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    • 7. 发明授权
    • Multilayer ceramic capacitor
    • 多层陶瓷电容器
    • US09177726B2
    • 2015-11-03
    • US14066465
    • 2013-10-29
    • TAIYO YUDEN CO., LTD.
    • Koichiro MoritaKatsuya Taniguchi
    • H01G4/12H01G4/30
    • H01G4/30H01G4/12H01G4/1209
    • With a multilayer ceramic capacitor whose average grain size of the dielectric grains present at the outermost layer position P1 in the laminate is given by D1, average grain size of the dielectric grains present at the center position P2 in the laminate is given by D2, and average grain size of the dielectric grains present at the 25%-penetrated position P3 which is a position penetrated into the laminate by 25% is given by D3, growth of the dielectric grains occurring as a result of sintering is partially suppressed in such a way that the relationships of average grain sizes D1, D2, and D3 satisfy the conditions of 1.5×D1
    • 使用层叠体中存在于最外层位置P1处的电介质晶粒的平均粒径为D1的层叠陶瓷电容器,由层叠体中的中心位置P2存在的电介质晶粒的平均粒径为D2, 存在于穿透层压体25%的位置的25%穿透位置处的电介质晶粒的平均粒径由D3给出,由烧结而产生的电介质晶粒的生长以这种方式被部分地抑制 平均粒径D1,D2和D3的关系满足1.5×D1