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    • 4. 发明授权
    • Flash memory including a mode register for indicating synchronous or
asynchronous mode of operation
    • 闪存包括用于指示同步或异步操作模式的模式寄存器
    • US6026465A
    • 2000-02-15
    • US897499
    • 1997-06-18
    • Duane R. MillsBrian Lyn DipertSachidanandan SambandanBruce McCormickRichard D. Pashley
    • Duane R. MillsBrian Lyn DipertSachidanandan SambandanBruce McCormickRichard D. Pashley
    • G06F12/06G06F12/08G11C7/10G06F13/16G06F12/00
    • G06F12/08G06F12/0607G11C7/1045G11C7/1072G06F2212/2022Y02B60/1225
    • A flash memory chip that can be switched into four different read modes is described. In the first read mode, asynchronous flash mode, the flash memory is read as a standard flash memory where the reading of the contents of a first address must be completed before a second address to be read can be specified. In the second read mode, synchronous flash mode, a clock signal is provided to the flash chip and a series of addresses belonging to a data burst are specified, one address per clock tick. Then, the contents stored at the addresses specified for the burst are output sequentially during subsequent clock ticks in the order in which the addresses were provided. Alternately, if a single address is provided to the flash chip when it is in the synchronous mode, the subsequent addresses for the burst will be generated within the flash chip and the data burst will then be provided as output from the flash chip. In the third read mode, asynchronous DRAM mode, the row and column addresses are strobed into the flash memory using strobe signals. The flash memory then converts the row and column addresses internally into a single address and provides as output the data stored at that single address. The flash memory does not need an extended precharge period or to be refreshed, but can be controlled by a standard DRAM controller. In the fourth read mode, synchronous DRAM mode, the flash memory emulates a synchronous DRAM.
    • 描述可以切换成四种不同读取模式的闪存芯片。 在第一读取模式,异步闪存模式下,闪存被读取为标准闪速存储器,其中在可以指定要读取的第二地址之前必须先完成读取第一地址的内容。 在第二读取模式的同步闪光模式中,向闪存芯片提供时钟信号,并且指定属于数据突发的一系列地址,每个时钟刻度一个地址。 然后,按照提供地址的顺序,在随后的时钟周期期间顺序输出存储在针对脉冲串指定的地址的内容。 或者,如果在闪存芯片处于同步模式时提供单个地址,则在闪存芯片内将生成用于突发的后续地址,然后将数据突发作为闪存芯片的输出提供。 在第三读取模式下,异步DRAM模式,使用选通信号将行和列地址选通闪存。 然后,闪存将内部的行和列地址转换为单个地址,并提供存储在该单个地址的数据的输出。 闪存不需要扩展预充电周期或刷新,而是可以由标准DRAM控制器控制。 在第四读取模式,同步DRAM模式下,闪速存储器模拟同步DRAM。
    • 5. 发明授权
    • Method and apparatus for performing burst read operations in an
asynchronous nonvolatile memory
    • 用于在异步非易失性存储器中执行突发读取操作的方法和装置
    • US5696917A
    • 1997-12-09
    • US253499
    • 1994-06-03
    • Duane R. MillsBrian Lyn DipertSachidanandan SambandanBruce McCormickRichard D. Pashley
    • Duane R. MillsBrian Lyn DipertSachidanandan SambandanBruce McCormickRichard D. Pashley
    • G06F12/06G06F12/08G11C7/10G06F12/00
    • G06F12/08G06F12/0607G11C7/1045G11C7/1072G06F2212/2022Y02B60/1225
    • An asynchronous nonvolatile memory includes a plurality of individual memory components. A burst read operation references consecutive addresses beginning with a first address, wherein the consecutive addresses are not located in a same memory component. A method of performing a burst read operation in the asynchronous nonvolatile memory includes the step of providing the first address as a current address to the plurality of individual components. A current page identified by m higher order bits of the current address is selected. Each of the individual memory components senses a location identified by the m higher order bits. An output of a selected individual memory component is enabled in accordance with n lower bits of the current address. A consecutive subsequent address is provided, wherein the current address becomes a preceding address and the consecutive subsequent address becomes the current address. The output of another selected individual memory component identified by the n lower order bits of the current address is enabled without generating wait states, if the current and preceding addresses identify a same page. The process of providing consecutive subsequent addresses and enabling the output of a memory component identified by the n lower order bits is repeated as long as the current and preceding addresses identify the same page.
