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    • 6. 发明授权
    • I/O circuit calibration method and associated apparatus
    • I / O电路校准方法及相关设备
    • US08482293B2
    • 2013-07-09
    • US12889017
    • 2010-09-23
    • Eer-Wen TyanMing-Chieh Yeh
    • Eer-Wen TyanMing-Chieh Yeh
    • G01R35/00
    • H04L25/029
    • An I/O calibration method and an apparatus are provided for calibrating a driving impedance at an output end of an I/O circuit in a chip. The chip further includes a plurality of basic impedances and a non-volatile memory. The I/O circuit calibration method includes: measuring an impedance value of one basic impedance and recording the measured impedance value in the non-volatile memory; synthesizing a calibration impedance by selectively conducting the basic impedance(s); adjusting the number of the conducted basic impedance(s) in the calibration impedance and estimating an impedance value of the driving impedance according to the measured result and a voltage divided by the calibration impedance and the driving impedance at the output end.
    • 提供I / O校准方法和装置,用于校准芯片中的I / O电路的输出端的驱动阻抗。 芯片还包括多个基本阻抗和非易失性存储器。 I / O电路校准方法包括:测量一个基本阻抗的阻抗值,并将测得的阻抗值记录在非易失性存储器中; 通过选择性地传导基本阻抗来合成校准阻抗; 调整校准阻抗中传导的基本阻抗的数量,并根据测量结果估计驱动阻抗的阻抗值,并将电压除以校准阻抗和输出端的驱动阻抗。
    • 8. 发明申请
    • I/O Circuit Calibration Method and Associated Apparatus
    • I / O电路校准方法及相关设备
    • US20110074520A1
    • 2011-03-31
    • US12889017
    • 2010-09-23
    • Eer-Wen TyanMing-Chieh Yeh
    • Eer-Wen TyanMing-Chieh Yeh
    • H03H7/38
    • H04L25/029
    • An I/O calibration method and an apparatus are provided for calibrating a driving impedance at an output end of an I/O circuit in a chip. The chip further includes a plurality of basic impedances and a non-volatile memory. The I/O circuit calibration method includes: measuring an impedance value of one basic impedance and recording the measured impedance value in the non-volatile memory; synthesizing a calibration impedance by selectively conducting the basic impedance(s); adjusting the number of the conducted basic impedance(s) in the calibration impedance and estimating an impedance value of the driving impedance according to the measured result and a voltage divided by the calibration impedance and the driving impedance at the output end.
    • 提供I / O校准方法和装置,用于校准芯片中的I / O电路的输出端的驱动阻抗。 芯片还包括多个基本阻抗和非易失性存储器。 I / O电路校准方法包括:测量一个基本阻抗的阻抗值,并将测得的阻抗值记录在非易失性存储器中; 通过选择性地传导基本阻抗来合成校准阻抗; 调整校准阻抗中传导的基本阻抗的数量,并根据测量结果估计驱动阻抗的阻抗值,并将电压除以校准阻抗和输出端的驱动阻抗。