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1. 发明授权

US08516318B2 Dynamic scan 失效
标题翻译：动态扫描
公开(公告)号：US08516318B2
公开(公告)日：2013-08-20
申请号：US12968627
申请日：2010-12-15
申请人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
发明人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
IPC分类号： G06F11/00
CPC分类号： G01R31/318558
摘要： In a test data access system, a shift register is coupled the test data in pin. A first multiplexer is in data communication with the TDI pin and is configured to receive data from the TDI pin and to transmit data to each of the instruments. The first multiplexer is also configured to receive data from a data recirculation bit and to transmit data from the TDI pin to a plurality of instruments when the recirculation bit has a first value and to transmit data to the plurality of instruments from a recirculation line when the recirculation bit has a second value, different from the first value. A second multiplexer is configured to receive data from each of the plurality of instruments and is configured to transmit data from a selected one of the plurality of instruments, selected based on a value of data in the shift register. A first AND gate is configured to generate a gates clock to the shift register. A second AND gate is responsive to the first AND gate, configured to lock the shift register. A third AND gate, responsive to the first AND gate, is configured to control clocking to the plurality of instruments.
摘要翻译：在测试数据访问系统中，移位寄存器以引脚方式耦合测试数据。第一个多路复用器与TDI引脚进行数据通信，并配置为从TDI引脚接收数据并向每个仪器传输数据。第一多路复用器还被配置为从数据再循环位接收数据，并且当再循环位具有第一值时将数据从TDI引脚传输到多个仪器，并且当第二复用器当再循环线时将数据从再循环管线传送到多个仪器再循环位具有与第一值不同的第二值。第二多路复用器被配置为从所述多个仪器中的每一个接收数据，并且被配置为基于所述移位寄存器中的数据值来选择所选择的所述多个仪器中的数据。第一与门被配置为向移位寄存器产生门时钟。第二与门响应于第一与门，被配置为锁定移位寄存器。响应于第一与门的第三与门配置成控制对多个仪器的时钟。

2. 发明授权

US08627162B2 Iimplementing enhanced aperture function calibration for logic built in self test (LBIST) 有权
标题翻译：实现内置自检逻辑（LBIST）逻辑的增强孔径功能校准
公开(公告)号：US08627162B2
公开(公告)日：2014-01-07
申请号：US13316620
申请日：2011-12-12
申请人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
发明人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
IPC分类号： G01R31/28
CPC分类号： G01R31/318385 , G01R31/318547 , G01R31/3187
摘要： A method and circuits for implementing aperture function calibration for Logic Built In Self Test (LBIST) diagnostics, and a design structure on which the subject circuit resides are provided. The aperture function calibration uses aperture calibration data, and an LBIST calibration channel having a predefined number of scan inversions between the aperture calibration data and a multiple input signature register (MISR). LBIST is run selecting the LBIST calibration channel and masking other LBIST channels to the MISR. A change in the MISR value, for example, from zero to a non-zero value, is identified and an aperture adjustment is calculated and used to identify any needed adjustment of aperture edges.
摘要翻译：用于实现逻辑内置自检（LBIST）诊断的孔径函数校准的方法和电路，以及提供主题电路所在的设计结构。孔径功能校准使用孔径校准数据，以及LBIST校准通道，其具有孔径校准数据和多输入特征寄存器（MISR）之间的预定数量的扫描反转。 LBIST运行选择LBIST校准通道，并将其他LBIST通道屏蔽到MISR。识别MISR值的变化，例如从零到非零值，并且计算孔径调整并用于识别孔径边缘的任何所需的调整。

