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    • 5. 发明授权
    • Selecting metrics for substrate classification
    • 选择底物分类的指标
    • US08917930B2
    • 2014-12-23
    • US13466170
    • 2012-05-08
    • Steven J SimskeMalgorzata M SturgillGuy AdamsPaul S Everest
    • Steven J SimskeMalgorzata M SturgillGuy AdamsPaul S Everest
    • G06K9/00
    • G06K9/00577
    • Methods for selecting metrics for substrate classification, and apparatus to perform such methods. The methods include determining a value of a metric from an image of a substrate sample for each substrate sample of a plurality of substrate samples, wherein the metric is indicative of a surface texture of each substrate sample and iteratively assigning substrate samples of the plurality of substrate samples to an aggregate of a particular number of aggregates in response to a value of the metric for each substrate sample until a convergence of clustering is deemed achieved, then determining an indication of cluster tightness of the particular number of aggregates. The methods further include selecting or ignoring the metric for substrate classification in response to the indication of cluster tightness of the particular number of aggregates.
    • 用于选择底物分类的度量的方法以及执行这些方法的装置。 所述方法包括从多个衬底样品的每个衬底样品的衬底样品的图像中确定度量的值,其中度量指示每个衬底样品的表面纹理并迭代地分配多个衬底的衬底样品 响应于每个底物样品的度量的值而将样品聚集到特定数量的聚集体,直到聚类的收敛被认为实现,然后确定特定数目的聚集体的聚类紧密度的指示。 所述方法还包括响应于特定数量的聚集体的簇紧密度的指示来选择或忽略用于底物分类的度量。