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1. 发明申请

US20080277280A1 DEVICE FOR ANALYSIS OF A SAMPLE ON A TEST ELEMENT 有权
标题翻译：用于分析测试元件上的样品的装置
公开(公告)号：US20080277280A1
公开(公告)日：2008-11-13
申请号：US12105993
申请日：2008-04-18
申请人： Stefan Riebel , Manfred Augstein , Gregor Bainczyk , Albert Grosser , Oliver Kube , Dieter Meinecke , Bruno Thos , Herbert Wieder
发明人： Stefan Riebel , Manfred Augstein , Gregor Bainczyk , Albert Grosser , Oliver Kube , Dieter Meinecke , Bruno Thos , Herbert Wieder
IPC分类号： G01N27/30
CPC分类号： G01N33/48785 , A61B5/14532
摘要： An analysis device for analysis of a sample on a test element is provided that comprises at least one component configured to make electrical contact with at least one other component for electrical transmission therebetween. The at least one component generally comprises an injection-molded circuit mount, also called an MID, or molded interconnect device.
摘要翻译：提供了一种用于分析测试元件上的样本的分析装置，其包括被配置为与至少一个其它部件电接触的至少一个部件，用于在它们之间进行电传输。所述至少一个部件通常包括注射成型电路安装件，也称为MID或模制的互连装置。

2. 发明授权

US08330046B2 Device for analysis of a sample on a test element 有权
标题翻译：用于分析测试元件上的样品的设备
公开(公告)号：US08330046B2
公开(公告)日：2012-12-11
申请号：US12105993
申请日：2008-04-18
申请人： Stefan Riebel , Manfred Augstein , Gregor Bainczyk , Albert Grosser , Oliver Kube , Dieter Meinecke , Bruno Thös , Herbert Wieder
发明人： Stefan Riebel , Manfred Augstein , Gregor Bainczyk , Albert Grosser , Oliver Kube , Dieter Meinecke , Bruno Thös , Herbert Wieder
IPC分类号： H01B5/14
CPC分类号： G01N33/48785 , A61B5/14532
摘要： An analysis device for analysis of a sample on a test element is provided that comprises at least one component configured to make electrical contact with at least one other component for electrical transmission therebetween. The at least one component generally comprises an injection-molded circuit mount, also called an MID, or molded interconnect device.
摘要翻译：提供了一种用于分析测试元件上的样本的分析装置，其包括被配置为与至少一个其它部件电接触的至少一个部件，用于在它们之间进行电传输。所述至少一个部件通常包括注射成型电路安装件，也称为MID或模制的互连装置。

3. 发明授权

US08545774B2 Electrical connection system for an electrochemical analysis system 有权
标题翻译：电化学分析系统的电气连接系统
公开(公告)号：US08545774B2
公开(公告)日：2013-10-01
申请号：US12791500
申请日：2010-06-01
申请人： Stefan Riebel , Bruno Robert Thoes , Manfred Augstein , Herbert Wieder , Gregor Bainczyk
发明人： Stefan Riebel , Bruno Robert Thoes , Manfred Augstein , Herbert Wieder , Gregor Bainczyk
IPC分类号： B01L99/00 , G01N15/06 , G01N27/00
CPC分类号： G01N33/4875 , Y10T29/49002
摘要： An electrical connection system for an analysis system and a method for analysis of a liquid sample on an analytical test element using the described analysis system are disclosed. The analysis system provides an evaluation appliance for evaluation of electrical signals, a test element holder for holding and positioning of an analytical test element in a measurement position, and an electrical contact element which makes electrical contact with an electrical contact surface of an analytical test element to produce an electrical connection between the contact surface and the evaluation appliance. The contact element is moved by means such that contact with the electrical contact surface of the test element is made when the test element holder is in the measurement position.
摘要翻译：公开了一种用于分析系统的电连接系统和使用所述分析系统分析测试元件上的液体样品的方法。分析系统提供用于评估电信号的评估装置，用于在测量位置保持和定位分析测试元件的测试元件保持器，以及与分析测试元件的电接触表面电接触的电接触元件以在接触表面和评估设备之间产生电连接。接触元件通过使得当测试元件保持器处于测量位置时与测试元件的电接触表面的接触而移动。