3. 发明申请

US20130191695A1 IMPLEMENTING ENHANCED PSEUDO RANDOM PATTERN GENERATORS WITH HIERARCHICAL LINEAR FEEDBACK SHIFT REGISTERS (LFSRs) 有权
标题翻译：实现具有分层线性反馈移位寄存器（LFSR）的增强型PSEUDO随机模式发生器
公开(公告)号：US20130191695A1
公开(公告)日：2013-07-25
申请号：US13353727
申请日：2012-01-19
申请人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
发明人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
IPC分类号： G06F11/27
CPC分类号： G06F11/27 , G01R31/318385
摘要： A method and circuit for implementing enhanced Logic Built In Self Test (LBIST) diagnostics, and a design structure on which the subject circuit resides are provided. A plurality of pseudo random pattern generators (PRPGs) is provided, each PRPG comprising one or more linear feedback shift registers (LFSRs). Each respective PRPG includes an XOR feedback input selectively receiving a feedback from another PRPG and predefined inputs of the respective PRPG. A respective XOR spreading function is coupled to a plurality of outputs of each PRPG with predefined XOR spreading functions applying test pseudo random pattern inputs to LBIST channels for LBIST diagnostics.
摘要翻译：一种用于实现增强型逻辑内置自检（LBIST）诊断的方法和电路，以及提供主题电路所在的设计结构。提供了多个伪随机模式发生器（PRPG），每个PRPG包括一个或多个线性反馈移位寄存器（LFSR）。每个相应的PRPG包括选择性地接收来自另一PRPG的反馈和相应PRPG的预定义输入的异或反馈输入。相应的XOR扩展功能被耦合到每个PRPG的多个输出，其中预定义的XOR扩展函数将测试伪随机模式输入应用于LBIST通道用于LBIST诊断。

4. 发明申请

US20130151918A1 IIMPLEMENTING ENHANCED APERTURE FUNCTION CALIBRATION FOR LOGIC BUILT IN SELF TEST (LBIST) 有权
标题翻译：自动测试（LBIST）中的逻辑内置增强功能校准功能
公开(公告)号：US20130151918A1
公开(公告)日：2013-06-13
申请号：US13316620
申请日：2011-12-12
申请人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer , James M. Worisek
发明人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer , James M. Worisek
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/318385 , G01R31/318547 , G01R31/3187
摘要： A method and circuits for implementing aperture function calibration for Logic Built In Self Test (LBIST) diagnostics, and a design structure on which the subject circuit resides are provided. The aperture function calibration uses aperture calibration data, and an LBIST calibration channel having a predefined number of scan inversions between the aperture calibration data and a multiple input signature register (MISR). LBIST is run selecting the LBIST calibration channel and masking other LBIST channels to the MISR. A change in the MISR value, for example, from zero to a non-zero value, is identified and an aperture adjustment is calculated and used to identify any needed adjustment of aperture edges.
摘要翻译：用于实现逻辑内置自检（LBIST）诊断的孔径函数校准的方法和电路，以及提供主题电路所在的设计结构。孔径功能校准使用孔径校准数据，以及LBIST校准通道，其具有孔径校准数据和多输入特征寄存器（MISR）之间的预定数量的扫描反转。 LBIST运行选择LBIST校准通道，并将其他LBIST通道屏蔽到MISR。识别MISR值的变化，例如从零到非零值，并且计算孔径调整并用于识别孔径边缘的任何所需的调整。

5. 发明授权

US08762803B2 Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs) 有权
标题翻译：使用分层线性反馈移位寄存器（LFSR）实现增强型伪随机模式生成器
公开(公告)号：US08762803B2
公开(公告)日：2014-06-24
申请号：US13353727
申请日：2012-01-19
申请人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
发明人： Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
IPC分类号： G01R31/28
CPC分类号： G06F11/27 , G01R31/318385
摘要： A method and circuit for implementing enhanced Logic Built In Self Test (LBIST) diagnostics, and a design structure on which the subject circuit resides are provided. A plurality of pseudo random pattern generators (PRPGs) is provided, each PRPG comprising one or more linear feedback shift registers (LFSRs). Each respective PRPG includes an XOR feedback input selectively receiving a feedback from another PRPG and predefined inputs of the respective PRPG. A respective XOR spreading function is coupled to a plurality of outputs of each PRPG with predefined XOR spreading functions applying test pseudo random pattern inputs to LBIST channels for LBIST diagnostics.
摘要翻译：一种用于实现增强型逻辑内置自检（LBIST）诊断的方法和电路，以及提供主题电路所在的设计结构。提供了多个伪随机模式发生器（PRPG），每个PRPG包括一个或多个线性反馈移位寄存器（LFSR）。每个相应的PRPG包括选择性地接收来自另一PRPG的反馈和相应PRPG的预定义输入的异或反馈输入。相应的XOR扩展功能被耦合到每个PRPG的多个输出，其中预定义的XOR扩展函数将测试伪随机模式输入应用于LBIST通道用于LBIST诊断。