    • 异步非易失性存储器包括多个单独的存储器组件。 突发读取操作参考以第一地址开头的连续地址,其中连续地址不位于相同的存储器组件中。 在异步非易失性存储器中执行突发读取操作的方法包括将第一地址作为当前地址提供给多个单独的组件的步骤。 选择当前地址的m个更高阶位所标识的当前页。 每个单独的存储器组件感测由m个更高阶位确定的位置。 根据当前地址的n个较低位使能所选择的各个存储器组件的输出。 提供连续的后续地址,其中当前地址变为前一地址,并且连续的后续地址变为当前地址。 如果当前地址和以前的地址标识同一页,则由当前地址的n个较低位确定的另一个选定的单独存储器组件的输出被启用而不产生等待状态。 只要当前和前面的地址标识相同的页面,就重复提供连续的后续地址并且使得能够输出由n个较低位比特识别的存储器组件的处理。
    • 7. 发明授权
    • Method and circuitry for preventing propagation of undesired ATD pulses
in a flash memory device
    • 用于防止闪速存储器件中不需要的ATD脉冲传播的方法和电路
    • US5563843A
    • 1996-10-08
    • US401474
    • 1995-03-09
    • Richard E. FackenthalDuane R. Mills
    • Richard E. FackenthalDuane R. Mills
    • G11C8/18G11C8/00
    • G11C8/18
    • An Address Transition Detection (ATD) circuit for use in memory devices. The ATD circuit includes a pulse generator for generating an ATD pulse. For asynchronous memory device, the pulse generator generates the ATD pulse in response to an address transition, wherein for synchronous devices, the pulse generator generates the ATD pulse in response to control signals that indicate a valid address. The ATD circuit also includes a control circuit and a mask circuit. The control circuit is operative to asserting a first control signal in response to receiving the pulse. The mask circuit is coupled between the output of the pulse generator and the control circuit for preventing propagation of the ATD pulse if the first control signal is active.
    • 用于存储器件的地址转换检测(ATD)电路。 ATD电路包括用于产生ATD脉冲的脉冲发生器。 对于异步存储器件,脉冲发生器响应于地址转换产生ATD脉冲,其中对于同步器件,脉冲发生器响应于指示有效地址的控制信号产生ATD脉冲。 ATD电路还包括控制电路和掩模电路。 响应于接收脉冲,控制电路用于确定第一控制信号。 如果第一控制信号有效,则掩模电路耦合在脉冲发生器的输出端和控制电路之间,以防止ATD脉冲传播。
    • 8. 发明授权
    • Nonvolatile memory with a programmable output of selectable width and a
method for controlling the nonvolatile memory to switch between
different output widths
    • 具有可选择宽度的可编程输出的非易失性存储器和用于控制非易失性存储器在不同输出宽度之间切换的方法
    • US5504875A
    • 1996-04-02
    • US32686
    • 1993-03-17
    • Duane R. MillsPeter K. Hazen
    • Duane R. MillsPeter K. Hazen
    • G06F12/04G11C5/00G11C7/10G06F12/00
    • G11C7/1006G06F12/04
    • A nonvolatile memory and a method for controlling the nonvolatile memory to switch between first and second data widths are described. The nonvolatile memory includes a first memory array, a second memory array, a first plurality of data pads, and a second plurality of data pads. A data width control circuit selectively couples the first and second plurality of data pads to the first and second memory arrays. A data width configuration cell is provided for configuring data width of the nonvolatile memory. A data width select circuit controls the data width control circuit to selectively couple the first and second plurality of data pads to the first and second memory arrays under the control of the data width configuration cell. When the data width configuration cell is in a first state, the first and second memory arrays are coupled to the first and second plurality of data pads such that the nonvolatile memory has a first data width. When the data width configuration cell is in a second state, the first and second memory arrays are coupled to the first plurality of data pads such that the nonvolatile memory has a second data width.
    • 描述了非易失性存储器和用于控制非易失性存储器以在第一和第二数据宽度之间切换的方法。 非易失性存储器包括第一存储器阵列,第二存储器阵列,第一多个数据焊盘和第二多个数据焊盘。 数据宽度控制电路选择性地将第一和第二多个数据焊盘耦合到第一和第二存储器阵列。 提供了用于配置非易失性存储器的数据宽度的数据宽度配置单元。 数据宽度选择电路控制数据宽度控制电路,以在数据宽度配置单元的控制下选择性地将第一和第二多个数据焊盘耦合到第一和第二存储器阵列。 当数据宽度配置单元处于第一状态时,第一和第二存储器阵列耦合到第一和第二多个数据焊盘,使得非易失性存储器具有第一数据宽度。 当数据宽度配置单元处于第二状态时,第一和第二存储器阵列耦合到第一多个数据焊盘,使得非易失性存储器具有第二数据宽度。