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    • 1. 发明申请
    • DISPLAY PANEL, METHOD OF INSPECTING THE DISPLAY PANEL AND METHOD OF MANUFACTURING THE DISPLAY PANEL
    • 显示面板,检查显示面板的方法和制造显示面板的方法
    • US20080170195A1
    • 2008-07-17
    • US11970068
    • 2008-01-07
    • Sun-Ja KWONJin JEONYoung-Gi PARK
    • Sun-Ja KWONJin JEONYoung-Gi PARK
    • G02F1/1343G01R31/28G02F1/13
    • G02F1/1309G02F1/13338G09G3/006G09G3/3648
    • A display panel includes an array substrate, an opposite substrate facing the array substrate, and a liquid crystal layer interposed between the array and opposite substrates. The array substrate includes a gate wiring, a data wiring, a pixel section, a sensor wiring section, a sensor electrode section and a sensor pad section. The gate wiring is formed in a first direction. The data wiring is formed in a second direction crossing the first direction. The pixel section is electrically connected to the gate and data wirings. The sensor wiring section is spaced apart from the gate and data wirings. The sensor electrode section is electrically connected to the sensor wiring section. The sensor pad section applies a test voltage to the sensor wiring section in order to inspect a display panel defect. Therefore, a short defect, which is generated between the array substrate and the opposite substrate, may be easily inspected.
    • 显示面板包括阵列基板,面向阵列基板的相对基板,以及插入阵列和相对基板之间的液晶层。 阵列基板包括栅极布线,数据布线,像素部分,传感器布线部分,传感器电极部分和传感器焊盘部分。 栅极布线沿第一方向形成。 数据布线沿与第一方向交叉的第二方向形成。 像素部分电连接到栅极和数据布线。 传感器接线部分与栅极和数据布线间隔开。 传感器电极部与传感器配线部电连接。 传感器焊盘部分向传感器接线部分施加测试电压,以便检查显示板缺陷。 因此,可以容易地检查在阵列基板和相对基板之间产生的短缺陷。