4. 发明申请

US20060152207A1 Electrical connection system for an electrochemical analysis system 失效
标题翻译：电化学分析系统的电气连接系统
公开(公告)号：US20060152207A1
公开(公告)日：2006-07-13
申请号：US11295187
申请日：2005-12-06
申请人： Stefan Riebel , Bruno Thoes , Manfred Augstein , Herbert Wieder , Gregor Bainczyk
发明人： Stefan Riebel , Bruno Thoes , Manfred Augstein , Herbert Wieder , Gregor Bainczyk
IPC分类号： G01N27/00
CPC分类号： G01N33/4875 , Y10T29/49002
摘要： The invention relates to an electrical connection system for an analysis system and a method for analysis of a liquid sample on an analytical test element using the described analysis system. The analysis system comprises an evaluation appliance for evaluation of electrical signals, a test element holder for holding and positioning of an analytical test element in a measurement position, and at least one electrical contact element configured to make electrical contact with at least one electrical contact surface of an analytical test element, and to produce an electrical connection between the contact surface and the evaluation appliance. The at least one contact element is arranged to move to contact the contact surface of a test element held either in a fixed test element holder or a moveable test element holder, such as a slide. Furthermore, the analysis system has a means for moving the electrical contact element to the electrical contact surface of an analytical test element when the test element holder is in the measurement position.
摘要翻译：本发明涉及用于分析系统的电连接系统和使用所述分析系统分析测试元件上的液体样品的方法。分析系统包括用于评估电信号的评估装置，用于在测量位置保持和定位分析测试元件的测试元件保持器，以及配置成与至少一个电接触表面进行电接触的至少一个电接触元件的分析测试元件，并且在接触表面和评估设备之间产生电连接。所述至少一个接触元件布置成移动以接触保持在固定测试元件保持器或可移动测试元件保持器（例如滑块）中的测试元件的接触表面。此外，分析系统具有当测试元件保持器处于测量位置时将电接触元件移动到分析测试元件的电接触表面的装置。

5. 发明申请

US20100236941A1 ELECTRICAL CONNECTION SYSTEM FOR AN ELECTROCHEMICAL ANALYSIS SYSTEM 有权
标题翻译：电化学分析系统电气连接系统
公开(公告)号：US20100236941A1
公开(公告)日：2010-09-23
申请号：US12791500
申请日：2010-06-01
申请人： Stefan Riebel , Bruno Robert Thoes , Manfred Augstein , Herbert Wieder , Gregor Bainczyk
发明人： Stefan Riebel , Bruno Robert Thoes , Manfred Augstein , Herbert Wieder , Gregor Bainczyk
IPC分类号： G01N27/26 , H05K13/00
CPC分类号： G01N33/4875 , Y10T29/49002
摘要： An electrical connection system for an analysis system and a method for analysis of a liquid sample on an analytical test element using the described analysis system are disclosed. The analysis system provides an evaluation appliance for evaluation of electrical signals, a test element holder for holding and positioning of an analytical test element in a measurement position, and an electrical contact element which makes electrical contact with an electrical contact surface of an analytical test element to produce an electrical connection between the contact surface and the evaluation appliance. The contact element is moved by means such that contact with the electrical contact surface of the test element is made when the test element holder is in the measurement position.
摘要翻译：公开了一种用于分析系统的电连接系统和使用所述分析系统分析测试元件上的液体样品的方法。分析系统提供用于评估电信号的评估装置，用于在测量位置保持和定位分析测试元件的测试元件保持器，以及与分析测试元件的电接触表面电接触的电接触元件以在接触表面和评估设备之间产生电连接。接触元件通过使得当测试元件保持器处于测量位置时与测试元件的电接触表面的接触而移动。