6. 发明申请

US20120159273A1 Dynamic Scan 失效
标题翻译：动态扫描
公开(公告)号：US20120159273A1
公开(公告)日：2012-06-21
申请号：US12968627
申请日：2010-12-15
申请人： Steven M. Douskey , Ryan Andrew Fitch , Michael J. Hamilton , Amanda R. Kaufer
发明人： Steven M. Douskey , Ryan Andrew Fitch , Michael J. Hamilton , Amanda R. Kaufer
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/318558
摘要： In a test data access system, a shift register is coupled the test data in pin. A first multiplexer is in data communication with the TDI pin and is configured to receive data from the TDI pin and to transmit data to each of the instruments. The first multiplexer is also configured to receive data from a data recirculation bit and to transmit data from the TDI pin to a plurality of instruments when the recirculation bit has a first value and to transmit data to the plurality of instruments from a recirculation line when the recirculation bit has a second value, different from the first value. A second multiplexer is configured to receive data from each of the plurality of instruments and is configured to transmit data from a selected one of the plurality of instruments, selected based on a value of data in the shift register. A first AND gate is configured to generate a gates clock to the shift register. A second AND gate is responsive to the first AND gate, configured to lock the shift register. A third AND gate, responsive to the first AND gate, is configured to control clocking to the plurality of instruments.
摘要翻译：在测试数据访问系统中，移位寄存器以引脚方式耦合测试数据。第一个多路复用器与TDI引脚进行数据通信，并配置为从TDI引脚接收数据并向每个仪器传输数据。第一多路复用器还被配置为从数据再循环位接收数据，并且当再循环位具有第一值时将数据从TDI引脚传输到多个仪器，并且当第二复用器当再循环线时将数据从再循环管线传送到多个仪器再循环位具有与第一值不同的第二值。第二多路复用器被配置为从所述多个仪器中的每一个接收数据，并且被配置为基于所述移位寄存器中的数据值来选择所选择的所述多个仪器中的数据。第一与门被配置为向移位寄存器产生门时钟。第二与门响应于第一与门，被配置为锁定移位寄存器。响应于第一与门的第三与门配置成控制对多个仪器的时钟。

7. 发明授权

US07514947B2 Method of and system for functionally testing multiple devices in parallel in a burn-in-environment 失效
标题翻译：在烧录环境中并行功能测试多个设备的方法和系统
公开(公告)号：US07514947B2
公开(公告)日：2009-04-07
申请号：US11848282
申请日：2007-08-31
申请人： Jason T. Albert , William T. Bronk , Timothy J. Eby , Michael J. Hamilton , Norman K. James
发明人： Jason T. Albert , William T. Bronk , Timothy J. Eby , Michael J. Hamilton , Norman K. James
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R31/2868
摘要： A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven.
摘要翻译：用于半导体器件测试的方法和系统将多个器件加热到老化温度，并且在老化温度下对多个器件并行地执行功能测试。系统包括一个老化炉和一个测试复用器。老化烤箱适用于将设备接收并加热到老化温度。测试多路复用器适用于将功能测试信号应用于老化炉中的设备并从其接收输出信号。

8. 发明申请

US20090058450A1 METHOD OF AND SYSTEM FOR FUNCTIONALLY TESTING MULTIPLE DEVICES IN PARALLEL IN A BURN-IN-ENVIRONMENT 失效
标题翻译：功能测试多个设备并行连接在环境中的方法和系统
公开(公告)号：US20090058450A1
公开(公告)日：2009-03-05
申请号：US11848282
申请日：2007-08-31
申请人： Jason T. Albert , William T. Bronk , Timothy J. Eby , Michael J. Hamilton , Norman K. James
发明人： Jason T. Albert , William T. Bronk , Timothy J. Eby , Michael J. Hamilton , Norman K. James
IPC分类号： G01R31/26
CPC分类号： G01R31/2868
摘要： A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven.
摘要翻译：用于半导体器件测试的方法和系统将多个器件加热到老化温度，并且在老化温度下对多个器件并行地执行功能测试。系统包括一个老化炉和一个测试复用器。老化烤箱适用于将设备接收并加热到老化温度。测试多路复用器适用于将功能测试信号应用于老化炉中的设备并从其接收输出信号。

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