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    • 10. 发明授权
    • Circuit for enhancing robustness of sub-threshold SRAM memory cell
    • 用于增强子阈值SRAM存储单元鲁棒性的电路
    • US09236115B2
    • 2016-01-12
    • US14369651
    • 2012-12-27
    • SOUTHEAST UNIVERSITY
    • Na BaiLongxing ShiJun YangXinning LiuJiafeng ZhuYue FengCai GongFei PanHong ChangYifeng DengYuan ChenYingcheng Xia
    • G11C11/419G11C11/417H01L27/11G11C11/412
    • G11C11/419G11C11/412G11C11/417H01L27/1104
    • A circuit for improving process robustness of sub-threshold SRAM memory cells serves as an auxiliary circuit for a sub-threshold SRAM memory cell. The output of the circuit is connected to PMOS transistors of the sub-threshold SRAM memory cell and substrate of PMOS transistors in the circuit. The circuit includes a detection circuit for threshold voltages of the PMOS transistors and a differential input and single-ended output amplifier. The circuit changes the substrate voltage of the PMOS transistors in the sub-threshold SRAM memory cell and the PMOS transistors in the circuit in a self-adapting manner by detecting threshold voltage fluctuations of PMOS and NMOS transistor resulted from process fluctuations and thereby regulates the threshold voltages of the PMOS transistors, so that the threshold voltages of the PMOS and NMOS transistors match. The circuit improves the noise margin of sub-threshold SRAM memory cells and the process robustness of sub-threshold SRAM memory cells.
    • 用于提高子阈值SRAM存储单元的工艺稳健性的电路用作子阈值SRAM存储单元的辅助电路。 电路的输出端连接到子阈值SRAM存储单元的PMOS晶体管和电路中PMOS晶体管的衬底。 该电路包括用于PMOS晶体管的阈值电压的检测电路和差分输入和单端输出放大器。 该电路通过检测来自过程波动的PMOS和NMOS晶体管的阈值电压波动,以自适应的方式改变子阈值SRAM存储单元中的PMOS晶体管的衬底电压和电路中的PMOS晶体管,从而调节阈值 PMOS晶体管的电压,使得PMOS和NMOS晶体管的阈值电压匹配。 该电路提高了亚阈值SRAM存储单元的噪声容限和子阈值SRAM存储单元的工艺稳健性。