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1. 发明授权

US11228727B2 Imaging element, driving method, and electronic equipment 有权
公开(公告)号：US11228727B2
公开(公告)日：2022-01-18
申请号：US16319109
申请日：2017-07-21
申请人： SONY SEMICONDUCTOR SOLUTIONS CORPORATION
发明人： Ryuta Okamoto , Yosuke Ueno , Yasunori Tsukuda
IPC分类号： H04N5/3745 , H04N5/357 , H04N5/363
摘要： The present disclosure relates to an imaging element, a driving method, and electronic equipment that enable imaging to be performed at higher speed. The imaging element includes a pixel array in which a plurality of pixels are arranged in a matrix shape, an AD converter that performs AD conversion in parallel on pixel signals that have been output from the plurality of pixels for each column of the plurality of pixels arranged in the pixel array, and a reference signal generator that generates a reference signal that the AD converter refers to when the AD converter performs AD conversion on a pixel signal for an identical pixel signal, the reference signal having a waveform that includes a slope having a constant gradient. Then, when the AD converter performs, on the identical pixel signal, multi-sampling for performing sampling during a P-phase period and sampling during a D-phase period at least once or more, the reference signal generator generates a reference signal in which, from among a plurality of slopes during the D-phase period, a sampling period of a second slope has been set to be shorter than a sampling period of a first slope. The present technology is applicable, for example, to a CMOS image sensor including a column-parallel ADC.

2. 发明授权

US10840936B2 Sensor, driving method, and electronic device 有权
公开(公告)号：US10840936B2
公开(公告)日：2020-11-17
申请号：US16316469
申请日：2017-07-14
申请人： SONY SEMICONDUCTOR SOLUTIONS CORPORATION
发明人： Masako Hasegawa , Ryuta Okamoto , Tomonori Yamashita , Atsumi Niwa , Yosuke Ueno
IPC分类号： H03M1/18 , H03M1/56 , H04N5/378 , H04N5/374 , H04N5/357 , H04N5/376
CPC分类号： H03M1/18 , H03M1/56 , H04N5/374 , H04N5/378 , H04N5/357 , H04N5/3765
摘要： Provided is an AD conversion unit that includes a comparator to compare an electric signal with a reference signal having a variable level, and performs AD conversion of the electric signal by using a result of the comparison between the electric signal and the reference signal by the comparator. An attenuation unit attenuates the electric signal supplied to the comparator with the amplitude of the electric signal.

3. 发明公开

US20240019244A1 SHAPE MEASURING SYSTEM 审中-公开
公开(公告)号：US20240019244A1
公开(公告)日：2024-01-18
申请号：US18247563
申请日：2021-10-08
申请人： Sony Semiconductor Solutions Corporation
发明人： Yoshitaka Miyatani , Tatsuji Ashitani , Ryuta Okamoto
IPC分类号： G01B11/25 , H04N25/47 , H04N25/701
CPC分类号： G01B11/2518 , H04N25/47 , H04N25/701
摘要： Shape measuring systems are disclosed. In one example, a shape measuring system includes a light source part with a light source, a waveform control lens, and a scan mechanism. It also includes light receiving parts that each include a light receiving lens on which reflected light reflected by the measurement target among measurement light from the light source part is incident, an EVS, which is an asynchronous imaging device that is a light receiving element, an event issuing part that detects an event on the basis of output data from the EVS and outputs event data, and a transmitting part that outputs the event data to the signal processing part. A signal processing part includes an unwanted signal removing part that removes an unwanted signal resulting from incidence of secondary reflected light, and a three-dimensional calculating part that calculates a three-dimensional shape of the measurement target.

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