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    • 3. 发明申请
    • Energy Dispersive X-Ray I-FET SDD Detector Appliance and a Method for Pulsed Reset Neutralization of Accumulated Charges Within an Energy Dispersive X-Ray I-FET SDD Detector Appliance
    • 能量分散型X射线I-FET SDD检测器装置和一种能量分散X射线I-FET SDD检测器装置内脉冲重复中和累积电荷的方法
    • US20080217543A1
    • 2008-09-11
    • US12015702
    • 2008-01-17
    • Martin Rohde
    • Martin Rohde
    • G01T1/24
    • G01T1/24
    • The present invention is directed to an energy dispersive X-ray detector appliance and a method for pulsed reset of said appliance. The present invention provides a ramp-and-neutralize cycled I-FET SDD in which the voltage dependency and nonlinearity due to the integrated FET is reduced via a compensation circuit to a level that can be handled by a correction circuit. The correction circuit does not substantially add noise or other kinds of erroneous signals. Accordingly, the appliance comprises a silicon drift detector with internal field effect transistor I-FET SDD, a compensation circuit for compensating nonlinearities in the I-FET SDD; and a neutralizing circuit adapted to neutralize accumulated charges in I-FET SDD comprising means for pulsed reset of the detector.
    • 本发明涉及一种能量色散X射线检测器装置和用于所述器具的脉冲复位的方法。 本发明提供了一种斜坡和中和循环I-FET SDD,其中通过补偿电路将由集成FET产生的电压依赖性和非线性度降低到可被校正电路处理的水平。 校正电路基本上不增加噪声或其他类型的错误信号。 因此,该器具包括具有内部场效应晶体管I-FET SDD的硅漂移检测器,用于补偿I-FET SDD中的非线性的补偿电路; 以及适于中和I-FET SDD中的累积电荷的中和电路,包括用于检测器的脉冲复位的装置。
    • 5. 发明授权
    • Energy dispersive X-ray I-FET SDD detector appliance and a method for pulsed reset neutralization of accumulated charges within an energy dispersive X-ray I-FET SDD detector appliance
    • 能量色散X射线I-FET SDD检测器装置和用于脉冲复位中和能量色散X射线I-FET SDD检测器装置内的累积电荷的方法
    • US07858946B2
    • 2010-12-28
    • US12015702
    • 2008-01-17
    • Martin Rohde
    • Martin Rohde
    • H01L27/144
    • G01T1/24
    • The present invention is directed to an energy dispersive X-ray detector appliance and a method for pulsed reset of said appliance. The present invention provides a ramp-and-neutralize cycled I-FET SDD in which the voltage dependency and nonlinearity due to the integrated FET is reduced via a compensation circuit to a level that can be handled by a correction circuit. The correction circuit does not substantially add noise or other kinds of erroneous signals. Accordingly, the appliance comprises a silicon drift detector with internal field effect transistor I-FET SDD, a compensation circuit for compensating nonlinearities in the I-FET SDD; and a neutralizing circuit adapted to neutralize accumulated charges in I-FET SDD comprising means for pulsed reset of the detector.
    • 本发明涉及一种能量色散X射线检测器装置和用于所述器具的脉冲复位的方法。 本发明提供了一种斜坡和中和循环I-FET SDD,其中通过补偿电路将由集成FET产生的电压依赖性和非线性度降低到可被校正电路处理的水平。 校正电路基本上不增加噪声或其他类型的错误信号。 因此,该器具包括具有内部场效应晶体管I-FET SDD的硅漂移检测器,用于补偿I-FET SDD中的非线性的补偿电路; 以及适于中和I-FET SDD中的累积电荷的中和电路,包括用于检测器的脉冲复位的装置。