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1. 发明授权

US5834147A Photosensitive member for electrophotography 失效
标题翻译：电子照相用感光元件
公开(公告)号：US5834147A
公开(公告)日：1998-11-10
申请号：US691305
申请日：1996-08-02
申请人： Suguru Nagae , Kazuko Wakita , Toshio Kobayashi , Yoshimi Sugimoto , Sei Tsunoda , Kikuo Hayama , Koe Enmanji
发明人： Suguru Nagae , Kazuko Wakita , Toshio Kobayashi , Yoshimi Sugimoto , Sei Tsunoda , Kikuo Hayama , Koe Enmanji
IPC分类号： G03G5/05 , G03G5/06 , G03G5/147
CPC分类号： G03G5/0596 , G03G5/0507 , G03G5/0696 , G03G5/0542
摘要： A photosensitive member for electrophotography having excellent electrophotographic characteristics such as chargeability, photosensitivity and dark attenuation, excellent corona resistance and excellent durability, which comprises an electrically conductive support and a photosensitive layer containing a resin binder and particles of a photoconductive phthalocyanine compound dispersed in said binder, said photosensitive layer containing at least one member selected from the group consisting of an electron acceptive material, a coupling agent, an antioxidant and a hydroxyl group-containing polymer.
摘要翻译：一种用于电子照相的感光构件，其具有优异的电荷特性如带电性，光敏性和暗衰减性，优异的耐电晕性和优异的耐久性，其包括导电性支持体和含有树脂粘合剂的感光层和分散在所述粘合剂中的光导酞菁化合物颗粒所述感光层含有选自电子受体材料，偶联剂，抗氧化剂和含羟基的聚合物中的至少一种。

2. 发明授权

US4697123A Gas discharge panel 失效
标题翻译：排气面板
公开(公告)号：US4697123A
公开(公告)日：1987-09-29
申请号：US319404
申请日：1981-11-09
申请人： Tsutae Shinoda , Yoshinori Miyashita , Yoshimi Sugimoto , Hideo Sei , Shizuo Andoh
发明人： Tsutae Shinoda , Yoshinori Miyashita , Yoshimi Sugimoto , Hideo Sei , Shizuo Andoh
IPC分类号： G09F9/313 , H01J11/14 , H01J11/42 , H01J11/46 , H01J11/48 , H01J17/49 , G09G3/10
CPC分类号： H01J11/00
摘要： Disclosed here is a panel structure for a large size display which utilizes the gas discharge panel called the surface discharge type panel. Among a pair of substrates arranged face to face in order to define the gas discharge space, the one substrate which is used as the electrode supporting substrate is composed of the composite substrate body where plurality of small size substrates which can be produced comparatively easily with high production yield are combined in such a form that the side edge surfaces of said substrates are aligned face to face, while the other substrate which is used as the covering substrate is composed of a large size single substrate in such a size same as said composite substrate body. Such substrate structure realizes a large size gas discharge panel having a high production yield, without requiring the large scale production facility.
摘要翻译：这里公开了一种使用称为表面放电型面板的气体放电面板的大尺寸显示器的面板结构。在为了限定气体放电空间而面对面配置的一对基板中，用作电极支撑基板的一个基板由能够相对容易地制造的多个小尺寸基板的复合基板体构成生产率以这样的形式组合，使得所述基板的侧边缘表面面对面地对准，而用作覆盖基板的另一个基板由与所述复合基板的尺寸相同的大尺寸单个基板身体。这种基板结构实现了大型气体放电面板，其生产成本高，而不需要大规模生产设备。

3. 发明授权

US06320401B1 Substrate inspection using the propagation characteristics of RF electromagnetic waves 失效
标题翻译：使用射频电磁波传播特性的基板检查
公开(公告)号：US06320401B1
公开(公告)日：2001-11-20
申请号：US09327672
申请日：1999-06-08
申请人： Yoshimi Sugimoto , Yoshikazu Nakayama , Masao Watanabe
发明人： Yoshimi Sugimoto , Yoshikazu Nakayama , Masao Watanabe
IPC分类号： G01N2202
CPC分类号： G01N22/00
摘要： A substrate inspection device successively stacks a first electrode plate, a standard substrate, a second electrode plate, a sample substrate, and a third electrode plate, in that order, with the sample substrate and the standard substrate placed in symmetrical opposition. A network analyzer both measures the propagation characteristics of RF electromagnetic waves from the second electrode plate to the first electrode plate as standard characteristics and measures the propagation characteristics of RF electromagnetic waves from the second electrode plate to the third electrode plate as the test characteristics. The quality of the sample substrate can be determined by comparing the measured standard characteristics with the test characteristics, thereby enabling, for example, the simple detection of defects inside a multilayer sample substrate.
摘要翻译：基板检查装置依次堆叠第一电极板，标准基板，第二电极板，样品基板和第三电极板，其中样品基板和标准基板以对称的方式放置。网络分析仪测量作为标准特性的从第二电极板到第一电极板的RF电磁波的传播特性，并且测量从第二电极板到第三电极板的RF电磁波的传播特性作为测试特性。可以通过将测量的标准特性与测试特性进行比较来确定样品基底的质量，从而能够例如简单地检测多层样品基底内的缺陷。

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