会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Laser beam tertiary positioner apparatus and method
    • 激光束三次定位器装置及方法
    • US06706999B1
    • 2004-03-16
    • US10373232
    • 2003-02-24
    • Spencer B. BarrettMark A. UnrathDonald R. Cutler
    • Spencer B. BarrettMark A. UnrathDonald R. Cutler
    • B23K2606
    • B23K26/0876B23K26/02B23K26/042B23K26/08B23K26/082B23K26/083B23K26/351B23K26/389B23K2101/40
    • A tertiary positioner system (80) of this invention employs X- and Y-axis translation stages (86, 88), galvanometer-driven mirrors (64, 66), and a fast steering mirror (“FSM”) (120) to direct a laser beam (90) to target locations (121) on a workpiece (92). A positioning signal is received by a low-pass filter (103) that produces filtered position data for driving the X- and Y-axis translation stages. The actual positions of the X- and Y-axis translation stages are subtracted from the unfiltered positioning data to produce an X-Y position error signal for driving the galvanometer-driven X- and Y-axis mirrors. The actual mirror positions are subtracted from the actual positions of the X- and Y-axis translation stages to generate a positional error signal representing the difference between the commanded and actual positions of the laser beam. The positional error signal drives the FSM to rapidly correct any positional errors.
    • 本发明的三次定位器系统(80)采用X轴和Y轴平移台(86,88),电流计驱动反射镜(64,66)和快速转向镜(“FSM”)(120) 激光束(90)到工件(92)上的目标位置(121)。 定位信号由低通滤波器(103)接收,该低通滤波器产生用于驱动X轴和Y轴平移级的滤波位置数据。 从未滤波的定位数据中减去X轴和Y轴平移级的实际位置,以产生用于驱动电流计驱动的X轴和Y轴镜的X-Y位置误差信号。 从X轴和Y轴平移级的实际位置中减去实际的反射镜位置,以产生表示激光束的指令位置和实际位置之间的差异的位置误差信号。 位置误差信号驱动FSM快速校正任何位置误差。
    • 2. 发明申请
    • ELECTRICAL TESTER SETUP AND CALIBRATION DEVICE
    • 电气测试仪设置和校准装置
    • US20090237091A1
    • 2009-09-24
    • US12052904
    • 2008-03-21
    • Spencer B. BarrettBrandon J. McCurryKenneth V. Almonte
    • Spencer B. BarrettBrandon J. McCurryKenneth V. Almonte
    • G01R35/00
    • G01R35/005G01R3/00G01R31/2886G01R31/31908
    • An electronic testing machine includes a plurality of test modules. Each test module has a plurality of contact pairs for testing electronic components. An apparatus and process for electrical test setup and calibration of the electronic testing machine includes a plate having at least one contact per track movable between test positions to electrically insert a test device selectively between any one contact pair, and a control program. The test device can be selected from a group consisting of a volt meter, a current meter, a precision voltage/current source, a calibration resistor, and a calibration capacitor. The control program can perform at least one test function through the plate. The test function can be selected from a group consisting of alignment verification, voltage/current source verification, insulation resistance (IR) leakage measurement verification, part-present contact check verification, capacitance and dissipation (CD) measurement verification, IR/CD compensation, and IR/CD calibration.
    • 电子测试机包括多个测试模块。 每个测试模块具有用于测试电子部件的多个接触对。 用于电子测试机器的电气测试设置和校准的装置和过程包括板,每个轨道具有至少一个触点,每个轨道可在测试位置之间移动,以在任何一个触点对之间选择性地插入测试装置和控制程序。 测试装置可以从由电压表,电流表,精密电压/电流源,校准电阻器和校准电容器组成的组中选择。 控制程序可以通过该板执行至少一个测试功能。 测试功能可以从对齐验证,电压/电流源验证,绝缘电阻(IR)泄漏测量验证,部分接触检查验证,电容和耗散(CD)测量验证,IR / CD补偿, 和IR / CD校准。
    • 3. 发明授权
    • Electrical tester setup and calibration device
    • 电气测试仪设置和校准装置
    • US07888949B2
    • 2011-02-15
    • US12052904
    • 2008-03-21
    • Spencer B. BarrettBrandon J. McCurryKenneth V. Almonte
    • Spencer B. BarrettBrandon J. McCurryKenneth V. Almonte
    • G01R35/00
    • G01R35/005G01R3/00G01R31/2886G01R31/31908
    • An electronic testing machine includes a plurality of test modules. Each test module has a plurality of contact pairs for testing electronic components. An apparatus and process for electrical test setup and calibration of the electronic testing machine includes a plate having at least one contact per track movable between test positions to electrically insert a test device selectively between any one contact pair, and a control program. The test device can be selected from a group consisting of a volt meter, a current meter, a precision voltage/current source, a calibration resistor, and a calibration capacitor. The control program can perform at least one test function through the plate. The test function can be selected from a group consisting of alignment verification, voltage/current source verification, insulation resistance (IR) leakage measurement verification, part-present contact check verification, capacitance and dissipation (CD) measurement verification, IR/CD compensation, and IR/CD calibration.
    • 电子测试机包括多个测试模块。 每个测试模块具有用于测试电子部件的多个接触对。 用于电子测试机器的电气测试设置和校准的装置和过程包括板,每个轨道具有至少一个触点,每个轨道可在测试位置之间移动,以在任何一个触点对之间选择性地插入测试装置和控制程序。 测试装置可以从由电压表,电流表,精密电压/电流源,校准电阻器和校准电容器组成的组中选择。 控制程序可以通过该板执行至少一个测试功能。 测试功能可以从对齐验证,电压/电流源验证,绝缘电阻(IR)泄漏测量验证,部分接触检查验证,电容和耗散(CD)测量验证,IR / CD补偿, 和IR / CD校准。