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1. 发明授权

US10786948B2 Multi-sensor quality inference and control for additive manufacturing processes 有权
公开(公告)号：US10786948B2
公开(公告)日：2020-09-29
申请号：US14945247
申请日：2015-11-18
申请人： Sigma Labs, Inc.
发明人： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC分类号： B29C64/386 , B22F3/105 , B29C64/153 , B33Y50/02 , G05B19/418 , B29C64/393
摘要： This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

2. 发明申请

US20210060647A1 MULTI-SENSOR QUALITY INFERENCE AND CONTROL FOR ADDITIVE MANUFACTURING PROCESSES 有权
公开(公告)号：US20210060647A1
公开(公告)日：2021-03-04
申请号：US16987969
申请日：2020-08-07
申请人： Sigma Labs, Inc.
发明人： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC分类号： B22F3/105 , B29C64/153 , B29C64/386 , B33Y50/02 , G05B19/418
摘要： This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

3. 发明授权

US11478854B2 Multi-sensor quality inference and control for additive manufacturing processes 有权
公开(公告)号：US11478854B2
公开(公告)日：2022-10-25
申请号：US16987969
申请日：2020-08-07
申请人： Sigma Labs, Inc.
发明人： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC分类号： B22F10/20 , B29C64/153 , B29C64/386 , B22F10/00 , B33Y50/02 , G05B19/418 , B29C64/393 , B22F10/30 , B22F10/10
摘要： This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

4. 发明申请

US20160185048A1 MULTI-SENSOR QUALITY INFERENCE AND CONTROL FOR ADDITIVE MANUFACTURING PROCESSES 审中-公开
标题翻译：多传感器质量控制和辅助制造过程控制
公开(公告)号：US20160185048A1
公开(公告)日：2016-06-30
申请号：US14945247
申请日：2015-11-18
申请人： Sigma Labs, Inc.
发明人： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC分类号： B29C67/00 , G05B19/418
摘要： This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
摘要翻译：本发明教导了用于添加剂制造的多传感器质量推理系统。本发明还进一步教导了能够辨别和解决三个质量问题的质量体系：i）处理与过程输入不相关的异常或极不可预测的事件; ii）工艺变化或所需工艺参数与实际操作条件之间的差异; 以及iii）材料结构和性能，或由添加剂制造过程产生的所得材料的质量。本发明进一步教导了仅在拉格朗日参照系中进行的添加剂制造过程的实验观察。本发明甚至进一步教导了使用所收集的传感器数据来实时评估和控制添加剂制造操作。

5. 发明申请

US20230081180A1 MULTI-SENSOR QUALITY INFERENCE AND CONTROL FOR ADDITIVE MANUFACTURING PROCESSES 有权
公开(公告)号：US20230081180A1
公开(公告)日：2023-03-16
申请号：US17943651
申请日：2022-09-13
申请人： Sigma Labs, Inc.
发明人： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC分类号： B22F10/20 , B29C64/153 , B29C64/386 , B22F10/00 , B33Y50/02 , G05B19/418
摘要： This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.

6. 发明申请

US20170090462A1 SYSTEMS AND METHODS FOR ADDITIVE MANUFACTURING OPERATIONS 审中-公开
公开(公告)号：US20170090462A1
公开(公告)日：2017-03-30
申请号：US15282822
申请日：2016-09-30
申请人： SIGMA LABS, INC.
发明人： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Matias Roybal , Alberto Castro , Glenn Wikle , Lars Jacquemetton , Peter Campbell
IPC分类号： G05B19/4099 , G06F17/14 , G06N7/00 , G06F17/11 , B33Y50/00 , B33Y30/00
CPC分类号： B33Y30/00 , B33Y50/00 , G01N21/71 , G01N2021/8411 , G06N99/005
摘要： This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.

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