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1. 发明授权

US09255961B2 Semiconductor integrated circuit, operating method of semiconductor integrated circuit, and debug system 有权
公开(公告)号：US09255961B2
公开(公告)日：2016-02-09
申请号：US14080844
申请日：2013-11-15
申请人： Spansion LLC
发明人： Takashi Sato , Toshiaki Saruwatari , Ken Ryu
IPC分类号： G06F11/00 , G01R31/28 , G06F1/26 , G06F11/24 , G06F11/30 , G06F11/36
CPC分类号： G01R31/28 , G06F1/26 , G06F11/24 , G06F11/3024 , G06F11/3062 , G06F11/3636 , G06F11/3648
摘要： A current measurement unit measuring power supply currents each consumed in a plurality of circuit blocks of which at least one of the circuit blocks includes a processor, and outputting the measurement result as the power supply current values. A selection unit selecting at least one of the power supply current values according to selection information. A trace buffer sequentially holding the power supply current values being selected by the selection unit together with execution information of the processor, and sequentially outputting the held information. By selecting the power supply current values of the circuit blocks required for debugging according to the selection information, the number of external terminals of a semiconductor integrated circuit required for the debugging which includes tracing the power supply current values may be reduced. As a result, a chip size of the semiconductor integrated circuit with a debug function may be reduced.

2. 发明申请

US20140070840A1 Semiconductor Integrated Circuit, Operating Method of Semiconductor Integrated Circuit, and Debug System 有权
标题翻译：半导体集成电路，半导体集成电路的工作方法和调试系统
公开(公告)号：US20140070840A1
公开(公告)日：2014-03-13
申请号：US14080844
申请日：2013-11-15
申请人： Spansion LLC
发明人： Takashi SATO , Toshiaki Saruwatari , Ken Ryu
IPC分类号： G01R31/28
CPC分类号： G01R31/28 , G06F1/26 , G06F11/24 , G06F11/3024 , G06F11/3062 , G06F11/3636 , G06F11/3648
摘要： A current measurement unit measuring power supply currents each consumed in a plurality of circuit blocks of which at least one of the circuit blocks includes a processor, and outputting the measurement result as the power supply current values. A selection unit selecting at least one of the power supply current values according to selection information. A trace buffer sequentially holding the power supply current values being selected by the selection unit together with execution information of the processor, and sequentially outputting the held information. By selecting the power supply current values of the circuit blocks required for debugging according to the selection information, the number of external terminals of a semiconductor integrated circuit required for the debugging which includes tracing the power supply current values may be reduced. As a result, a chip size of the semiconductor integrated circuit with a debug function may be reduced.
摘要翻译：电流测量单元，测量在多个电路块中消耗的电源电流，其中至少一个电路块包括处理器，并输出测量结果作为电源电流值。选择单元根据选择信息选择电源电流值中的至少一个。顺序地保持由选择单元选择的电源电流值与跟随执行信息的跟踪缓冲器，并顺序地输出保持的信息。通过根据选择信息选择调试所需的电路块的电源电流值，可以减少包括跟踪电源电流值的调试所需的半导体集成电路的外部端子的数量。结果，可以减少具有调试功能的半导体集成电路的芯片尺寸。

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