6. 发明授权

US07754152B2 Electrical connection system for electrochemical analysis system 失效
标题翻译：电化学分析系统电气连接系统
公开(公告)号：US07754152B2
公开(公告)日：2010-07-13
申请号：US11295187
申请日：2005-12-06
申请人： Stefan Riebel , Bruno Robert Thoes , Manfred Augstein , Herbert Wieder , Gregor Bainczyk
发明人： Stefan Riebel , Bruno Robert Thoes , Manfred Augstein , Herbert Wieder , Gregor Bainczyk
IPC分类号： G01N27/00
CPC分类号： G01N33/4875 , Y10T29/49002
摘要： The invention relates to an electrical connection system for an analysis system and a method for analysis of a liquid sample on an analytical test element using the described analysis system. The analysis system comprises an evaluation appliance for evaluation of electrical signals, a test element holder for holding and positioning of an analytical test element in a measurement position, and at least one electrical contact element configured to make electrical contact with at least one electrical contact surface of an analytical test element, and to produce an electrical connection between the contact surface and the evaluation appliance. The at least one contact element is arranged to move to contact the contact surface of a test element held either in a fixed test element holder or a moveable test element holder, such as a slide. Furthermore, the analysis system has a means for moving the electrical contact element to the electrical contact surface of an analytical test element when the test element holder is in the measurement position.
摘要翻译：本发明涉及用于分析系统的电连接系统和使用所述分析系统分析测试元件上的液体样品的方法。分析系统包括用于评估电信号的评估装置，用于在测量位置保持和定位分析测试元件的测试元件保持器，以及配置成与至少一个电接触表面进行电接触的至少一个电接触元件的分析测试元件，并且在接触表面和评估设备之间产生电连接。所述至少一个接触元件布置成移动以接触保持在固定测试元件保持器或可移动测试元件保持器（例如滑块）中的测试元件的接触表面。此外，分析系统具有当测试元件保持器处于测量位置时将电接触元件移动到分析测试元件的电接触表面的装置。

7. 发明申请

US20050129574A1 Rapid diagnosis device with locking by test strip 有权
标题翻译：快速诊断装置，带测试条锁定
公开(公告)号：US20050129574A1
公开(公告)日：2005-06-16
申请号：US11003162
申请日：2004-12-03
申请人： Stefan Riebel , Manfred Augstein , Rainer Stohar
发明人： Stefan Riebel , Manfred Augstein , Rainer Stohar
IPC分类号： G01N21/75 , G01N21/01 , G01N27/327 , G01N33/487 , G01N31/22
CPC分类号： G01N33/4875
摘要： The invention relates to a rapid diagnosis device with a device housing, on which there is provided a push-in opening for a test strip. The test strip is evaluated inside the rapid diagnosis device. On the device housing there is formed a housing opening, which can be closed by a cover or flap element. The cover or flap element is assigned a locking body. The locking body is formed as a spring element which comprises a clip portion, which assumes a position locking the spring element when the test strip has been pushed into the push-in opening of the rapid diagnosis device.
摘要翻译：本发明涉及一种具有装置壳体的快速诊断装置，其上设置有用于测试条的推入式开口。测试条在快速诊断装置内进行评估。在设备壳体上形成有壳体开口，其可以由盖或挡板元件封闭。盖或挡板元件被分配有锁定体。锁定体形成为弹簧元件，弹簧元件包括夹子部分，当夹具被推入快速诊断装置的推入开口中时，该夹持部分采取锁定弹簧元件的位置。

8. 发明授权

US08673213B2 Test element analysis system with contact surfaces coated with hard material 有权
标题翻译：测试元素分析系统，接触表面涂有硬质材料
公开(公告)号：US08673213B2
公开(公告)日：2014-03-18
申请号：US11507327
申请日：2006-08-21
申请人： Manfred Augstein , Joerg Dreibholz , Stefan Riebel
发明人： Manfred Augstein , Joerg Dreibholz , Stefan Riebel
IPC分类号： G01N27/00
CPC分类号： G01N27/26 , G01N33/4875
摘要： The invention concerns a test element analytical system for the analytical examination of a sample, especially a body fluid, comprising at least one test element with one or more measuring zones and contact areas located on the test element, in particular electrodes or conductor paths, the sample to be examined being brought into the measuring zone to carry out an analysis in order to determine a characteristic measured quantity for the analysis, and an evaluation instrument with a test element holder for positioning the test element in a measuring position and a measuring device for measuring the characteristic change, the test element holder containing contact elements with contact areas which enable an electrical contact between the contact areas of the test element and the contact areas of the test element holder, characterized in that one of these contact areas is provided with an electrically conductive hard material surface.
摘要翻译：本发明涉及一种用于对样品，特别是体液的分析检查的测试元件分析系统，其包括至少一个具有一个或多个测量区域的测试元件和位于测试元件，特别是电极或导体路径上的接触区域，要检查的样品进入测量区域进行分析，以确定用于分析的特征测量量，以及具有用于将测试元件定位在测量位置的测试元件保持器的评估仪器和用于测量特性变化，所述测试元件保持器包含具有接触区域的接触元件，所述接触元件能够使所述测试元件的接触区域与所述测试元件保持器的接触区域之间的电接触，其特征在于，所述接触区域中的一个设置有导电硬质材料表面。

