318547
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

9. 发明授权

US11592483B2 Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systems 有权
公开(公告)号：US11592483B2
公开(公告)日：2023-02-28
申请号：US17396079
申请日：2021-08-06
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Prakash Narayanan , Rubin A Parekhji , Arvind Jain , Sundarrajan Subramanian
IPC分类号： G01R31/00 , G01R31/3177 , G01R31/3185
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

10. 发明申请

US20200174069A1 COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS 审中-公开
公开(公告)号：US20200174069A1
公开(公告)日：2020-06-04
申请号：US16780119
申请日：2020-02-03
申请人： TEXAS INSTRUMENTS INCORPORATED
发明人： Prakash Narayanan , Rubin A. Parekhji , Arvind Jain , Sundarrajan Subramanian
IPC分类号： G01R31/3177 , G01R31/3185
摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

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