9. 发明授权

US07767144B2 Rapid diagnosis device with locking by test strip 有权
标题翻译：快速诊断装置，带测试条锁定
公开(公告)号：US07767144B2
公开(公告)日：2010-08-03
申请号：US11003162
申请日：2004-12-03
申请人： Stefan Riebel , Manfred Augstein , Rainer Stöhar
发明人： Stefan Riebel , Manfred Augstein , Rainer Stöhar
IPC分类号： G01N33/00
CPC分类号： G01N33/4875
摘要： The invention relates to a rapid diagnosis device with a device housing, on which there is provided a push-in opening for a test strip. The test strip is evaluated inside the rapid diagnosis device. On the device housing there is formed a housing opening, which can be closed by a cover or flap element. The cover or flap element is assigned a locking body. The locking body is formed as a spring element which comprises a clip portion, which assumes a position locking the spring element when the test strip has been pushed into the push-in opening of the rapid diagnosis device.
摘要翻译：本发明涉及一种具有装置壳体的快速诊断装置，其上设置有用于测试条的推入式开口。测试条在快速诊断装置内进行评估。在设备壳体上形成有壳体开口，其可以由盖或挡板元件封闭。盖或挡板元件被分配有锁定体。锁定体形成为弹簧元件，弹簧元件包括夹子部分，当夹具被推入快速诊断装置的推入开口中时，该夹持部分采取锁定弹簧元件的位置。

10. 发明申请

US20070202007A1 Test element analysis system with contact surfaces coated with hard material 有权
标题翻译：测试元素分析系统，接触表面涂有硬质材料
公开(公告)号：US20070202007A1
公开(公告)日：2007-08-30
申请号：US11507327
申请日：2006-08-21
申请人： Manfred Augstein , Joerg Dreibholz , Stefan Riebel
发明人： Manfred Augstein , Joerg Dreibholz , Stefan Riebel
IPC分类号： G01N27/00
CPC分类号： G01N27/26 , G01N33/4875
摘要： The invention concerns a test element analytical system for the analytical examination of a sample, especially a body fluid, comprising at least one test element with one or more measuring zones and contact areas located on the test element, in particular electrodes or conductor paths, the sample to be examined being brought into the measuring zone to carry out an analysis in order to determine a characteristic measured quantity for the analysis, and an evaluation instrument with a test element holder for positioning the test element in a measuring position and a measuring device for measuring the characteristic change, the test element holder containing contact elements with contact areas which enable an electrical contact between the contact areas of the test element and the contact areas of the test element holder, characterized in that one of these contact areas is provided with an electrically conductive hard material surface.
摘要翻译：本发明涉及一种用于对样品，特别是体液的分析检查的测试元件分析系统，其包括至少一个具有一个或多个测量区域的测试元件和位于测试元件，特别是电极或导体路径上的接触区域，要检查的样品进入测量区域进行分析，以确定用于分析的特征测量量，以及具有用于将测试元件定位在测量位置的测试元件保持器的评估仪器和用于测量特性变化，所述测试元件保持器包含具有接触区域的接触元件，所述接触元件能够使所述测试元件的接触区域与所述测试元件保持器的接触区域之间的电接触，其特征在于，所述接触区域中的一个设置有导电硬质材料表面。

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